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    • 4. 发明授权
    • Method of forming dual damascene structure
    • 形成双镶嵌结构的方法
    • US06573187B1
    • 2003-06-03
    • US09378458
    • 1999-08-20
    • Sheng-Hsiung ChenMing-Hsing Tsai
    • Sheng-Hsiung ChenMing-Hsing Tsai
    • H01L21302
    • H01L21/76835H01L21/76807
    • A new method is provided for creating a dual damascene structure. Two layers of dielectric are deposited in sequence. The lower layer of dielectric is the via dielectric and is selected such that it has a low etching rate (when compared with the upper layer of dielectric) and results in different volatile gas during the etch of the via. A first photoresist is patterned for the via, the etch for the via etches through both layers of dielectric. A second layer of photoresist is patterned for the trench etch, due to the difference in etch rate between the two layers of dielectric, the trench of the dual damascene structure is etched without further affecting the via etch in the lower layer of dielectric.
    • 提供了一种创建双镶嵌结构的新方法。 依次沉积两层电介质。 电介质的下层是通孔电介质,并且被选择为使得其具有低蚀刻速率(当与电介质的上层相比时),并且在蚀刻通孔期间导致不同的挥发性气体。 对于通孔图案化第一光致抗蚀剂,蚀刻通过两个电介质层的通孔蚀刻。 为了沟槽蚀刻,第二层光致抗蚀剂被图案化,由于两层电介质之间的蚀刻速率差异,双镶嵌结构的沟槽被蚀刻,而不会进一步影响电介质的下层中的通孔蚀刻。
    • 7. 发明授权
    • Method for marking a wafer without inducing flat edge particle problem
    • 用于标记晶片而不引起平坦边缘颗粒问题的方法
    • US06235637B1
    • 2001-05-22
    • US09396518
    • 1999-09-15
    • Sheng-Hsiung ChenMing-Hsing Tsai
    • Sheng-Hsiung ChenMing-Hsing Tsai
    • H01L21311
    • H01L23/544H01L2223/54493H01L2924/0002H01L2924/00
    • A method for marking a semiconductor wafer without inducing flat edge particles, using a laser scribing technique. The process begins by providing a semiconductor wafer having a marking area with a silicon top layer. The semiconductor wafer is coated with a photoresist layer. A volume of the photoresist layer and a volume of silicon top layer are removed corresponding to the intended marking. Optionally, the marking pattern can be further etched into the silicon top layer by anisotropic etching, using the photoresist layer as an etching mask. In another option, the laser scribing process can be set to scribe the marking pattern in the photoresist layer without scribing the silicon top layer. The marking pattern can then be anisotropically etched into the silicon top layer, using the photoresist layer as an etching mask. Alternatively, the photoresist layer can be patterned to form an opening in the photoresist layer over a marking area, thereby exposing the silicon top layer. The silicon top layer is then marked using a laser scribing technique, and the photoresist layer prevents contamination of the device areas of the wafer by the silicon particles generated by the laser scribing technique.
    • 使用激光划线技术来标记半导体晶片而不引起平坦边缘颗粒的方法。 该过程开始于提供具有带硅顶层的标记区域的半导体晶片。 半导体晶片被涂覆有光致抗蚀剂层。 根据预期的标记去​​除光致抗蚀剂层的体积和硅顶层的体积。 可选地,使用光致抗蚀剂层作为蚀刻掩模,可以通过各向异性蚀刻将标记图案进一步蚀刻到硅顶层中。 在另一种选择中,可以设置激光划线工艺以划刻光致抗蚀剂层中的标记图案,而无需划线硅顶层。 然后可以使用光致抗蚀剂层作为蚀刻掩模将标记图案各向异性地蚀刻到硅顶层中。 或者,光致抗蚀剂层可以被图案化以在标记区域上在光致抗蚀剂层中形成开口,从而暴露硅顶层。 然后使用激光划线技术标记硅顶层,并且光致抗蚀剂层防止由激光划线技术产生的硅颗粒对晶片的器件区域的污染。