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2. 发明申请

US20150285621A1 Non-Contact Determination of Coating Thickness 审中-公开
标题翻译：非接触测定涂层厚度
公开(公告)号：US20150285621A1
公开(公告)日：2015-10-08
申请号：US14680477
申请日：2015-04-07
申请人： John Weber Schultz , Rebecca Brockway Schultz , James Geoffrey Maloney , Kathleen Cummings Maloney
发明人： John Weber Schultz , Rebecca Brockway Schultz , James Geoffrey Maloney , Kathleen Cummings Maloney
IPC分类号： G01B11/06
CPC分类号： G01B15/02
摘要： Various examples of methods and systems are disclosed for non-contact determination of coating thickness. In one example, among others, a method includes illuminating a surface having a layer of a coating material with electromagnetic (EM) energy transmitted at two or more frequencies, obtaining measured reflection data from reflected EM energy, and matching the measured reflection data to modeled reflection data of a reflection model based upon minimization of an error between the measured reflection data and the modeled reflection data to determine a measured thickness of the layer. In another example, a system includes a probe configured to illuminate an area of the surface including a layer of a coating material with EM energy and receive reflected EM energy, and a processing device configured to determine a measured thickness of the layer based upon minimization of an error between measured reflection data and modeled reflection data.
摘要翻译：公开了用于非接触测定涂层厚度的方法和系统的各种实例。在一个示例中，其中一个方法包括用以两个或更多个频率传输的电磁（EM）能量照射具有涂层材料层的表面，从反射的EM能量获得测量的反射数据，并将测得的反射数据与建模的基于测量的反射数据和建模的反射数据之间的误差的最小化来反射模型的反射数据，以确定测量的层的厚度。在另一示例中，系统包括被配置为照亮包括具有EM能量的涂层材料层并接收反射EM能量的表面区域的探针，以及被配置为基于最小化来确定层的测量厚度的处理装置测量反射数据与建模反射数据之间的误差。

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