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    • 1. 发明授权
    • System and method for measuring hole orientation for SPECT collimators
    • 用于测量SPECT准直仪孔取向的系统和方法
    • US08340386B2
    • 2012-12-25
    • US12987376
    • 2011-01-10
    • Ronald E. Malmin
    • Ronald E. Malmin
    • G06K9/00A61B6/00
    • G06T11/005A61B6/037
    • A method for measuring a SPECT collimator's hole orientation angles includes (a) providing a plurality of parallel spaced apart line radiation sources at a distance from a detector; (b) positioning a first collimator between the plurality of spaced apart line radiation sources and the detector; (c) obtaining a set of line images of the plurality of line radiation sources by scanning/stepping the plurality of line radiation sources across the first collimator in a first direction; (d) obtaining a second set of line images of the plurality of line radiation sources by scanning/stepping the plurality of line radiation sources across the first collimator in a second direction thai is perpendicular to the first direction; (c) repeating the steps (c) and (d) for a second collimator, wherein one of the two collimators is a reference collimator and the other of the two collimators is a collimator being measured.
    • 用于测量SPECT准直器的孔取向角的方法包括(a)在与检测器相距一定距离处提供多个平行间隔开的​​线辐射源; (b)将第一准直器定位在所述多个间隔开的线辐射源和所述检测器之间; (c)通过在第一方向跨越第一准直仪扫描/步进多条线辐射源来获得多条线辐射源的一组线图像; (d)通过在垂直于第一方向的第二方向跨越第一准直仪扫描/步进多条线辐射源来获得多条线辐射源的第二组线图像; (c)对于第二准直仪重复步骤(c)和(d),其中两个准直器中的一个是参考准直器,并且两个准直器中的另一个是被测量的准直器。
    • 2. 发明申请
    • System and Method for Measuring Hole Orientation for SPECT Collimators
    • 用于测量SPECT准直器孔定位的系统和方法
    • US20120177268A1
    • 2012-07-12
    • US12987376
    • 2011-01-10
    • Ronald E. Malmin
    • Ronald E. Malmin
    • G06K9/00
    • G06T11/005A61B6/037
    • A method for measuring a SPECT collimator's hole orientation angles includes (a) providing a plurality of parallel spaced apart line radiation sources at a distance from a detector; (b) positioning a first collimator between the plurality of spaced apart line radiation sources and the detector; (c) obtaining a set of line images of the plurality of line radiation sources by scanning/stepping the plurality of line radiation sources across the first collimator in a first direction; (d) obtaining a second set of line images of the plurality of line radiation sources by scanning/stepping the plurality of line radiation sources across the first collimator in a second direction that is perpendicular to the first direction; (e) repeating the steps (c) and (d) for a second collimator, wherein one of the two collimators is a reference collimator and the other of the two collimators is a collimator being measured, whereby the line images obtained using the reference collimator are reference collimator line images and the line images obtained using the collimator being measured are measured collimator line images; (f) analyzing the reference collimator line images and the measured collimator line images and determining the offset distance dx between the reference collimator line images and the measured collimator line images in the first direction and the offset distance dy between the reference collimator line images and the measured collimator line images in the second direction, wherein dx is the offset distance in the first direction and dy is the offset distance in the second direction; and (g) calculating hole orientation angles θx, θy for each collimator hole in the collimator being measured.
    • 用于测量SPECT准直器的孔取向角的方法包括(a)在与检测器相距一定距离处提供多个平行间隔开的​​线辐射源; (b)将第一准直器定位在所述多个间隔开的线辐射源和所述检测器之间; (c)通过在第一方向跨越第一准直仪扫描/步进多条线辐射源来获得多条线辐射源的一组线图像; (d)通过在垂直于第一方向的第二方向跨越第一准直仪扫描/步进多条线辐射源来获得多条线辐射源的第二组线图像; (e)对于第二准直仪重复步骤(c)和(d),其中两个准直仪中的一个是参考准直仪,并且两个准直仪中的另一个是被测量的准直仪,由此使用参考准直仪 是参考准直器线图像和使用被测量的准直器获得的线图像是测量准直器线图像; (f)分析参考准直器线图像和所测量的准直仪线图像,并且确定参考准直器线图像与第一方向上的测量准直仪线图像之间的偏移距离dx以及参考准直器线图像与参考准直器行图像之间的偏移距离dy 在第二方向上测量准直仪线图像,其中dx是第一方向上的偏移距离,dy是第二方向上的偏移距离; 和(g)计算待测量的准直器中的每个准直器孔的孔取向角度和角度; x,& t; y。
    • 3. 发明授权
    • Position-weighted location of scintillation events
    • 闪烁事件的位置加权位置
    • US08115172B2
    • 2012-02-14
    • US12568432
    • 2009-09-28
    • Ronald E. Malmin
    • Ronald E. Malmin
    • G01T1/20
    • G01T1/1644
    • Determining a scintillation event location bevent along an axis B of an array of photomultiplier tubes, each photomultiplier tube having a location bPMT and an output ZPMT. Determining a preliminary event location bprelim along the B axis as a centroid of the photomultiplier tube outputs. Determining a position-weighted characteristic (ZPMT·(bPMT−bprelim)2) of each of the photomultiplier tubes. Determining event location bevent along the B axis as a centroid of the outputs of those photomultiplier tubes characterized by a position-weighted characteristic less than or equal to a predetermined cutoff.
