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1. 发明授权

US07450237B2 Non-invasive electric-filed-detection device and method 有权
标题翻译：非侵入式电场检测装置及方法
公开(公告)号：US07450237B2
公开(公告)日：2008-11-11
申请号：US10568859
申请日：2004-08-18
申请人： Joseph Zyss , Timothee Pol Jean Toury
发明人： Joseph Zyss , Timothee Pol Jean Toury
IPC分类号： G01B9/02
CPC分类号： G01R31/308 , G01R29/0885 , G02B21/0016
摘要： The invention relates to a device which is used for the non-invasive detection of an electric potential or field, of the spatial and/or the temporal derivatives thereof, in a medium with a linear or quadratic electrooptical effect. The inventive device comprises: an optical source which is used to illuminate at least one zone of the medium that is to be probed with a light beam, the path of which defines an optical axis; and means for mapping the phase shift of the beam in the zone to be probed. Measuring means which are used to map the light beam phase shift comprise a confocal microscope in which the zone to be probed is placed in order to form an image of a plane of said zone.
摘要翻译：本发明涉及一种用于在具有线性或二次电光效应的介质中对其电位或场的空间和/或时间导数的非侵入性检测的装置。本发明的装置包括：光源，其用于照射待用光束探测的介质的至少一个区域，光路的路径限定光轴; 以及用于映射要探测的区域中的波束的相移的装置。用于映射光束相移的测量装置包括共聚焦显微镜，其中放置要探测的区域以形成所述区域的平面的图像。

2. 发明申请

US20080007248A1 Non-invasive electric-filed-detection device and method 有权
公开(公告)号：US20080007248A1
公开(公告)日：2008-01-10
申请号：US10568859
申请日：2004-08-18
申请人： Joseph Zyss , Timothee Pol Jean Toury
发明人： Joseph Zyss , Timothee Pol Jean Toury
IPC分类号： G01R31/00
CPC分类号： G01R31/308 , G01R29/0885 , G02B21/0016
摘要： The invention relates to a device which is used for the non-invasive detection of an electric potential or field, of the spatial and/or the temporal derivatives thereof, in a medium with a linear or quadratic electrooptical effect. The inventive device comprises: an optical source which is used to illuminate at least one zone of the medium that is to be probed with a light beam, the path of which defines an optical axis; and means for mapping the phase shift of the beam in the zone to be probed. Measuring means which are used to map the light beam phase shift comprise a confocal microscope in which the zone to be probed is placed in order to form an image of a plane of said zone.

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