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    • 1. 发明授权
    • Apparatus and method for determining tissue characteristics
    • 用于确定组织特征的装置和方法
    • US06577391B1
    • 2003-06-10
    • US09533817
    • 2000-03-24
    • Mark L. FaupelShabbir B. BambotTim HarrellJ. David FarquharGlenn S. ArcheWalter R. SandersEdward L. Kimbrell
    • Mark L. FaupelShabbir B. BambotTim HarrellJ. David FarquharGlenn S. ArcheWalter R. SandersEdward L. Kimbrell
    • G01N2100
    • A61B5/0059A61B5/0071A61B5/0075A61B5/0084A61B5/0091A61B5/4331A61B5/6843A61B2562/164G01N21/21G01N21/474G01N21/49G01N21/64
    • An apparatus embodying the invention includes a probe head with an interrogation surface that is intended to be positioned adjacent or pushed into contact with a target material or tissue. The probe head is constructed to have a plurality of interrogation devices arranged across the face of the interrogation surface. The probe head is also constructed so that the interrogation device can conform to a non-uniform or non-planar surface of the target tissue. In some embodiments, the interrogation surface may have a particular shape that conforms to the shape of a target material. In other embodiments, one or more portions of the interrogation surface could be movable with respect to the remaining portions so that the interrogation surface could be movable with respect to remaining portions so that the interrogation surface can the thereby conform to a non-uniform surface. In still other embodiments, a plurality of separately moveable interrogation devices can be arranged across the interrogation surface. During a measurement process, the interrogation surface would be pressed into contact with the non-uniform surface to cause individual ones of the interrogation devices to move, thereby causing the probe head to conform to the non-uniform surface.
    • 实施本发明的装置包括具有询问表面的探针头,该询问表面旨在被定位成与靶材料或组织相邻或被推动接触。 探头被构造成具有布置在询问表面的表面上的多个询问装置​​。 探头也被构造成使得询问装置能够符合目标组织的不均匀或非平面的表面。 在一些实施例中,询问表面可以具有符合目标材料的形状的特定形状。 在其他实施例中,询问表面的一个或多个部分可以相对于其余部分是可移动的,使得询问表面可以相对于剩余部分移动,使得询问表面因此可以符合不均匀的表面。 在其他实施例中,可以跨越询问表面布置多个可单独移动的询问装置。 在测量过程中,询问表面将被压制成与不均匀表面接触,以使单个询问装置​​移动,从而使探针头与非均匀表面一致。