    • 确定沿着光电倍增管阵列的轴线B的闪烁事件位置,每个光电倍增管具有位置bPMT和输出ZPMT。 确定沿B轴的初步事件位置bprelim作为光电倍增管输出的质心。 确定每个光电倍增管的位置加权特性(ZPMT·(bPMT-bprelim)2)。 确定沿着B轴的事件位置作为这些光电倍增管的输出的质心,其特征在于小于或等于预定截止点的位置加权特性。
    • 4. 发明授权
    • Mitigation of errors in an imaging system with detectors mounted to a gantry and rotatable thereon
    • 减少成像系统中的错误,其中检测器安装在台架上并可在其上旋转
    • US07968852B1
    • 2011-06-28
    • US12887863
    • 2010-09-22
    • Ronald E. MalminManjit Ray
    • Ronald E. MalminManjit Ray
    • H01L27/146
    • A61B6/547A61B6/03A61B6/037H01L27/14663
    • Implementations of the present technology include error mitigation processes that determine gantry angle-dependent measures of detector deflections for a given class of systems using a first method, then determine gantry angle-independent deviations from the class measures using a second method on a specific system; then apply, to the specific system of the second method, the gantry angle-dependent class deflection results of the first method modified by the system-specific gantry angle independent deflections of the second method; and further include a system calibrated by such combinations of processes and computer program products for performing at least portions of the combination of processes.
    • 本技术的实现包括使用第一种方法确定给定类别的系统的检测器偏转的与机架角度相关的测量的误差减轻过程,然后使用特定系统上的第二种方法来确定与类别测量的台架角度无关的偏差; 然后应用于第二种方法的特定系统,第二种方法由系统特定的机架角独立挠度修改的第一种方法的机架角度依赖类偏转结果; 并且还包括由这些过程和计算机程序产品的组合校准的系统,用于执行过程组合的至少一部分。
    • 5. 发明申请
    • Imaging System and Method For Tuning Same
    • 成像系统和调谐方法相同
    • US20100080353A1
    • 2010-04-01
    • US12568631
    • 2009-09-28
    • Ronald E. Malmin
    • Ronald E. Malmin
    • G01N23/04G01J1/02G01T1/20
    • G01T1/1642A61B6/4258
    • A method of tuning an imaging system can include the steps of receiving photons at photo-multiplier units that are part of an array, determining an energy level for each of the photo-multiplier units based on events over a specific photo-multiplier unit and determining a sum energy level for the array of photo-multiplier units based on the events over the specific photo-multiplier unit. The method can also include the step of comparing the energy level for each of the photo-multiplier units with the sum energy level for the array of photo-multiplier units to assist in determining a contribution matrix for the array of photo-multiplier units. The energy level determination steps and the comparison step can be repeated for each photo-multiplier unit in the array to determine the contribution matrix.
    • 调整成像系统的方法可以包括以光电倍增器单元接收作为阵列一部分的光子的步骤,基于特定光倍增器单元上的事件确定每个光电倍增器单元的能级,并确定 基于特定光电倍增器单元上的事件的光电倍增器单元阵列的和能级。 该方法还可以包括将每个光电倍增器单元的能级与用于光电倍增器单元阵列的和能级进行比较以帮助确定光乘法器单元阵列的贡献矩阵的步骤。 可以对阵列中的每个光电倍增器单元重复能量水平确定步骤和比较步骤以确定贡献矩阵。
    • 6. 发明授权
    • Channels for control of scintillation crystal light response
    • 用于控制闪烁晶体光响应的通道
    • US06841783B2
    • 2005-01-11
    • US10318082
    • 2002-12-13
    • Ronald E. Malmin
    • Ronald E. Malmin
    • G01T1/164G01T1/20
    • G01T1/1644
    • A radiographic imaging device includes one or more sensors, a scintillation crystal including an emission face, a first set of channels of a first channel depth in the emission face, and a second set of channels of a second channel depth different from the first channel depth in the emission face. Channels of the first and second sets are in a substantially parallel, spaced apart relationship along a first direction, and the second set of channels extend along a second direction non-parallel with the first direction. The scintillation crystal exhibits an anisotropic light spreading function to compensate for differences in sensor spacing along the first and second directions.
