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    • 1. 发明申请
    • CHEMICAL MECHANICAL POLISHING PAD FOR CONTROLLING POLISHING SLURRY DISTRIBUTION
    • 用于控制抛光浆料分布的化学机械抛光垫
    • US20060160478A1
    • 2006-07-20
    • US11036903
    • 2005-01-14
    • Timothy DonohueVenkata BalaganiRomain Beau de Lomenie
    • Timothy DonohueVenkata BalaganiRomain Beau de Lomenie
    • B24B29/00
    • B24B37/26
    • A polishing pad for a chemical mechanical polishing apparatus has a body with a polishing surface having a radius, a central region, and a peripheral region. The polishing surface has a plurality of main radial-line channels extending radially outwardly from the central region to the peripheral region, each main radial-line channel having an angled outer segment at the peripheral region that is directed at an angle relative to a radius of the polishing surface. The polishing surface also has a plurality of primary tributary radial-line channels that are each connected by an angled transition segment to a main radial-line channel, the tributary radial-line channels being spaced apart from the main radial-line channels. The polishing pad provides an improved distribution and flow of polishing slurry during a polishing process.
    • 用于化学机械抛光装置的抛光垫具有具有半径,中心区域和周边区域的抛光表面的主体。 抛光表面具有从中心区域径向向外延伸到周边区域的多个主径向线通道,每个主径向线通道在周边区域具有成角度的外部段,该外部区域相对于 抛光面。 抛光表面还具有多个第一支流径向通道,每个主支流径向通道通过成角度的过渡段连接到主径向线通道,支流径向通道与主径向通道间隔开。 抛光垫在抛光过程中提供了改进的抛光浆料的分布和流动。