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1. 发明授权

US06691439B1 Full-shrink labeled container and tubular shrink label 有权
标题翻译：全收缩标签容器和管状收缩标签
公开(公告)号：US06691439B1
公开(公告)日：2004-02-17
申请号：US09647831
申请日：2000-10-05
申请人： Takashi Miyashita , Takeshi Haraya , Kazunori Kunitake , Kazuo Okada , Eiji Sawa , Makoto Fukuhara , Tetsuo Hata
发明人： Takashi Miyashita , Takeshi Haraya , Kazunori Kunitake , Kazuo Okada , Eiji Sawa , Makoto Fukuhara , Tetsuo Hata
IPC分类号： G09F300
CPC分类号： B65D23/0878
摘要： A full-shrink labeled container has an opening sealed with a plug provided with a pull-up part for unsealing, a body to which a shrink label having a heat shrinkability is applied, and a neck having the circumference shorter than that of the body. The shrink label covers the container from the lower end part to the upper end part, also the pull-up part, and is formed with tear-off means capable of exposing the pull-up part.
摘要翻译：全收缩标签容器具有用设置有用于开封的上拉部件的塞子密封的开口，具有加热收缩性的收缩标签的主体和具有比主体的周长短的颈部。收缩标签从下端部分到上端部分也覆盖容器，也是上拉部分，并且形成有能够暴露上拉部分的撕脱装置。

2. 发明授权

US5665443A Heat sensitive label for packaging a dry-cell battery 失效
标题翻译：用于包装干电池的热敏标签
公开(公告)号：US5665443A
公开(公告)日：1997-09-09
申请号：US639680
申请日：1996-04-29
申请人： Tetsuo Hata , Takeshi Kyogane , Masakazu Hirayama , Hiroyuki Fujita
发明人： Tetsuo Hata , Takeshi Kyogane , Masakazu Hirayama , Hiroyuki Fujita
IPC分类号： B32B7/12 , G09F3/04 , H01M2/02
CPC分类号： G09F3/04 , H01M2/0267 , H01M2/0275 , Y10T428/1328 , Y10T428/2848 , Y10T428/31786
摘要： A heat sensitive label for packaging a dry-cell battery includes a label substrate, a heat sensitive adhesive layer provided on one surface of the label substrate and a printing layer provided on an opposite surface of the label substrate, in which an ultraviolet ray curing ink is applied for the printing layer.
摘要翻译：用于封装干电池的热敏标签包括标签基板，设置在标签基板的一个表面上的热敏粘合剂层和设置在标签基板的相对表面上的印刷层，其中紫外线固化油墨适用于印刷层。

3. 发明授权

US07405584B2 Prober and probe contact method 有权
标题翻译：探头和探针接触方式
公开(公告)号：US07405584B2
公开(公告)日：2008-07-29
申请号：US11744192
申请日：2007-05-03
申请人： Taichi Fujita , Takahiro Hokida , Tetsuo Hata , Satoshi Moriyama , Yoshiyuki Yokoyama
发明人： Taichi Fujita , Takahiro Hokida , Tetsuo Hata , Satoshi Moriyama , Yoshiyuki Yokoyama
IPC分类号： G01R31/02
CPC分类号： G01R31/2891 , G01R31/286
摘要： A prober that has improved positional precision of probing without reducing throughput is disclosed. The prober comprises a probe card having a probe, a wafer stage, a stage temperature adjustment mechanism, a wafer stage movement mechanism, a movement control section, and an alignment mechanism that detects the relative position between an electrode and the probe, wherein the movement control section controls the movement mechanism so as to cause the electrode to come into contact with the probe based on the detected relative position, and the prober further comprises a plurality of temperature sensors that detect the temperatures of a plurality of portions of the prober including the wafer stage and a predicted change amount calculation section that calculates the amount of change in relative position between the electrode and the probe based on a prediction model that uses at least part of the temperatures of the plurality of portions and the temperature difference between the wafer stage and the other sections as a variable.
摘要翻译：公开了一种在不降低吞吐量的情况下提高探测位置精度的探测器。探测器包括具有探针，晶片台，台温度调节机构，晶片台移动机构，移动控制部分和检测电极和探针之间的相对位置的对准机构的探针卡，其中移动控制部分控制移动机构，以使得电极基于检测到的相对位置与探针接触，并且探测器还包括多个温度传感器，其检测探测器的多个部分的温度，包括晶片台和预测变化量计算部，其基于使用多个部分的至少一部分温度的预测模型和晶片台之间的温度差来计算电极和探针之间的相对位置的变化量其他部分作为变量。

