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1. 发明授权

US5917331A Integrated circuit test method and structure 失效
标题翻译：集成电路测试方法和结构
公开(公告)号：US5917331A
公开(公告)日：1999-06-29
申请号：US546751
申请日：1995-10-23
申请人： Thomas Walkley Persons
发明人： Thomas Walkley Persons
IPC分类号： G01R31/30 , G01R31/3193 , G01R31/28
CPC分类号： G01R31/3004 , G01R31/3193
摘要： A power supply for testing an integrated circuit includes a source voltage input terminal for receiving an input voltage. A plurality of switches are coupled in parallel to the input terminal, where each of the switches is coupled to an associated resistor. Each resistor, in turn, is coupled to an output terminal that is connected to the device under test (DUT). A soft switch is connected to both the input terminal and output terminal, where the soft switch is configured to condition the output terminal voltage when one of the switches is opened or closed. The soft switch quickly stabilizes the output voltage and reduces transients in the VDUT output signal.
摘要翻译：用于测试集成电路的电源包括用于接收输入电压的源极电压输入端子。多个开关并联耦合到输入端，其中每个开关耦合到相关联的电阻器。每个电阻又连接到连接到被测器件（DUT）的输出端子。软开关连接到输入端子和输出端子，其中软开关被配置为在其中一个开关打开或关闭时调节输出端电压。软开关可快速稳定输出电压，并降低VDUT输出信号的瞬变。

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