专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US4725148A Turbidimeter employing a semiconductor laser diode and a photodiode 失效
标题翻译：浊度计采用半导体激光二极管和光电二极管
公开(公告)号：US4725148A
公开(公告)日：1988-02-16
申请号：US739319
申请日：1985-05-30
申请人： Isao Endo , Teruyuki Nagamune , Ichiro Inoue , Kozo Inoue , Tadashi Nohira , Ikuzo Kagami , Tatsuya Iwakura
发明人： Isao Endo , Teruyuki Nagamune , Ichiro Inoue , Kozo Inoue , Tadashi Nohira , Ikuzo Kagami , Tatsuya Iwakura
IPC分类号： G01N21/59 , G01N21/53 , G01N21/85 , G01N21/84
CPC分类号： G01N21/8507 , G01N21/534 , G01N2201/0621 , G01N2201/0631 , G01N2201/064
摘要： In a turbidimeter for measuring a turbidity of a test solution to be measured i.e. culture solution in a fermentation apparatus, a semiconductor laser diode and a semiconductor photodiode are integrally arranged in a detection portion of the turbidimeter in such a manner that a laser beam emitted from the semiconductor laser diode is made incident upon the semiconductor photodiode through the test solution. Moreover, a protection circuit for the semiconductor laser diode and the semiconductor photodiode is also arranged in the turbidimeter to cut off a current flowed therethrough when an environmental temperature becomes above a predetermined temperature. Therefore, the turbidimeter can be made small in size and light in weight, and the turbidity can be measured accurately over wide range.
摘要翻译：在浊度计中，用于测量待测试的测试溶液的浊度，即发酵设备中的培养溶液，半导体激光二极管和半导体光电二极管一体地布置在浊度计的检测部分中，使得从半导体激光二极管通过测试溶液入射到半导体光电二极管上。此外，当环境温度高于预定温度时，用于半导体激光二极管和半导体光电二极管的保护电路也布置在浊度计中以截断流过其中的电流。因此，可以使浊度计尺寸小，重量轻，并且可以在宽范围内精确地测量浊度。

2. 发明授权

US4891519A Photometering apparatus 失效
标题翻译：测光装置
公开(公告)号：US4891519A
公开(公告)日：1990-01-02
申请号：US257635
申请日：1988-10-14
申请人： Tadashi Nohira , Tsuneo Imatsu , Ikuzo Kagami
发明人： Tadashi Nohira , Tsuneo Imatsu , Ikuzo Kagami
IPC分类号： G01J1/44 , G01J1/16 , G01N21/01 , G01N21/53 , G01N21/59 , G01N21/85
CPC分类号： G01N21/534 , G01N21/8507 , G01J1/1626 , G01J2001/444 , G01N2201/0612 , G01N2201/0806
摘要： A turbidimeter for measuring a turbidity of a test liquid including a hollow main body having openings formed at its lower end through which the test liquid is introduced into a measuring optical path within the main body, a semiconductor laser diode arranged in the main body at its upper end and emitting a laser light, a first prism arranged within the main body and guiding the laser light into the measuring optical path, a second prism arranged within the main body and guiding light emanating from the measuring optical path to the upper end of the main body, first and second semiconductor photodiodes arranged within the main body at its upper end such that the light emanating from the second prism is exclusively made incident upon the first semiconductor photodiode, and first and second operational amplifiers arranged within the main body at its upper end and amplifying output signals supplied from the first and second semiconductor photodiodes, respectively. Output signals generated from the first and second operational amplifiers are supplied to a differential amplifier to derive a difference therebetween, the difference corresponding to the turbidity of the test liquid. The differential amplifier is arranged remote from the main body, so that any error in the measured turbidity due to the temperature variation can be compensated for.
摘要翻译：一种浊度计，用于测量包括中空主体的测试液体的浊度，所述中空主体在其下端形成开口，所述测试液体通过所述开口被引入到所述主体内的测量光路中;半导体激光二极管，其设置在所述主体中上端并发射激光，第一棱镜布置在主体内并将激光引导到测量光路中，第二棱镜布置在主体内，并将从测量光路发出的光引导到测量光路的上端主体，第一和第二半导体光电二极管，其上端设置在主体内，使得从第二棱镜发出的光仅专门入射在第一半导体光电二极管上，第一和第二运算放大器布置在主体的上部分别结束和放大从第一和第二半导体光电二极管提供的输出信号。从第一和第二运算放大器产生的输出信号被提供给差分放大器以导出它们之间的差异，该差值对应于测试液体的浊度。差分放大器远离主体布置，可以补偿由于温度变化引起的测量浊度的任何误差。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式