4. 发明申请

US20070268033A1 PROBER AND PROBE CONTACT METHOD 有权
标题翻译：探索与探索联系方式
公开(公告)号：US20070268033A1
公开(公告)日：2007-11-22
申请号：US11744192
申请日：2007-05-03
申请人： Taichi Fujita , Takahiro Hokida , Tetsuo Hata , Satoshi Moriyama , Yoshiyuki Yokoyama
发明人： Taichi Fujita , Takahiro Hokida , Tetsuo Hata , Satoshi Moriyama , Yoshiyuki Yokoyama
IPC分类号： G01R31/02
CPC分类号： G01R31/2891 , G01R31/286
摘要： A prober that has improved positional precision of probing without reducing throughput is disclosed. The prober comprises a probe card having a probe, a wafer stage, a stage temperature adjustment mechanism, a wafer stage movement mechanism, a movement control section, and an alignment mechanism that detects the relative position between an electrode and the probe, wherein the movement control section controls the movement mechanism so as to cause the electrode to come into contact with the probe based on the detected relative position, and the prober further comprises a plurality of temperature sensors that detect the temperatures of a plurality of portions of the prober including the wafer stage and a predicted change amount calculation section that calculates the amount of change in relative position between the electrode and the probe based on a prediction model that uses at least part of the temperatures of the plurality of portions and the temperature difference between the wafer stage and the other sections as a variable.
摘要翻译：公开了一种在不降低吞吐量的情况下提高探测位置精度的探测器。探测器包括具有探针，晶片台，台温度调节机构，晶片台移动机构，移动控制部分和检测电极和探针之间的相对位置的对准机构的探针卡，其中移动控制部分控制移动机构，以使得电极基于检测到的相对位置与探针接触，并且探测器还包括多个温度传感器，其检测探测器的多个部分的温度，包括晶片台和预测变化量计算部，其基于使用多个部分的至少一部分温度的预测模型和晶片台之间的温度差来计算电极和探针之间的相对位置的变化量其他部分作为变量。

5. 发明申请

US20060267613A1 Movement amount operation correction method for prober, movement amount operation correction processing program, and prober 失效
标题翻译：探测器运动量操作校正方法，移动量操作校正处理程序和探测器
公开(公告)号：US20060267613A1
公开(公告)日：2006-11-30
申请号：US11413368
申请日：2006-04-27
申请人： Masatomo Takahashi , Takahiro Hokida , Ken Kamikariya , Tetsuo Hata
发明人： Masatomo Takahashi , Takahiro Hokida , Ken Kamikariya , Tetsuo Hata
IPC分类号： G01R31/02
CPC分类号： G01R31/2891
摘要： A movement amount operation correction method of a prober capable of easily performing an error measurement for the movement distance, as conventionally performed by a skilled specialist, has been disclosed. In the method, the position of a probe of a probe card is detected by a probe position detection means, the position of an electrode is detected by a wafer alignment means, the position of the probe trace is detected by bringing the electrode into contact with the probe and processing an image of a probe trace on the electrode touched by the wafer alignment means, the image of the probe trace and a probe trace mark indicating the detected position of the probe are displayed on a display device, and an operator confirms or corrects the position of the probe trace mark on the image, calculates a shift of the position of the probe trace mark from a predetermined position, and corrects a movement amount operation correction value based on the calculated shift.
摘要翻译：已经公开了如本领域技术人员常规执行的能够容易地执行移动距离的误差测量的探测器的移动量操作校正方法。在该方法中，通过探针位置检测装置检测探针卡的探针的位置，通过晶片对准装置检测电极的位置，通过使电极与电极接触而检测探针迹线的位置探针并处理由晶片对准装置触摸的电极上的探针迹线的图像，探针迹线的图像和指示探测器的检测位置的探针迹线标记显示在显示装置上，并且操作者确认或校正图像上的探针迹线标记的位置，计算探测迹线标记从预定位置的位置的偏移，并且基于计算的移位来校正移动量操作校正值。

