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    • 1. 发明授权
    • Method for the testing of electronic components
    • 电子元器件测试方法
    • US06813740B1
    • 2004-11-02
    • US09692290
    • 2000-10-19
    • Philippe Lejeune
    • Philippe Lejeune
    • G01R3128
    • G01R31/318335G01R31/318328G11C16/04G11C29/50
    • Testing of an electronic component (1) in which a signal (S1) is sent to a cell (3) of the component, and the output signal (S2) of this component is studied so as to define whether the component is acceptable or not. If the component is acceptable the test is performed again by sending a signal (S1′) similar to the first signal but with a shorter duration (T2). A search is then made for an output signal (S2′) to be compared with a compressed expected pattern. If this test, which is performed more rapidly, is valid, it can be planned, if necessary, to use this faster input signal on following components to be tested.
    • 研究了向组件的单元(3)发送信号(S1)的电子部件(1)和该部件的输出信号(S2)的测试,以便确定部件是否可接受 。 如果组件是可接受的,则通过发送与第一信号相似但具有较短持续时间(T2)的信号(S1')来再次执行测试。 然后对输出信号(S2')进行搜索以与压缩的预期模式进行比较。 如果这种更快速地执行的测试是有效的,那么如果需要,可以计划在以下要测试的组件上使用更快的输入信号。
    • 2. 发明授权
    • Method for the testing of electronic components
    • 电子元器件测试方法
    • US06426643B1
    • 2002-07-30
    • US09608812
    • 2000-06-30
    • Philippe Lejeune
    • Philippe Lejeune
    • G01R3126
    • G01R31/2831G01R31/01G01R31/2834G01R31/2846
    • A method for the testing of electronic components comprises an interface driving a test device. The interface can be parameterized according to the test. The test method provides for a first and only learning phase during which a measurement date that is the earliest possible date is determined. This method thereafter comprises the performance of adjusting phases to define adjusted measurement dates, used during an application phase. The adjusting phases are short, fast and precise, and are used to optimize the total performance time of a test and, simultaneously, also the profitability of production. Indeed, the measurement dates are determined with respect to the totalized populations.
    • 一种用于测试电子部件的方法包括驱动测试装置的接口。 接口可以根据测试参数化。 测试方法提供了第一个也是唯一的学习阶段,在该阶段确定最早可能的日期的测量日期。 此后的方法包括执行调整阶段以定义在应用阶段期间使用的调整的测量日期。 调整阶段简短,快速,精确,用于优化测试的总体性能时间,同时也用于生产的盈利能力。 事实上,测量日期是根据总人口确定的。
    • 4. 发明授权
    • Bell-shaped protection system for a device for treating electron-beam containers
    • 用于处理电子束容器的设备的钟形保护系统
    • US08497488B2
    • 2013-07-30
    • US13519177
    • 2010-12-27
    • Philippe LejeunePhilippe Macquet
    • Philippe LejeunePhilippe Macquet
    • H01J37/20
    • H01J37/20A61L2/087A61L2/24A61L2202/23B65B55/08B67C7/0073
    • A treatment device includes one or more treatment stations each including an electron-beam emitter and supporting device for supporting a container beneath the emitter, the emitter being capable of emitting an electron beam passing through the upper opening of a container supported by the supporting means, so as to sterilize the container, and a protection system for stopping the radiation emitted by the emitter(s). The protection system includes an upper portion connected to the emitter, lower portion connected to the supporting device and a moving device capable of moving the upper portion relative to the lower portion, between a retracted position and at least one operative position in which the portions from a protective enclosure in which the emitter and container are positioned.
    • 处理装置包括一个或多个处理站,每个处理站包括电子束发射器和用于支撑发射器下方的容器的支撑装置,发射器能够发射通过由支撑装置支撑的容器的上部开口的电子束, 以便对容器进行消毒,以及用于停止由发射器发射的辐射的保护系统。 保护系统包括连接到发射器的上部分,连接到支撑装置的下部分和能够相对于下部部分移动上部的移动装置,在缩回位置和至少一个操作位置之间, 发射器和容器位于其中的保护外壳。
    • 5. 发明授权
    • System for protecting a container treatment device by means of an electron beam
    • 用于通过电子束保护容器处理装置的系统
    • US09265848B2
    • 2016-02-23
    • US13513655
    • 2010-12-03
    • Philippe LejeunePhilippe Macquet
    • Philippe LejeunePhilippe Macquet
    • A61L2/00A61L2/08B65B55/08
    • A61L2/087A61L2202/15A61L2202/23B65B55/08
    • A treatment device for sterilizing containers by an electron beam includes a carousel that comprises a rotary holding plate supporting a plurality of treatment stations, each station including a sterilization device comprising an electron beam emitter, and a holding device for holding a container under the emitter. The treatment device includes a protection system for stopping the rays emitted by the emitters, the protection system comprises an annular segment-shaped, open stationary channel that is mounted in a stationary manner under the holding plate and forms, with the latter, a protective chamber in which the holding device supporting the containers moves, the channel having an open upstream end, for the inlet of the containers to be treated into the protective chamber, and an open downstream end, for the outlet of the treated containers from the chamber.
