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1. 发明授权

US07755046B2 Transmission electron microscope 有权
标题翻译：透射电子显微镜
公开(公告)号：US07755046B2
公开(公告)日：2010-07-13
申请号：US12010702
申请日：2008-01-29
申请人： Teruo Kohashi , Takashi Ohshima , Takao Matsumoto , Hirokazu Nishida
发明人： Teruo Kohashi , Takashi Ohshima , Takao Matsumoto , Hirokazu Nishida
IPC分类号： G01N23/00 , G21K7/00
CPC分类号： H01J37/266 , H01J37/265 , H01J2237/06383 , H01J2237/1514 , H01J2237/24557 , H01J2237/2588 , H01J2237/2614
摘要： Chirality distribution in the molecular structure of protein or the like and magnetic domain structure are analyzed with high resolution less than 10 nm. A transmission electron microscope equipped with a spin-polarized electron source is used for holography observation. The phase of transmission spin-polarized electrons changes due to the existence of chirality structure or magnetization in a sample, which is observed as an interference pattern phase shift in holography measurement.
摘要翻译：蛋白质等分子结构中的手性分布和磁畴结构以高分辨率小于10nm进行分析。配备有自旋极化电子源的透射电子显微镜用于全息观察。透射自旋极化电子的相位由于样品中手性结构或磁化的存在而改变，在全息测量中被观察为干涉图案相移。

2. 发明申请

US20090054722A1 Drug Carrier Containing Magnetic Fine Particles and System Using the Same 审中-公开
标题翻译：含有磁性细颗粒的药物载体及其使用的系统
公开(公告)号：US20090054722A1
公开(公告)日：2009-02-26
申请号：US12186545
申请日：2008-08-06
申请人： Ryoko Sugano , Nami Sugita , Teruo Kohashi , Keiji Takata , Chiharu Mitsumata , Shigeo Fujii
发明人： Ryoko Sugano , Nami Sugita , Teruo Kohashi , Keiji Takata , Chiharu Mitsumata , Shigeo Fujii
IPC分类号： A61N2/00 , A61K9/14 , A61K9/127
CPC分类号： A61N1/406 , A61K9/0009 , A61K9/127
摘要： The present invention provides drug carriers having high heating efficiency by high-frequency dielectric heating in a state of being selectively accumulated in a target site. The drug carriers each consist of a drug, magnetic fine particles, and a shell containing the drug and the magnetic fine particles. The shell has an outer diameter in a range from 10 nm to 200 nm. The magnetic fine particles having an average particle diameter of d has a standard deviation σ of particle diameter distribution satisfying 0.8d>σ>0.4d. The magnetic fine particles contained in the individual drug carriers generate hysteresis heat due to high-frequency dielectric heating by irradiation of a high-frequency magnetic field.
摘要翻译：本发明通过选择性地积聚在目标部位的状态提供通过高频电介质加热具有高加热效率的药物载体。药物载体各自由药物，磁性细颗粒和含有药物和磁性细颗粒的壳组成。外壳的外径在10nm〜200nm的范围内。平均粒径为d的磁性微粒的粒径分布的标准偏差σ为0.8d> s> 0.4d。包含在各个药物载体中的磁性微粒由于高频磁场的照射而产生高频介电加热而产生滞后热。

3. 发明申请

US20140204463A1 ZONE PLATE 有权
标题翻译：区域板块
公开(公告)号：US20140204463A1
公开(公告)日：2014-07-24
申请号：US14240393
申请日：2011-09-28
申请人： Ken Harada , Teruo Kohashi
发明人： Ken Harada , Teruo Kohashi
IPC分类号： G02B5/18
CPC分类号： G02B5/1876 , G02B27/42 , G02B27/4233 , G02B27/4266 , G02B27/44 , G21K1/06
摘要： Although, conventionally, there were two methods, (1) a wave was transmitted through a spiral phase plate and (2) a diffraction grating containing an edge dislocation was used, they incurred complication of a configuration and securement of a larger amount of space and were not efficient because each of the spiral wave generation methods needed an incident wave to be a plane wave and at least one time of imaging is necessary at the time of wave irradiation on an observation object. In order to efficiently generate the spiral wave having a sufficient intensity, a structure of edge dislocation is taken in into a pattern of the zone plate and a spiral pattern containing a discontinuous zone is formed. Moreover, a thickness and a quality of material that change the phase of the wave by an odd multiple of π are selected for a material of the wave-blocking section in the pattern.
摘要翻译：虽然通常有两种方法：（1）通过螺旋相板传播波，（2）使用包含边缘位错的衍射光栅，它们引起配置的复杂化并确保更大的空间，不是有效的，因为每个螺旋波产生方法需要入射波为平面波，并且在观察对象上的波照射时需要至少一次成像时间。为了有效地产生具有足够强度的螺旋波，边缘位错的结构被取入到区域板的图案中，并且形成包含不连续区域的螺旋图案。此外，将波的相位改变为奇数倍的材料的厚度和质量; 被选择为图案中的波形阻挡部分的材料。

