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    • 1. 发明申请
    • DISK INSPECTION APPARATUS
    • 磁盘检查装置
    • US20100329093A1
    • 2010-12-30
    • US12749189
    • 2010-03-29
    • Mitsumasa KuboTsuyoshi Oyamatsu
    • Mitsumasa KuboTsuyoshi Oyamatsu
    • G11B7/00
    • G11B27/36G11B7/00375G11B20/1833G11B2220/2545G11B2220/2562
    • A disk inspection apparatus for discriminating disks. The disk inspection apparatus has an ECC control section and a comparison section. The ECC control section measures the number of error corrections PIE and the number of error correction failures PIF in a predetermined section of the disk. The comparison section discriminates the disk as a disk with a deterioration in jitter characteristic when the minimum or the average of the PIE exceeds a first threshold value; discriminates the disk as a normal disk when the maximum of the PIF is equal to or smaller than a second threshold and the minimum or the average of the PIE is equal to or smaller than the first threshold value; and discriminates the disk as a scratched disk when the minimum or the average of the PIE is equal to or smaller than the first threshold value and the maximum of the PIF exceeds the second threshold value.
    • 用于识别盘的盘检查装置。 盘检测装置具有ECC控制部和比较部。 ECC控制部分测量盘的预定部分中的误差校正PIE的数量和纠错失败PIF的数量。 当PIE的最小值或平均值超过第一阈值时,比较部分将盘识别为具有抖动特性劣化的盘; 当PIF的最大值等于或小于第二阈值并且PIE的最小值或平均值等于或小于第一阈值时,将盘识别为普通盘; 并且当PIE的最小值或平均值等于或小于第一阈值且PIF的最大值超过第二阈值时,将该盘识别为划痕盘。