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1. 发明授权

US07483769B2 Method and apparatus for latent temperature control for a device under test 有权
标题翻译：被测设备的潜温控制方法和装置
公开(公告)号：US07483769B2
公开(公告)日：2009-01-27
申请号：US11343548
申请日：2006-01-30
申请人： Sandy Hoover, legal representative
发明人： Robert T. Stewart
IPC分类号： G06F19/00
CPC分类号： G05D23/1931
摘要： A method and associated algorithm for controlling and optimizing the temperature of a device under test (DUT) through calculation of a moving setpoint which varies from the user-specified DUT core temperature. The method generally comprises (i) calculating a system operating range based on limits imposed by the DUT, associated temperature control system, and thermal conditioning equipment; (ii) determining the allowable operating range for the DUT based on permissible DUT stress and DUT core temperature; and (iii) calculating a control setpoint based on DUT and conditioning system temperature data, one or more pre-selected setup factors, and the system and DUT operating ranges. In another aspect of the invention, variable temperature differential limits are imposed on the CSP as a function of DUT core temperature in order to mitigate thermal shock to the DUT. Methods and apparatus for latent temperature control are also disclosed.
摘要翻译：一种用于通过计算从用户指定的DUT核心温度变化的移动设定值来控制和优化待测器件（DUT）的温度的方法和相关算法。该方法通常包括（i）基于由DUT施加的限制，相关联的温度控制系统和热调节设备来计算系统工作范围; （ii）基于允许的DUT应力和DUT核心温度确定DUT的允许工作范围; 和（iii）基于DUT和调节系统温度数据，一个或多个预先选择的设置因子以及系统和DUT工作范围来计算控制设定点。在本发明的另一方面，为了减轻对DUT的热冲击，可变温度限制作为DUT核心温度的函数施加在CSP上。还公开了潜温控制的方法和装置。

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