6. 发明授权

US5725966A Heat sensitive jacket label for battery and battery with the same 失效
标题翻译：热敏外套标签为电池和电池一样
公开(公告)号：US5725966A
公开(公告)日：1998-03-10
申请号：US777435
申请日：1996-12-30
申请人： Masanobu Abe , Takeshi Okubo , Carl David Walton , Junichi Asaoka , Yasuhiko Shoji , Tetsuo Hata , Masakazu Hirayama , Takeshi Kyogane
发明人： Masanobu Abe , Takeshi Okubo , Carl David Walton , Junichi Asaoka , Yasuhiko Shoji , Tetsuo Hata , Masakazu Hirayama , Takeshi Kyogane
IPC分类号： B32B27/08 , H01M2/02
CPC分类号： B32B27/08 , H01M2/0267 , H01M2/0275 , Y10T428/2817 , Y10T428/2848
摘要： A heat sensitive jacket label for a battery is disclosed. It comprises a base made of a heat-shrinking film, a metal layer provided on a back surface of the base, a heat-resistant insulating layer provided on the metal layer, and a heat sensitive adhesive on the insulating layer. The base heat-shrinks at a temperature at least 15.degree. C. higher than a temperature for effecting adhesion of the heat sensitive adhesive.
摘要翻译：公开了一种用于电池的热敏外套标签。其包括由热收缩膜制成的基底，设置在基底的背面上的金属层，设置在金属层上的耐热绝缘层和绝缘层上的热敏粘合剂。该基底在比用于粘合热敏粘合剂的温度高至少15℃的温度下热收缩。

7. 发明授权

US07501843B2 Movement amount operation correction method for prober, movement amount operation correction processing program, and prober 失效
标题翻译：探测器运动量操作校正方法，移动量操作校正处理程序和探测器
公开(公告)号：US07501843B2
公开(公告)日：2009-03-10
申请号：US11413368
申请日：2006-04-27
申请人： Masatomo Takahashi , Takahiro Hokida , Ken Kamikariya , Tetsuo Hata
发明人： Masatomo Takahashi , Takahiro Hokida , Ken Kamikariya , Tetsuo Hata
IPC分类号： G01R31/02
CPC分类号： G01R31/2891
摘要： A movement amount operation correction method of a prober capable of easily performing an error measurement for the movement distance. In the method, the position of a probe of a probe card is detected by a probe position detection means, the position of an electrode is detected by a wafer alignment means, the position of the probe trace is detected by bringing the electrode into contact with the probe and processing an image of a probe trace on the electrode touched by the wafer alignment means, the image of the probe trace and a probe trace mark indicating the detected position of the probe are displayed on a display device, and an operator confirms or corrects the position of the probe trace mark on the image, calculates a shift of the position of the probe trace mark from a predetermined position, and corrects a movement amount operation correction value based on the calculated shift.
摘要翻译：一种能够容易地进行移动距离的误差测量的探测器的移动量操作校正方法。在该方法中，通过探针位置检测装置检测探针卡的探针的位置，通过晶片对准装置检测电极的位置，通过使电极与电极接触而检测探针迹线的位置探针并处理由晶片对准装置触摸的电极上的探针迹线的图像，探针迹线的图像和指示探测器的检测位置的探针迹线标记显示在显示装置上，并且操作者确认或校正图像上的探针迹线标记的位置，计算探测迹线标记从预定位置的位置的偏移，并且基于计算的移位来校正移动量操作校正值。

8. 发明授权

US5891537A Stretch label 失效
标题翻译：拉伸标签
公开(公告)号：US5891537A
公开(公告)日：1999-04-06
申请号：US963564
申请日：1997-11-03
申请人： Toshiya Yoshii , Chihiro Wakatsuki , Hiroshi Harada , Tetsuo Hata , Masato Nakanishi
发明人： Toshiya Yoshii , Chihiro Wakatsuki , Hiroshi Harada , Tetsuo Hata , Masato Nakanishi
IPC分类号： B65D23/08 , G09F3/02 , G09F3/04 , G09F3/00 , G09F3/10
CPC分类号： G09F3/04 , B65D23/0871 , G09F2003/0251 , G09F2003/0273 , Y10S428/91 , Y10T428/1334 , Y10T428/1345 , Y10T428/1352 , Y10T428/1376 , Y10T428/1393 , Y10T428/24843 , Y10T428/24967 , Y10T428/249982 , Y10T428/2826 , Y10T428/3192
摘要： A stretch label adapted to be fitted to a container includes a stretch film, having a self-shrinking property, and a printing layer. The stretch film, in turn, includes a substrate made from an ethylene-vinyl acetate copolymer or a mixture of a low density polyethylene and an ethylene-vinyl acetate copolymer, and a surface layer made of a polyolefin resin. The surface layer is harder than the substrate and is provided on at least one surface of the substrate. The surface layer is the outer surface layer of the stretch label when the stretch label is fitted to the container.
摘要翻译：适于装配到容器的拉伸标签包括具有自收缩性的拉伸膜和印刷层。拉伸膜又包括由乙烯 - 乙酸乙烯酯共聚物或低密度聚乙烯和乙烯 - 乙酸乙烯酯共聚物的混合物制成的基材和由聚烯烃树脂制成的表面层。表面层比基底硬，并且设置在基底的至少一个表面上。当拉伸标签装配到容器时，表层是拉伸标签的外表面层。

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