    • 用于通过电子束对容器进行杀菌的处理装置包括:转盘,其包括支撑多个处理站的旋转保持板,每个站包括包括电子束发射器的灭菌装置,以及用于将容器保持在发射器下方的保持装置。 治疗装置包括用于停止由发射器发射的射线的保护系统,保护系统包括环形段状的开放静止通道,其以固定的方式安装在保持板下方,并与后者形成保护室 其中支撑容器的保持装置移动,通道具有开放的上游端,用于待处理的容器的入口进入保护室,以及开放的下游端,用于从腔室出来处理的容器。
    • 9. 发明授权
    • Method for testing electronic components
    • 电子元件测试方法
    • US06269326B1
    • 2001-07-31
    • US09194029
    • 1998-11-16
    • Philippe Lejeune
    • Philippe Lejeune
    • G06F1730
    • G01R31/30G01R31/2834G01R35/04
    • A device (1) has a processor (13) capable of controlling test equipment (2) to carry out repeatedly at least some of its steps, each time reducing the duration of at least one of the steps until satisfying a final criterion taking into account the distribution of the electric variables measured by the equipment for each reduced duration value, and to set a new duration value at most equal to its initial value, for which the measured electric variable distribution satisfies one selected dispersion condition. The device has a function generator (14) capable of providing a function applicable to at least one of the terms of a comparison executed during one of the steps, so that the function operates on a measurement executed after the new duration.
    • 设备(1)具有能够控制测试设备(2)的处理器(13),以重复执行其至少一些步骤,每次减少至少一个步骤的持续时间,直到满足最终标准 对于每个减少的持续时间值,由设备测量的电变量的分布,并且设置最大等于其初始值的新持续时间值,其测量的电变量分布满足一个选定的色散条件。 该装置具有功能发生器(14),该功能发生器能够提供适用于在一个步骤中执行的比较中的至少一个比较项的功能,使得该功能对新持续时间之后执行的测量进行操作。
    • 10. 发明申请
    • SYSTEM FOR PROTECTING A CONTAINER TREATMENT DEVICE BY MEANS OF AN ELECTRON BEAM
    • 通过电子束保护集装箱处理装置的系统
    • US20130001434A1
    • 2013-01-03
    • US13513655
    • 2010-12-03
    • Philippe LejeunePhilippe Macquet
    • Philippe LejeunePhilippe Macquet
    • A61L2/08
    • A61L2/087A61L2202/15A61L2202/23B65B55/08
    • A treatment device for sterilizing containers by an electron beam includes a carousel that comprises a rotary holding plate supporting a plurality of treatment stations, each station including a sterilization device comprising an electron beam emitter, and a holding device for holding a container under the emitter. The treatment device includes a protection system for stopping the rays emitted by the emitters, the protection system comprises an annular segment-shaped, open stationary channel that is mounted in a stationary manner under the holding plate and forms, with the latter, a protective chamber in which the holding device supporting the containers moves, the channel having an open upstream end, for the inlet of the containers to be treated into the protective chamber, and an open downstream end, for the outlet of the treated containers from the chamber.
    • 用于通过电子束对容器进行杀菌的处理装置包括:转盘,其包括支撑多个处理站的旋转保持板,每个站包括包括电子束发射器的灭菌装置,以及用于将容器保持在发射器下方的保持装置。 治疗装置包括用于停止由发射器发射的射线的保护系统,保护系统包括环形段状的开放静止通道,其以固定的方式安装在保持板下方,并与后者形成保护室 其中支撑容器的保持装置移动,通道具有开放的上游端,用于待处理的容器的入口进入保护室,以及开放的下游端,用于从腔室出来处理的容器。