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    • 1. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US07511986B2
    • 2009-03-31
    • US11826613
    • 2007-07-17
    • Shinji HoriiSatoru Yamagata
    • Shinji HoriiSatoru Yamagata
    • G11C11/00
    • G11C13/0007G11C13/0069G11C2013/009G11C2213/31G11C2213/34G11C2213/79
    • The possibility of the loss of information stored in a memory cell which is caused by repeating the reading action on the same memory cell comprising a variable resistance element and a select transistor can significantly be reduced. A voltage applying circuit for selecting one or more of the memory cells from a memory cell array and applying voltages to the word lines, bit lines, and source lines for programming, erasing, and reading information applies a voltage between the bit line and the source line connected to the selected memory cell so that the voltage applied between the two ports of the variable resistance element in the selected memory cell during the reading action is equal in the polarity to one of the voltages applied between the two ports of the variable resistance element for the programming action and the erasing action respectively whichever is greater in the absolute value.
    • 可以显着地减少由包含可变电阻元件和选择晶体管的同一存储单元重复读取动作而导致存储在存储单元中的信息丢失的可能性。 一种电压施加电路,用于从存储单元阵列中选择一个或多个存储单元,并向字线,位线和源极线施加电压用于编程,擦除和读取信息,在位线和源之间施加电压 线路连接到所选择的存储器单元,使得在读取动作期间在所选择的存储单元中的可变电阻元件的两个端口之间施加的电压极性与施加在可变电阻元件的两个端口之间的电压之一相等 对于编程动作和擦除动作,分别取绝对值较大者。
    • 3. 发明授权
    • Nonvolatile semiconductor storage device, and liquid crystal display device including the same
    • 非易失性半导体存储装置以及包含该非易失性半导体存储装置的液晶显示装置
    • US07088617B2
    • 2006-08-08
    • US10919777
    • 2004-08-16
    • Fujio MasuokaHiroshi SakurabaFumiyoshi MatsuokaSyounosuke UenoRyusuke MatsuyamaShinji Horii
    • Fujio MasuokaHiroshi SakurabaFumiyoshi MatsuokaSyounosuke UenoRyusuke MatsuyamaShinji Horii
    • G11C16/04
    • G11C16/0483
    • A nonvolatile semiconductor storage device including: a plurality of memory cell unit groups each comprising one or more NAND nonvolatile memory cell units each comprising at least one memory cell having a control gate, a first selection transistor having a first selection gate, and a second selection transistor having a second selection gate, the memory cell unit groups each further comprising a control gate line connected to the control gate, a first selection gate line connected to the first selection gate, and a second selection gate line connected to the second selection gate; a common control gate line connected commonly to the control gate lines of different ones of the memory cell unit groups; a first common selection gate line connected commonly to the first selection gate lines of different ones of the memory cell unit groups; and a second common selection gate line connected commonly to the second selection gate lines of different ones of the memory cell unit groups; wherein the memory cells in the respective memory cell unit groups are each uniquely selected on the basis of a combination of the common control gate line and the first and second common selection gate lines.
    • 一种非易失性半导体存储装置,包括:多个存储单元单元组,每个存储单元单元组包括一个或多个NAND非易失性存储单元单元,每个非易失性存储单元单元包括至少一个具有控制栅极的存储单元, 晶体管具有第二选择栅极,所述存储单元单元组还包括连接到所述控制栅极的控制栅极线,连接到所述第一选择栅极的第一选择栅极线和连接到所述第二选择栅极的第二选择栅极线; 公共控制栅极线,共同地连接到不同的存储单元单元组的控制栅极线; 第一公共选择栅极线,共同连接到不同的存储单元单元组的第一选择栅极线; 以及第二公共选择栅极线,共同连接到不同的存储单元单元组的第二选择栅极线; 其中各个存储单元单元组中的存储单元是基于公共控制栅极线和第一和第二公共选择栅极线的组合而被唯一地选择的。
    • 9. 发明申请
    • Semiconductor memory device
    • 半导体存储器件
    • US20080025070A1
    • 2008-01-31
    • US11826613
    • 2007-07-17
    • Shinji HoriiSatoru Yamagata
    • Shinji HoriiSatoru Yamagata
    • G11C11/00
    • G11C13/0007G11C13/0069G11C2013/009G11C2213/31G11C2213/34G11C2213/79
    • The possibility of the loss of information stored in a memory cell which is caused by repeating the reading action on the same memory cell comprising a variable resistance element and a select transistor can significantly be reduced. A voltage applying circuit for selecting one or more of the memory cells from a memory cell array and applying voltages to the word lines, bit lines, and source lines for programming, erasing, and reading information applies a voltage between the bit line and the source line connected to the selected memory cell so that the voltage applied between the two ports of the variable resistance element in the selected memory cell during the reading action is equal in the polarity to one of the voltages applied between the two ports of the variable resistance element for the programming action and the erasing action respectively whichever is greater in the absolute value.
    • 可以显着地减少由包含可变电阻元件和选择晶体管的同一存储单元重复读取动作而导致存储在存储单元中的信息丢失的可能性。 一种电压施加电路,用于从存储单元阵列中选择一个或多个存储单元,并向字线,位线和源极线施加电压用于编程,擦除和读取信息,在位线和源之间施加电压 线路连接到所选择的存储器单元,使得在读取动作期间在所选择的存储单元中的可变电阻元件的两个端口之间施加的电压极性与施加在可变电阻元件的两个端口之间的电压之一相等 对于编程动作和擦除动作,分别取绝对值较大者。