    • 射线照相成像装置包括一个或多个传感器,包括发射面的闪烁晶体,发射面中的第一通道深度的第一组通道和与第一通道深度不同的第二通道深度的第二通道组 在排放面。 第一组和第二组的通道沿着第一方向处于基本上平行的间隔开的关系,并且第二组通道沿与第一方向不平行的第二方向延伸。 闪烁晶体显示出各向异性的光扩散功能,以补偿沿着第一和第二方向的传感器间距的差异。
    • 7. 发明申请
    • Collimator for Medical Imaging and Fabrication Method
    • 医学成像和制作方法准直仪
    • US20130075630A1
    • 2013-03-28
    • US13586910
    • 2012-08-16
    • Ronald E. Malmin
    • Ronald E. Malmin
    • G21K1/02B23K26/38B23P17/00B23H1/00
    • B23H9/00B23H1/00B23H7/02B23K26/364B23K26/40B23K2103/08B23K2103/50G21K1/02G21K1/025Y10T29/49826Y10T83/04Y10T83/0581
    • A photon collimator, suitable for use in medical imaging equipment, is constructed from a block of photon-attenuating material, such as solid tungsten or molybdenum alloy that defines a plurality of integrally formed septa slats. Each slat has an elongated length dimension greater than thickness and depth dimensions, and is oriented in an opposed pattern array that is laterally spaced relative to its respective thickness dimension. An aperture channel is defined between each pair of opposed slats. Rows of integrally formed slats in one block or separately affixed blocks may be stacked on each other at skewed angles to form two-dimensional grids of apertures having polygonal cross sections. The slats may be formed by electric discharge or laser thermal ablation machining, such as by a sequential passing of an EDM wire cutting head along the pattern array, repeating sequential cutting of respective channel depth and width.
    • 适用于医学成像设备的光子准直器由光子衰减材料块构成,例如固体钨或钼合金,其限定多个整体形成的隔片板条。 每个板条具有大于厚度和深度尺寸的细长长度尺寸,并且被定向成相对于其相应厚度尺寸横向隔开的相对图案阵列。 在每对相对的板条之间限定孔径通道。 在一个块或单独固定的块中的整体形成的板条的行可以倾斜的角度彼此堆叠,以形成具有多边形横截面的孔的二维网格。 板条可以通过放电或激光热切割加工形成,例如通过沿着图案阵列顺序通过EDM线切割头,重复相应的通道深度和宽度的连续切割。
    • 10. 发明授权
    • Adaptive baseline correction for gamma camera
    • 伽马相机的自适应基线校正
    • US5847395A
    • 1998-12-08
    • US735944
    • 1996-10-23
    • Ronald E. MalminRoger E. Arseneau
    • Ronald E. MalminRoger E. Arseneau
    • G06T5/40G01D18/00
    • H04N5/20G01T1/1647H04N5/217H04N5/32
    • Signal processing circuitry for use in medical imaging includes a flash analog-to-digital converter (FADC) for digitizing signals from a sensor; a memory for storing a plurality of digitized signals prior to a current event; and a processor for generating an adjustment signal from the plurality of digitized signals to adjust a first signal corresponding to the current event. In a fast time scale event processing, the signal processing circuitry generates an adjustment signal in near real-time corresponding to an analog error which is computed and updated from signals just prior to an event. In an alternative embodiment, the signal processing circuitry includes an FADC which generates the plurality of signals from a plurality of pseudo-event signals; and a digital-to-analog converter (DAC) is used for generating the pseudo-event signals between a previous event and the current event. A data fitting circuit is included for performing linear fitting of data corresponding to the plurality of signals to generate the adjustment signal. The baseline shifts and other effects of DC drift are corrected to improve event localization in the medical imaging system.
    • 用于医学成像的信号处理电路包括用于数字化来自传感器的信号的闪存模数转换器(FADC); 用于在当前事件之前存储多个数字化信号的存储器; 以及处理器,用于从所述多个数字化信号产生调整信号,以调整与所述当前事件相对应的第一信号。 在快速时间尺度事件处理中,信号处理电路近似实时地生成对应于刚好在事件之前的信号计算和更新的模拟错误的调整信号。 在替代实施例中,信号处理电路包括从多个伪事件信号产生多个信号的FADC; 并且使用数模转换器(DAC)来产生先前事件和当前事件之间的伪事件信号。 包括数据拟合电路,用于对与多个信号相对应的数据进行线性拟合以产生调整信号。 纠正基线偏移和DC漂移的其他影响,以改善医学成像系统中的事件定位。