4. 发明申请

US20070057666A1 Defect inspection system and method for recording media 审中-公开
标题翻译：缺陷检查系统和记录介质的方法
公开(公告)号：US20070057666A1
公开(公告)日：2007-03-15
申请号：US11492964
申请日：2006-07-26
申请人： Tomokazu Shimakura , Teruo Kohashi , Yoshio Takahashi
发明人： Tomokazu Shimakura , Teruo Kohashi , Yoshio Takahashi
IPC分类号： G01R33/12
CPC分类号： G01R33/1207 , G01B15/08 , G11B5/00 , G11B5/012 , G11B5/74 , G11B5/82 , G11B7/00375 , G11B11/10582 , G11B2005/001
摘要： This invention provides a recording media defect inspection technique that makes possible high-speed and high-resolution defect inspection using an electron beam. A spindle motor rotates a recording media while an electron beam is being irradiated on a surface of a recording media, and detectors detect secondary electrons produced from the recording media, whereby unevenness information of the recording media surface is obtained. The obtained unevenness information on the recording media surface is Fourier transformed and a defect is detected. Further, by introducing deposition gas onto the recording media surface by gas introduction means while irradiating the electron beam on the recording media, a component of the deposition gas is deposited in a detected defect position on the recording media surface to form a mark.
摘要翻译：本发明提供一种记录介质缺陷检查技术，其使得能够使用电子束进行高速和高分辨率的缺陷检查。当电子束被照射在记录介质的表面上时，主轴电动机旋转记录介质，并且检测器检测从记录介质产生的二次电子，从而获得记录介质表面的不均匀性信息。在记录介质表面上获得的不均匀性信息被傅里叶变换并且检测到缺陷。此外，通过在将记录介质上的电子束照射的同时通过气体引入装置将沉积气体引入到记录介质表面上，沉积气体的一部分沉积在记录介质表面上的检测到的缺陷位置以形成标记。

5. 发明授权

US09864114B2 Zone plate having annular or spiral shape and Y-shaped branching edge dislocation 有权
公开(公告)号：US09864114B2
公开(公告)日：2018-01-09
申请号：US14240393
申请日：2011-09-28
申请人： Ken Harada , Teruo Kohashi
发明人： Ken Harada , Teruo Kohashi
IPC分类号： G02B5/18 , G21K1/06 , G02B27/44 , G02B27/42
CPC分类号： G02B5/1876 , G02B27/42 , G02B27/4233 , G02B27/4266 , G02B27/44 , G21K1/06
摘要： Although, conventionally, there were two methods, (1) a wave was transmitted through a spiral phase plate and (2) a diffraction grating containing an edge dislocation was used, they incurred complication of a configuration and securement of a larger amount of space and were not efficient because each of the spiral wave generation methods needed an incident wave to be a plane wave and at least one time of imaging is necessary at the time of wave irradiation on an observation object. In order to efficiently generate the spiral wave having a sufficient intensity, a structure of edge dislocation is taken in into a pattern of the zone plate and a spiral pattern containing a discontinuous zone is formed. Moreover, a thickness and a quality of material that change the phase of the wave by an odd multiple of π are selected for a material of the wave-blocking section in the pattern.

6. 发明申请

US20100155598A1 ELECTRON SPIN DETECTOR, AND SPIN POLARIZED SCANNING ELECTRON MICROSCOPE AND SPIN-RESOLVED X-RAY PHOTOELECTRON SPECTROSCOPE USING THE ELECTRON SPIN DETECTOR 有权
标题翻译：电子旋转探测器和旋转偏振扫描电子显微镜和使用电子旋转探测器的旋转分辨率X射线光电子光谱
公开(公告)号：US20100155598A1
公开(公告)日：2010-06-24
申请号：US12637844
申请日：2009-12-15
申请人： Teruo KOHASHI
发明人： Teruo KOHASHI
IPC分类号： G01N23/00 , G01T1/00
CPC分类号： G01R33/093 , B82Y25/00 , G01R33/1284 , G01T1/00
摘要： An electron spin detector includes plural magnetoresistive sensors and a deceleration lens of an electron beam, and each magnetoresistive sensor is inclined so that the electron beam spread by the deceleration lens can be input perpendicularly to the magnetoresistive sensor.
摘要翻译：电子自旋检测器包括多个磁阻传感器和电子束的减速透镜，并且每个磁阻传感器倾斜，使得能够垂直于磁阻传感器输入由减速透镜扩展的电子束。

7. 发明授权

US08022364B2 Electron spin detector, and spin polarized scanning electron microscope and spin-resolved x-ray photoelectron spectroscope using the electron spin detector 有权
标题翻译：电子自旋检测器，使用电子自旋检测器的自旋极化扫描电子显微镜和自旋分辨X射线光电子分光镜
公开(公告)号：US08022364B2
公开(公告)日：2011-09-20
申请号：US12637844
申请日：2009-12-15
申请人： Teruo Kohashi
发明人： Teruo Kohashi
IPC分类号： H01J37/244 , H01J37/28
CPC分类号： G01R33/093 , B82Y25/00 , G01R33/1284 , G01T1/00
摘要： An electron spin detector includes plural magnetoresistive sensors and a deceleration lens of an electron beam, and each magnetoresistive sensor is inclined so that the electron beam spread by the deceleration lens can be input perpendicularly to the magnetoresistive sensor.
摘要翻译：电子自旋检测器包括多个磁阻传感器和电子束的减速透镜，并且每个磁阻传感器倾斜，使得能够垂直于磁阻传感器输入由减速透镜扩展的电子束。

