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1. 发明授权

US06959126B1 Multipurpose testing system for optical cross connect devices 有权
标题翻译：光交叉设备多用途测试系统
公开(公告)号：US06959126B1
公开(公告)日：2005-10-25
申请号：US10072682
申请日：2002-02-08
申请人： Rob Lofland , Kevin White , Kaushal K. Agrawal , Peter Hunt
发明人： Rob Lofland , Kevin White , Kaushal K. Agrawal , Peter Hunt
IPC分类号： G01M11/00 , G02B6/26 , G02B6/42
CPC分类号： G01M11/337 , G01M11/335
摘要： A technique is disclosed for performing testing of an optical device under test (DUT). According to a specific embodiment, the DUT includes a plurality of DUT optical input ports and a plurality of DUT optical output ports. The testing may be performed by an optical switching testing system (OSTS) which includes a plurality of OSTS output ports optically connected to a plurality of DUT input ports, and a plurality of OSTS input ports optically connected to a plurality of DUT output ports. Components of the OSTS are configured in order to perform a specific test on the DUT. A first test scenario is configured at the DUT. At least one optical test signal is transmitted to at least one DUT input port. Test results may then be obtained by monitoring at least one DUT output port for the presence or absence of light. The test results are then analyzed for specific characteristics. According to a specific embodiment, the OSTS of the present invention may be adapted to automatically perform a plurality of testing operations on a selected plurality of different optical paths associated with the DUT. Such testing operations may include, for example, transmitting a plurality of optical test signals to a plurality of DUT input ports during a given test scenario, and/or monitoring a plurality of DUT output ports for test results during a given test scenario. According to a specific embodiment, the optical switch testing system of the present invention may be used to measure and verify selected characteristics associated with a device under test (DUT) or a system under test (SUT). Such characteristics may include, for example, optical cross talk, insertion loss, polarization dependent loss, path switching time, data integrity, optical path verification, optical path stability, etc.
摘要翻译：公开了一种用于对待测光学器件（DUT）进行测试的技术。根据具体实施例，DUT包括多个DUT光输入端口和多个DUT光输出端口。测试可以由光切换测试系统（OSTS）执行，该光切换测试系统包括多个与多个DUT输入端口光学连接的OSTS输出端口，以及多个OSTS输入端口，其光耦合到多个DUT输出端口。配置OSTS的组件以便对DUT进行特定测试。在DUT上配置了第一个测试场景。至少一个光学测试信号被发送到至少一个DUT输入端口。然后可以通过监视至少一个DUT输出端口以获得光的存在或不存在来获得测试结果。然后分析测试结果的具体特征。根据具体实施例，本发明的OSTS可以适于在与DUT相关联的所选择的多个不同光路上自动执行多个测试操作。这样的测试操作可以包括例如在给定测试场景期间向多个DUT输入端口发送多个光学测试信号，和/或在给定测试场景期间监视多个DUT输出端口以用于测试结果。根据具体实施例，本发明的光开关测试系统可用于测量和验证与被测设备（DUT）或被测系统（SUT）相关的选定特性。这种特征可以包括例如光串扰，插入损耗，偏振相关损耗，路径切换时间，数据完整性，光路验证，光路稳定性等。

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