专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20070296395A1 Semiconductor device, semiconductor device testing method, and probe card 有权
标题翻译：半导体器件，半导体器件测试方法和探针卡
公开(公告)号：US20070296395A1
公开(公告)日：2007-12-27
申请号：US11802335
申请日：2007-05-22
申请人： Ren Uchida , Masami Mori
发明人： Ren Uchida , Masami Mori
IPC分类号： G01R17/02 , H03K19/0175
CPC分类号： G01R31/31701 , G01R31/31727 , G09G3/006
摘要： A test signal to be supplied to a driver section when the driver section is subjected to an operation test is generated by a test circuit. In the test circuit, the test signal can be generated by a burn-in control circuit in accordance with a clock signal TESTCK supplied from an outside source.
摘要翻译：通过测试电路产生当驱动器部分进行操作测试时提供给驱动器部分的测试信号。在测试电路中，测试信号可以根据从外部源提供的时钟信号TESTCK由老化控制电路产生。

2. 发明授权

US06879174B2 Testing method and testing device for semiconductor integrated circuits 失效
标题翻译：半导体集成电路的测试方法和测试装置
公开(公告)号：US06879174B2
公开(公告)日：2005-04-12
申请号：US09941683
申请日：2001-08-30
申请人： Ren Uchida
发明人： Ren Uchida
IPC分类号： G01R31/316 , G01R31/26 , G01R31/28 , G01R31/3183 , G02F1/133 , H01L21/822 , H01L27/04 , H03M1/10 , H03M1/76 , G09G3/36
CPC分类号： G01R31/2841
摘要： The set values of the base power supply voltages are divided between 10 [V] and 0 [V], the upper limit value and the lower limit value of the drive voltage specification of a liquid crystal driver. A base power supply potential difference of 10 [V] between V1 to V2 of the base power supply terminals can be generated. By taking the gradation levels included between V1 to V2 of these base power supply terminals as test objects, each of the neighboring gradation output levels can mutually have a potential difference of about 200 [mV] (base power supply potential difference between the terminals 10000 [mV]/51 gradation levels). For the gradation levels included between these base power supply terminals, for every gradation level, test is performed while changing sequentially the input data and the setting of the judgment level of the comparator, and the gradation levels included in this interval are all tested.
摘要翻译：基本电源电压的设定值在液晶驱动器的驱动电压规格的上限值和下限值分别为10 [V]至0 [V]之间。可以产生基本电源端子的V1至V2之间的基本电源电位差为10 [V]。通过将这些基本电源端子的V1〜V2之间的灰度级作为测试对象，每个相邻的灰度输出电平可以相互具有约200 [mV]的电位差（端子10000 [ mV] / 51灰度等级）。对于包括在这些基本电源端子之间的灰度级，对于每个灰度级，在顺序地改变输入数据和比较器的判断电平的设置，并且包括在该间隔中的灰度级全部被测试的同时进行测试。

3. 发明授权

US07902853B2 Semiconductor device, semiconductor device testing method, and probe card 有权
标题翻译：半导体器件，半导体器件测试方法和探针卡
公开(公告)号：US07902853B2
公开(公告)日：2011-03-08
申请号：US11802335
申请日：2007-05-22
申请人： Ren Uchida , Masami Mori
发明人： Ren Uchida , Masami Mori
IPC分类号： G01R31/26 , G11C29/00
CPC分类号： G01R31/31701 , G01R31/31727 , G09G3/006
摘要： A test signal to be supplied to a driver section when the driver section is subjected to an operation test is generated by a test circuit. In the test circuit, the test signal can be generated by a burn-in control circuit in accordance with a clock signal TESTCK supplied from an outside source.
摘要翻译：通过测试电路产生当驱动器部分进行操作测试时提供给驱动器部分的测试信号。在测试电路中，测试信号可以根据从外部源提供的时钟信号TESTCK由老化控制电路产生。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式