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3. 发明授权

US4545248A Ultrasonic thickness gauge 失效
标题翻译：超声波测厚仪
公开(公告)号：US4545248A
公开(公告)日：1985-10-08
申请号：US620496
申请日：1984-06-14
申请人： Toyohiko Kitada , Takanori Arioka
发明人： Toyohiko Kitada , Takanori Arioka
IPC分类号： G01B17/02 , G01N29/00
CPC分类号： G01B17/02
摘要： An ultrasonic thickness gauge including a split-type probe to perform the transmission-reception of ultrasonic waves via a material board to be measured, a zero point calibration circuit to delay the zero point by a specified delay time from the wave transmission timing, and a measuring circuit to count clock pulses for the duration from the zero point to the wave reception timing. This ultrasonic thickness gauge is characterized in that it also includes a counter to count, within specified range, the clock pulses relating to the board thickness in each previous measurement conducted by using the preset zero point, and a zero point adjusting circuit to vary the zero point of the zero point calibration circuit in proportion to the count value of the above-mentioned counter. In addition, a coefficient selecting circuit to shift the proportionality coefficient of the zero point adjusting circuit step by step in accordance with the board thickness obtained in each previous measurement may be included for measuring a wider range of board thickness.
摘要翻译：一种超声波测厚仪，包括：经由待测材料进行超声波发送接收的分割式探头;零点校准电路，使零点从波发送定时延迟规定的延迟时间;以及测量电路在从零点到波接收定时的持续时间内对时钟脉冲进行计数。该超声波测厚仪的特征在于，它还包括在指定范围内计数与通过使用预设零点进行的每个先前测量中的板厚度相关的时钟脉冲的计数器，以及用于改变零点的零点调整电路零点校准电路的点与上述计数器的计数值成比例。此外，可以包括用于根据每个先前测量中获得的板厚逐步地偏移零点调整电路的比例系数的系数选择电路，用于测量更宽的板厚度范围。

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