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    • 3. 发明申请
    • Semiconductor Device
    • 半导体器件
    • US20120235154A1
    • 2012-09-20
    • US13474993
    • 2012-05-18
    • Tatsuya Arao
    • Tatsuya Arao
    • H01L33/42
    • G02F1/136209G02F1/136213G02F1/136227H01L27/124H01L27/1255H01L29/66757H01L29/66765H01L29/78633
    • To realize a semiconductor device including a capacitor element capable of obtaining a sufficient capacitor without reducing an opening ratio, in which a pixel electrode is flattened in order to control a defect in orientation of liquid crystal. A semiconductor device of the present invention includes a light-shielding film formed on the thin film transistor, a capacitor insulating film formed on the light-shielding film, a conductive layer formed on the capacitor insulating film, and a pixel electrode that is formed so as to be electrically connected to the conductive layer, in which a storage capacitor element comprises the light-shielding film, the capacitor insulating film, and the conductive layer, whereby an area of a region serving as the capacitor element can be increased.
    • 为了实现包括能够获得足够的电容器而不降低开口率的电容器元件的半导体器件,其中像素电极被平坦化以便控制液晶取向的缺陷。 本发明的半导体器件包括形成在薄膜晶体管上的遮光膜,形成在遮光膜上的电容器绝缘膜,形成在电容器绝缘膜上的导电层,以及形成为这样的像素电极 为了与导电层电连接,其中存储电容器元件包括遮光膜,电容器绝缘膜和导电层,由此可以增加用作电容器元件的区域的面积。
    • 4. 发明授权
    • Light emitting device
    • 发光装置
    • US08237179B2
    • 2012-08-07
    • US13241351
    • 2011-09-23
    • Shunpei YamazakiJun KoyamaTatsuya AraoMunehiro Azami
    • Shunpei YamazakiJun KoyamaTatsuya AraoMunehiro Azami
    • H01L33/00
    • H01L27/3265H01L27/124H01L27/1255H01L27/3246H01L27/3258H01L27/3262H01L27/3276H01L29/78633
    • A light emitting device is provided which can prevent a change in gate voltage due to leakage or other causes and at the same time can prevent the aperture ratio from lowering. A capacitor storage is formed from a connection wiring line, an insulating film, and a capacitance wiring line. The connection wiring line is formed over a gate electrode and an active layer of a TFT of a pixel, and is connected to the active layer. The insulating film is formed on the connection wiring line. The capacitance wiring line is formed on the insulating film. This structure enables the capacitor storage to overlap the TFT, thereby increasing the capacity of the capacitor storage while keeping the aperture ratio from lowering. Accordingly, a change in gate voltage due to leakage or other causes can be avoided to prevent a change in luminance of an OLED and flickering of screen in analog driving.
    • 提供一种可以防止由于泄漏或其它原因引起的栅极电压变化并且同时可以防止开口率降低的发光器件。 电容器存储器由连接布线,绝缘膜和电容布线形成。 连接布线形成在栅电极和像素的TFT的有源层上,并与有源层连接。 绝缘膜形成在连接布线上。 电容布线形成在绝缘膜上。 这种结构使得电容器存储与TFT重叠,从而在保持开口率降低的同时增加电容器存储的容量。 因此,可以避免由于泄漏或其他原因导致的栅极电压的变化,以防止OLED的亮度变化和模拟驱动中屏幕的闪烁。
    • 10. 发明申请
    • SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
    • 半导体器件及其制造方法
    • US20100006854A1
    • 2010-01-14
    • US12501801
    • 2009-07-13
    • Koji ONOHideomi SUZAWATatsuya ARAO
    • Koji ONOHideomi SUZAWATatsuya ARAO
    • H01L33/00
    • H01L27/1222G02F1/13624H01L27/12H01L27/1214H01L27/124H01L27/127H01L29/42384H01L29/4908H01L29/66757H01L29/78621H01L29/78627H01L33/08H01L33/62H01L2029/7863H01L2924/0002H01L2924/00
    • In a semiconductor device, typically an active matrix display device, the structure of TFTs arranged in the respective circuits are made suitable in accordance with the function of the circuit, and along with improving the operating characteristics and the reliability of the semiconductor device, the manufacturing cost is reduced and the yield is increased by reducing the number of process steps. A semiconductor device has a semiconductor layer, an insulating film formed contacting the semiconductor layer, and a gate electrode having a tapered portion on the insulating film, in the semiconductor device, the semiconductor layer has a channel forming region, a first impurity region for forming a source region or a drain region and containing a single conductivity type impurity element, and a second impurity region for forming an LDD region contacting the channel forming region, a portion of the second impurity region is formed overlapping a gate electrode, and the concentration of the single conductivity type impurity element contained in the second impurity region becomes larger with distance from the channel forming region.
    • 在半导体器件(通常为有源矩阵显示器件)中,根据电路的功能,布置在各个电路中的TFT的结构是合适的,并且随着半导体器件的工作特性和可靠性的提高,制造 降低成本,并通过减少工艺步骤的数量来提高产量。 半导体器件具有半导体层,与半导体层接触形成的绝缘膜和在绝缘膜上具有锥形部分的栅电极,在半导体器件中,半导体层具有沟道形成区,形成第一杂质区 源极区域或漏极区域,并且包含单一导电型杂质元素,以及用于形成与沟道形成区域接触的LDD区域的第二杂质区域,第二杂质区域的一部分与栅电极重叠,并且浓度 包含在第二杂质区域中的单一导电型杂质元素随着与沟道形成区域的距离而变大。