8. 发明申请

US20080210868A1 Transmission electron microscope 有权
标题翻译：透射电子显微镜
公开(公告)号：US20080210868A1
公开(公告)日：2008-09-04
申请号：US12010702
申请日：2008-01-29
申请人： Teruo Kohashi , Takashi Ohshima , Takao Matsumoto , Hirokazu Nishida
发明人： Teruo Kohashi , Takashi Ohshima , Takao Matsumoto , Hirokazu Nishida
IPC分类号： G01N23/00
CPC分类号： H01J37/266 , H01J37/265 , H01J2237/06383 , H01J2237/1514 , H01J2237/24557 , H01J2237/2588 , H01J2237/2614
摘要： Chirality distribution in the molecular structure of protein or the like and magnetic domain structure are analyzed with high resolution less than 10 nm. A transmission electron microscope equipped with a spin-polarized electron source is used for holography observation. The phase of transmission spin-polarized electrons changes due to the existence of chirality structure or magnetization in a sample, which is observed as an interference pattern phase shift in holography measurement.
摘要翻译：蛋白质等分子结构中的手性分布和磁畴结构以高分辨率小于10nm进行分析。配备有自旋极化电子源的透射电子显微镜用于全息观察。透射自旋极化电子的相位由于样品中手性结构或磁化的存在而改变，在全息测量中被观察为干涉图案相移。

9. 发明申请

US20070194230A1 INSPECTION INSTRUMENT OF A MAGNETIC SPECIMEN 审中-公开
标题翻译：磁性样本检验仪器
公开(公告)号：US20070194230A1
公开(公告)日：2007-08-23
申请号：US11672617
申请日：2007-02-08
申请人： Teruo KOHASHI , Tomokazu Shimakura
发明人： Teruo KOHASHI , Tomokazu Shimakura
IPC分类号： G21K7/00
CPC分类号： H01J37/29 , H01J2237/2067 , H01J2237/24557 , H01J2237/24564 , H01J2237/2538
摘要： An inspection technique capable of observing a magnetic domain configuration which is formed on a magnetic specimen surface with a higher resolution and at a higher speed as never before. The inspection technique includes an SPLEEM observation unit including a spin polarized electron source, an irradiation optics that projects a spin polarized electron beam that is emitted from the spin polarized electron source to a magnetic specimen having a magnetic domain structure, a stage on which the magnetic specimen is mounted, an imaging optics that focuses and detects the electron beam that is reflected from the magnetic specimen; and cleaning means for cleaning the surface of the magnetic specimen to transfer the magnetic specimen to the SPLEEM observation unit, wherein the magnetic domain structure of the magnetic specimen surface is inspected on the basis of the reflected electron beam.
摘要翻译：一种能够以前所未有地观察以高分辨率和高速度形成在磁性试样表面上的磁畴结构的检查技术。检查技术包括：包括自旋极化电子源的SPLEEM观察单元，将从自旋极化电子源发射的自旋极化电子束投射到具有磁畴结构的磁性试样的照射光学系统，安装了样本，成像光学元件，聚焦并检测从磁性样本反射的电子束; 以及用于清洁磁性试样的表面以将磁性样本转移到SPLEEM观察单元的清洁装置，其中基于反射的电子束检查磁性试样表面的磁畴结构。

10. 发明授权

US07985952B2 Charged particle spin polarimeter, microscope, and photoelectron spectroscope 有权
标题翻译：带电粒子自旋旋光仪，显微镜和光电子分光镜
公开(公告)号：US07985952B2
公开(公告)日：2011-07-26
申请号：US12028996
申请日：2008-02-11
申请人： Teruo Kohashi
发明人： Teruo Kohashi
IPC分类号： G01N23/00
CPC分类号： G01N23/2251 , H01J37/244 , H01J37/285 , H01J49/288 , H01J2237/24557
摘要： A charged particle spin polarimeter that is capable of resolving with high efficiency the magnetic moment of a charged particle. The charged particle spin polarimeter has a pair of convex and concave magnetic poles to apply a magnetic field with gradient to an incident charged particle and a pair of plain plate electrodes to apply, to a charged particle, an electric field for canceling a Lorentz force that the charged particle receives from the magnetic field. The magnetic moment in the magnetic field direction of a charged particle is resolved by the interaction between the gradient of the magnetic field and the magnetic moment of the charged particle.
摘要翻译：一种带电粒子旋转偏振计，能够高效率地分辨带电粒子的磁矩。带电粒子旋转偏振计具有一对凸和凹磁极，以向入射带电粒子和一对平板电极施加梯度的磁场，以向带电粒子施加用于抵消洛伦兹力的电场，带电粒子从磁场接收。带电粒子的磁场方向的磁矩通过磁场的梯度和带电粒子的磁矩之间的相互作用来解决。

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