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1. 发明申请

US20120103967A1 Burn-in oven having inverter fan and heat regulator 审中-公开
标题翻译：老化炉具有变频风扇和热调节器
公开(公告)号：US20120103967A1
公开(公告)日：2012-05-03
申请号：US13067430
申请日：2011-06-01
申请人： Yung-Tsung Hsu , Yen-Chang Liu , Ta Kang Liu
发明人： Yung-Tsung Hsu , Yen-Chang Liu , Ta Kang Liu
IPC分类号： A21B1/22
CPC分类号： G01R31/2862
摘要： A burn-in oven having an inverter fan and a heat regulator includes a housing, a frame, a heater, a temperature sensor, an inverter fan, and a control unit. The housing includes an air-in port and an air-out port. The frame is fixedly arranged inside the housing, and is divided into a variety of partitions. In addition, the heater and the temperature sensor are also fixedly arranged inside the housing. The inverter fan is provided for supplying a forced air-flow toward inside of the housing. The control unit is electrically connected with the temperature sensor, the heater, and the inverter fan. The control unit is provided for controlling the temperature inside the housing not to exceed a predetermined value. Thereby, the present invention saves energy and shortens effectively the time required for burn-in temperature rising and lowering, and saves working hours and manpower as well.
摘要翻译：具有逆变器风扇和热调节器的老化炉包括壳体，框架，加热器，温度传感器，逆变器风扇和控制单元。外壳包括一个进气口和一个排气口。框架固定地布置在外壳内，并分成多种隔板。此外，加热器和温度传感器也固定地布置在壳体内。逆变器风扇用于向壳体内部供应强制空气流。控制单元与温度传感器，加热器和逆变器风扇电连接。控制单元用于控制壳体内的温度不超过预定值。因此，本发明节省能量并有效地缩短了老化温度上升和下降所需的时间，并且节省了工作时间和人力。

2. 发明申请

US20120136614A1 Wafer inspection system 审中-公开
标题翻译：晶圆检查系统
公开(公告)号：US20120136614A1
公开(公告)日：2012-05-31
申请号：US13064163
申请日：2011-03-09
申请人： Ta Kang Liu , Ming Hsien Lee
发明人： Ta Kang Liu , Ming Hsien Lee
IPC分类号： G06F19/00
CPC分类号： G01R31/2831 , G01R1/07385 , G01R31/2889 , G01R31/2891
摘要： A wafer inspection system for inspecting a wafer comprises a platform, a probe card, a illuminator, a test server, at least one image processing device, a control circuit board, at least a test circuit board, a load board connected to the control circuit board and the at least a test circuit board, at least an image card, and at least a relay board. The probe card includes an opening hole and a plurality of probes for contacting the wafer to transmit and receive electrical signals. The illuminator illuminates on the wafer through the opening hole. The test server is controlled to execute test procedure and data process. The test circuit board transmits test signals and performs a determination on the received result signals. The relay board is connected to the probe card and the load board for switching the direction of data flow.
摘要翻译：用于检查晶片的晶片检查系统包括平台，探针卡，照明器，测试服务器，至少一个图像处理设备，控制电路板，至少测试电路板，连接到控制电路的负载板板和至少一个测试电路板，至少一个图像卡和至少一个继电器板。探针卡包括开孔和用于接触晶片以发送和接收电信号的多个探针。照明器通过开孔照亮晶片。控制测试服务器执行测试过程和数据处理。测试电路板发送测试信号并对接收到的结果信号进行确定。继电器板连接到探针卡和负载板，用于切换数据流的方向。

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