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    • 3. 发明授权
    • Compensation of stray light interference in substrate temperature measurement
    • 衬底温度测量中杂散光干扰的补偿
    • US08506161B2
    • 2013-08-13
    • US13165021
    • 2011-06-21
    • Thomas Haw
    • Thomas Haw
    • G01J5/00
    • G01J5/06G01J5/061G01J5/522G01J2005/0048
    • This disclosure describes systems, methods, and apparatuses for making a non-contact measurement of a substrate in a plasma processing chamber that accounts for stray blackbody radiation. In particular, a photocurrent is calculated that can be attributed to the stray blackbody radiation based upon a temperature of the stray blackbody radiation, a reflectance of a target substrate, and a temperature of the substrate. Knowing the photocurrent attributable to the stray blackbody radiation, a non-contact temperature measurement can be made, and the photocurrent attributable to the stray blackbody radiation can be subtracted out to arrive at a more accurate non-contact substrate temperature measurement.
    • 本公开描述了用于对处理杂散黑体辐射的等离子体处理室中的衬底进行非接触式测量的系统,方法和装置。 特别地,计算出可以归因于杂散黑体辐射基于杂散黑体辐射的温度,目标衬底的反射率和衬底的温度的光电流。 了解归因于杂散黑体辐射的光电流,可以进行非接触式温度测量,并且可以减去归因于杂散黑体辐射的光电流以获得更准确的非接触式基板温度测量。
    • 4. 发明申请
    • LASER NOISE ELIMINATION IN TRANSMISSION THERMOMETRY
    • 传感器热噪声消除噪声
    • US20130264316A1
    • 2013-10-10
    • US13789982
    • 2013-03-08
    • Jiping LiAaron Muir HunterThomas Haw
    • Jiping LiAaron Muir HunterThomas Haw
    • B23K26/00G01J5/02G01N21/59
    • Apparatus and methods for measuring the temperature of a substrate are disclosed. The apparatus includes a source of temperature-indicating radiation, a detector for the temperature-indicating radiation, and a decorrelator disposed in an optical path between the source of temperature-indicating radiation and the detector for the temperature-indicating radiation. The decorrelator may be a broadband amplifier and/or a mode scrambler. A broadband amplifier may be a broadband laser, Bragg grating, a fiber Bragg grating, a Raman amplifier, a Brillouin amplifier, or combinations thereof. The decorrelator is selected to emit radiation that is transmitted, at least in part, by the substrate being monitored. The source is matched to the decorrelator such that the emission spectrum of the source is within the gain bandwidth of the decorrelator, if the decorrelator is a gain-driven device.
    • 公开了用于测量衬底温度的装置和方法。 该装置包括温度指示辐射源,用于温度指示辐射的检测器,以及设置在温度指示辐射源和温度指示辐射检测器之间的光路中的去相关器。 解相关器可以是宽带放大器和/或模式扰频器。 宽带放大器可以是宽带激光器,布拉格光栅,光纤布拉格光栅,拉曼放大器,布里渊放大器或其组合。 选择去相关器以发射至少部分由被监测的衬底透射的辐射。 如果解相关器是增益驱动装置,则源与去相关器匹配,使得源的发射光谱在解相关器的增益带宽内。
    • 7. 发明申请
    • Compensation of Stray Light Interference in Substrate Temperature Measurement
    • 基板温度测量中杂散光干扰的补偿
    • US20120327970A1
    • 2012-12-27
    • US13165021
    • 2011-06-21
    • Thomas Haw
    • Thomas Haw
    • G01J5/00
    • G01J5/06G01J5/061G01J5/522G01J2005/0048
    • This disclosure describes systems, methods, and apparatuses for making a non-contact measurement of a substrate in a plasma processing chamber that accounts for stray blackbody radiation. In particular, a photocurrent is calculated that can be attributed to the stray blackbody radiation based upon a temperature of the stray blackbody radiation, a reflectance of a target substrate, and a temperature of the substrate. Knowing the photocurrent attributable to the stray blackbody radiation, a non-contact temperature measurement can be made, and the photocurrent attributable to the stray blackbody radiation can be subtracted out to arrive at a more accurate non-contact substrate temperature measurement.
    • 本公开描述了用于对处理杂散黑体辐射的等离子体处理室中的衬底进行非接触式测量的系统,方法和装置。 特别地,计算出可以归因于杂散黑体辐射基于杂散黑体辐射的温度,目标衬底的反射率和衬底的温度的光电流。 了解归因于杂散黑体辐射的光电流,可以进行非接触式温度测量,并且可以减去归因于杂散黑体辐射的光电流以获得更准确的非接触式基板温度测量。