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    • 1. 发明授权
    • Method and apparatus for heat treating
    • 热处理方法和装置
    • US5431561A
    • 1995-07-11
    • US166014
    • 1993-12-14
    • Kikuo YamabeKeitaro ImaiKatsuya OkumuraKen NakaoSeikou Ueno
    • Kikuo YamabeKeitaro ImaiKatsuya OkumuraKen NakaoSeikou Ueno
    • H01L21/324C30B31/12C30B31/14H01L21/22H01L21/31H01L21/673H01L21/683F27D5/00
    • C30B31/12C30B31/14
    • A method and an apparatus for heat treating in a heat treating apparatus having a heating chamber to be introduced with predetermined gas, a heater disposed around the heating chamber, and jigs disposed in the heating chamber for supporting wafers of a plurality of substrates to be treated in parallel with each other, wherein in order to make the temperature distribution of the wafers of the substrates to be treated in the radial direction uniform in the heat treatment, the jigs are formed to determine the sizes and the shape thereof in predetermined ranges having a gradient according to the heat treating method having a predetermined shape determining procedure so that the jigs are formed in ring-shaped trays (i.e. support-ring) for holding at the peripheries the substrates to be treated and the thickness of the tray is constant or such that the outer peripheral side thereof is thicker than the inner peripheral side thereof.
    • 一种热处理装置中的热处理方法和装置,其特征在于,具有要加入预定气体的加热室,设置在所述加热室周围的加热器和设置在所述加热室中的夹具,用于支撑待处理的多个基板的晶片 彼此并联,其中为了使热处理中要处理的基板的晶片的温度分布均匀,形成夹具以确定其尺寸和形状,其具有在 根据具有预定形状确定步骤的热处理方法的梯度,使得夹具形成为环状托盘(即,支撑环),用于在周边保持要处理的基板,并且托盘的厚度等于或等于 其外周侧比其内周侧厚。
    • 2. 发明授权
    • Method and apparatus for heat treating
    • 热处理方法和装置
    • US5297956A
    • 1994-03-29
    • US799931
    • 1991-11-29
    • Kikuo YamabeKeitaro ImaiKatsuya OkumuraKen NakaoSeikou Ueno
    • Kikuo YamabeKeitaro ImaiKatsuya OkumuraKen NakaoSeikou Ueno
    • H01L21/324C30B31/12C30B31/14H01L21/22H01L21/31H01L21/673H01L21/683F23D5/00
    • C30B31/12C30B31/14
    • A method and an apparatus for heat treating in a heat treating apparatus having a heating chamber to be introduced with predetermined gas, a heater disposed around the heating chamber, and jigs disposed in the heating chamber for supporting wafers of a plurality of substrates to be treated in parallel with each other, wherein in order to make the temperature distribution of the wafers of the substrates to be treated in the radial direction uniform in the heat treatment, the jigs are formed to determine the sizes and the shape thereof in predetermined ranges having a gradient according to the heat treating method having a predetermined shape determining procedure so that the jigs are formed in ring-shaped trays (i.e. support-ring) for holding at the peripheries the substrates to be treated and the thickness of the tray is constant or such that the outer peripheral side thereof is thicker than the inner peripheral side thereof.
    • 一种热处理装置中的热处理方法和装置,其特征在于,具有要加入预定气体的加热室,设置在所述加热室周围的加热器和设置在所述加热室中的夹具,用于支撑待处理的多个基板的晶片 彼此并联,其中为了使热处理中要处理的基板的晶片的温度分布均匀,形成夹具以确定其尺寸和形状,其具有在 根据具有预定形状确定步骤的热处理方法的梯度,使得夹具形成为环状托盘(即,支撑环),用于在周边保持要处理的基板,并且托盘的厚度等于或等于 其外周侧比其内周侧厚。