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    • 3. 发明授权
    • Configuration for the execution of a plasma based sputter process
    • 用于执行基于等离子体的溅射工艺的配置
    • US06524448B2
    • 2003-02-25
    • US09832988
    • 2001-04-11
    • Ralf-Peter BrinkmannAlfred Kersch
    • Ralf-Peter BrinkmannAlfred Kersch
    • C23C1435
    • H01J37/32623C23C14/351C23C16/50H01J37/3266
    • The present invention relates to a system for executing a plasma-based sputtering method, such as for example a PVD (Physical Vapor Deposition) method. In a process chamber (1), a plasma (2) is produced in order to accelerate ionized particles, carried away from a sputter target (21), through the plasma (2) towards a substrate (3), using an electrical field. In the process chamber (1), between the plasma (2) and the substrate (3) a magnetic field component (6) is produced by that is situated parallel to a substrate surface (5). Through the magnetic field component (6), the angular distribution of the ionized particles is deflected from its flight path perpendicular to the substrate surface, so that impact angles are produced that have a greater angular scattering.
    • 本发明涉及一种用于执行等离子体溅射方法的系统,例如PVD(物理气相沉积)方法。 在处理室(1)中,产生等离子体(2),以便使用电场将离子化的颗粒从溅射靶(21)传送通过等离子体(2)朝基板(3)移动。 在处理室(1)中,在等离子体(2)和衬底(3)之间,通过平行于衬底表面(5)的方式制造磁场分量(6)。 通过磁场分量(6),电离粒子的角分布从垂直于衬底表面的飞行路径偏转,从而产生具有较大角度散射的冲击角。
    • 5. 发明授权
    • Apparatus and use of the apparatus for the determination of the density of a plasma
    • 用于确定等离子体密度的装置和用途
    • US07878045B2
    • 2011-02-01
    • US12294322
    • 2007-03-23
    • Ralf-Peter Brinkmann
    • Ralf-Peter Brinkmann
    • G01N9/32
    • H05H1/0037
    • Device for determining the density of a plasma, with of a probe (1) which can be immersed into the plasma, with a probe head (2) in form of a three-axis ellipsoid, and a handle (3) connected to the probe head (2), wherein the probe head (2) has a sheath (4) and a probe core (5, 5a) surrounded by the sheath (4), wherein the surface (8) of the probe core (5, 5a) has electrode areas (9, 10) of opposite polarity which are insulated from each other. The probe core consists of electrodes (6, 7), to which a signal is applied. The absorption of that signal is measured and evaluated as a function of the frequency. Based on a multipole expansion, a mathematical model is constructed with which the absorption spectrum of the probe can be unambiguously evaluated. For a particular design of the probe, the response can be restricted to a single resonance, from which the electron density of the plasma (to be inferred from the resonance frequency) can be found by an unambiguous evaluation algorithm.
