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    • 2. 发明申请
    • SYSTEM AND METHOD FOR MULTI-SCANNER X-RAY INSPECTION
    • 多扫描X射线检测系统与方法
    • US20140376686A1
    • 2014-12-25
    • US13985992
    • 2012-02-16
    • Pia DreiseitelMatthias MuensterSebastian Koenig
    • Pia DreiseitelMatthias MuensterSebastian Koenig
    • G06T7/00G06T3/00G01N23/04
    • G06T3/0056G01N23/046G01V5/005G06T7/97G06T2207/30112
    • A method of analyzing a target item utilizing multiple scanners is disclosed. The method can include providing an item comprising a material. The method can further include acquiring a first set of scan data associated with the item using a first scanner, and acquiring a second set of scan data associated with the item using a second scanner. The method can further include generating a first set of transform data from the first set of scan data, analyzing the first set of transform data to identify a subset of the first set of transform data associated with a first region, and analyzing the second set of scan data to identify a subset of the second set of scan data associated with a second region. The method can also include generating a measure that at least a portion of scan data is consistent with a presence of a candidate material in the item, where the portion of scan data is selected from at least one of the set consisting of: the subset of the first set of transform data and the subset of the second set of scan data.
    • 公开了一种利用多台扫描仪分析目标物品的方法。 该方法可以包括提供包括材料的物品。 该方法还可以包括使用第一扫描仪来获取与物品相关联的第一组扫描数据,以及使用第二扫描仪获取与物品相关联的第二组扫描数据。 该方法还可以包括从第一组扫描数据生成第一组变换数据,分析第一组变换数据以识别与第一区域相关联的第一组变换数据的子集,并分析第二组变换数据 扫描数据以识别与第二区域相关联的第二组扫描数据的子集。 该方法还可以包括生成测量,其中至少一部分扫描数据与项目中候选材料的存在一致,其中扫描数据的部分从以下组中的至少一个中选择: 第一组变换数据和第二组扫描数据的子集。
    • 4. 发明申请
    • IMAGE RECONSTRUCTION BASED ON PARAMETRIC MODELS
    • 基于参数模型的图像重建
    • US20140222385A1
    • 2014-08-07
    • US14000907
    • 2012-02-23
    • Matthias MuensterPia Dreiseitel
    • Matthias MuensterPia Dreiseitel
    • G06F17/50
    • G06F17/50A61B6/0471A61B6/4014A61B6/482A61B6/5205F04C2270/041G01N23/046G01N2223/401G01N2223/419G06T11/006G06T17/30
    • Systems and methods for modeling are provided. The method can include acquiring scan data associated with a plurality of x-ray projections of an item. The method can further include determining at least one closed boundary curve associated with the item. For example, the method can determine a first maximum area based on the scan data and determine at least one edge of the first maximum area. The method can further generate a model of the item using the closed boundary curve and a first material specific parameter for a material within the closed boundary curve. The method can utilize the model to generate computed scan data, compare the computed scan data to the scan data, and determine a goodness of fit. The method can further adjust the model of the item by altering at least one of the closed boundary curve and the material specific parameter.
    • 提供了建模的系统和方法。 该方法可以包括获取与项目的多个x射线投影相关联的扫描数据。 该方法还可以包括确定与该项目相关联的至少一个闭合边界曲线。 例如,该方法可以基于扫描数据确定第一最大区域并且确定第一最大区域的至少一个边缘。 该方法可以使用闭合边界曲线和闭合边界曲线内的材料的第一材料特定参数来进一步生成物品的模型。 该方法可以利用该模型生成计算的扫描数据,将计算的扫描数据与扫描数据进行比较,并确定拟合优度。 该方法可以通过改变闭合边界曲线和材料特定参数中的至少一个来进一步调整物品的模型。