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    • 9. 发明申请
    • METHOD FOR DETECTING RADIATION AND EXAMINATION DEVICE FOR THE RADIATION-BASED EXAMINATION OF A SAMPLE
    • 用于检测放射性和检验装置的方法,用于基于辐射的检验样品
    • US20150041662A1
    • 2015-02-12
    • US14381982
    • 2013-02-15
    • Helmholtz Zentrum Muenchen Deutsches Forschungszentrum fuer Gesundheit und Umwelt(GmbH)Technische Universitaet Muenchen
    • Stefan ThalhammerMarkus HofstetterJohn HowgateMartin Stutzmann
    • G01T1/24G01N23/083
    • G01T1/24G01N23/083
    • A method for detecting radiation during the examination of a sample (1) comprises the steps of generating the radiation, more particularly X-ray radiation or proton radiation, by means of a source device (10), passing the radiation through the sample (1), and detecting the radiation by means of at least one photoelectric solid-state detector (20) containing a photoconduction section having a predetermined response threshold and a potential well section for taking up free charge carriers. The solid-state detector (20) is a GaN- or GaAs-based semiconductor detector and the potential well section contains a two-dimensional electron gas (2DEG). A setting of the radiation is provided in such a way that the solid-state detector (20) is operated separately from the response threshold of the photoconduction section and in a sensitivity range of the potential well section. An examination device (100) is also described, said examination device being configured for an examination of a sample (1) using radiation, more particularly X-ray radiation or proton radiation.
    • 在检查样品(1)期间检测辐射的方法包括以下步骤:通过源装置(10)产生辐射,更具体地说是X射线辐射或质子辐射,使辐射通过样品(1) ),并且通过至少一个包含具有预定响应阈值的光电导部分的光电固态检测器(20)和用于吸收空载电荷载体的势阱部分来检测辐射。 固态检测器(20)是基于GaN或GaAs的半导体检测器,势阱部分包含二维电子气(2DEG)。 提供辐射的设置,使得固态检测器(20)与光电导部分的响应阈值和势阱部分的灵敏度范围分开操作。 还描述了检查装置(100),所述检查装置被配置为使用辐射,特别是X射线辐射或质子辐射来检查样品(1)。