    • 用于通过具有三轴椭圆形式的探针头(2)和可连接到探针的手柄(3),用可以浸入等离子体的探针(1)来确定等离子体的密度的装置 头部(2),其中所述探针头(2)具有护套(4)和由所述护套(4)围绕的探针芯部(5,5a),其中所述探针芯部(5,5a)的所述表面(8) 具有彼此绝缘的相反极性的电极区域(9,10)。 探针芯由施加信号的电极(6,7)组成。 测量和评估该信号的吸收作为频率的函数。 基于多极膨胀,构建了可以明确评估探针的吸收光谱的数学模型。 对于探针的特定设计,响应可以限于单个共振,通过明确的评估算法可以从该谐振中发现等离子体的电子密度(从谐振频率推断)。
    • 7. 发明申请
    • METHOD AND DEVICE FOR PLASMA TREATMENT OF A FLAT SUBSTRATE
    • 用于等离子体处理平板基板的方法和装置
    • US20120097641A1
    • 2012-04-26
    • US13127497
    • 2009-11-04
    • Rudolf BeckmannMichael GeislerArndt ZeunerMarks FiedlerGunter GraboschAndreas PflugUwe CzarnetzkiRalf-Peter BrinkmannMichael Siemers
    • Rudolf BeckmannMichael GeislerArndt ZeunerMarks FiedlerGunter GraboschAndreas PflugUwe CzarnetzkiRalf-Peter BrinkmannMichael Siemers
    • B44C1/22C23C16/50
    • H01J37/32165H01J37/32091
    • Method and device for the plasma treatment of a substrate in a plasma device, wherein—the substrate (110) is arranged between an electrode (112) and a counter-electrode (108) having a distance d between a surface area of the substrate to be treated and the electrode, —a capacitively coupled plasma discharge is excited, forming a DC self-bias between the electrode (112) and the counter-electrode (108), —in an area of the plasma discharge between the surface area to be treated and the electrode having a quasineutral plasma bulk (114), a quantity of at least one activatable gas species, to which a surface area of the substrate to be treated is subjected, is present —it is provided that a plasma discharge is excited, —wherein the distance d has a value comparable to s=se+sg, where se denotes a thickness of a plasma boundary layer (119) in front of the electrode, and sg denotes a thickness of a plasma boundary layer (118) in front of the substrate surface to be treated or —wherein the quasineutral plasma bulk (114) between the surface area to be treated and the electrode has a linear extension dp, where dp
    • 用于等离子体装置中的基板的等离子体处理的方法和装置,其中 - 所述基板(110)布置在电极(112)和相对电极(108)之间,所述电极与对电极(108)之间的距离为d, 并且电极 - 电容耦合等离子体放电被激发,在电极(112)和对电极(108)之间形成DC自偏压,在等离子体放电的面积为 存在电极,其具有准中等离子体体积(114),一定量的待处理衬底的表面积经受的至少一种可活化气体种类,其条件是等离子体放电被激发, - 其中距离d具有与s = se + sg相当的值,其中se表示电极前面的等离子体边界层(119)的厚度,sg表示前面的等离子体边界层(118)的厚度 的待处理基材表面或其中 在待处理表面积和电极之间的准中性等离子体体积(114)中具有线性延伸dp,其中dp <1dd,dp
    • 8. 发明申请
    • Apparatus and Use of the Apparatus for the Determination of the Density of a Plasma
    • 用于测定等离子体密度的装置和用途
    • US20090133471A1
    • 2009-05-28
    • US12294322
    • 2007-03-23
    • Ralf-Peter Brinkmann
    • Ralf-Peter Brinkmann
    • G01N9/00
    • H05H1/0037
    • Device for determining the density of a plasma, with of a probe (1) which can be immersed into the plasma, with a probe head (2) in form of a three-axis ellipsoid, and a handle (3) connected to the probe head (2), wherein the probe head (2) has a sheath (4) and a probe core (5, 5a) surrounded by the sheath (4), wherein the surface (8) of the probe core (5, 5a) has electrode areas (9, 10) of opposite polarity which are insulated from each other. The probe core consists of electrodes (6, 7), to which a signal is applied. The absorption of that signal is measured and evaluated as a function of the frequency. Based on a multipole expansion, a mathematical model is constructed with which the absorption spectrum of the probe can be unambiguously evaluated. For a particular design of the probe, the response can be restricted to a single resonance, from which the electron density of the plasma (to be inferred from the resonance frequency) can be found by an unambiguous evaluation algorithm.
    • 用于通过具有三轴椭圆形式的探针头(2)和可连接到探针的手柄(3),用可以浸入等离子体的探针(1)来确定等离子体的密度的装置 头部(2),其中所述探头(2)具有护套(4)和由所述护套(4)围绕的探针芯部(5,5a),其中所述探针芯部(5,5a)的所述表面(8) 具有彼此绝缘的相反极性的电极区域(9,10)。 探针芯由施加信号的电极(6,7)组成。 测量和评估该信号的吸收作为频率的函数。 基于多极膨胀,构建了可以明确评估探针的吸收光谱的数学模型。 对于探针的特定设计,响应可以限于单个共振,通过明确的评估算法可以从该谐振中发现等离子体的电子密度(从谐振频率推断)。