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1. 发明授权

US07298536B2 Fiber optic wafer probe 失效
标题翻译：光纤晶圆探头
公开(公告)号：US07298536B2
公开(公告)日：2007-11-20
申请号：US11221676
申请日：2005-09-07
申请人： Peter R. McCann , John T. Martin
发明人： Peter R. McCann , John T. Martin
IPC分类号： G02B6/06
CPC分类号： G02B6/4292 , G02B6/3604 , G02B6/3858
摘要： A fiber optic wafer probe that includes a fibre optic cable for approaching a device under test.
摘要翻译：一种光纤晶片探针，其包括用于接近待测器件的光纤电缆。

2. 发明授权

US07268533B2 Optical testing device 有权
公开(公告)号：US07268533B2
公开(公告)日：2007-09-11
申请号：US10912789
申请日：2004-08-06
申请人： Daniel L. Harris , Peter R. McCann
发明人： Daniel L. Harris , Peter R. McCann
IPC分类号： G01R31/02 , B25B11/00
CPC分类号： G01M11/00 , G01R1/0408 , G01R31/2831 , G01R31/2887 , G01R31/311
摘要： A chuck adapted to test electrical and/or optical components on a device-under-test (DUT).

3. 发明授权

US06970634B2 Fiber optic wafer probe 失效
标题翻译：光纤晶圆探头
公开(公告)号：US06970634B2
公开(公告)日：2005-11-29
申请号：US09849152
申请日：2001-05-04
申请人： Peter R. McCann , John T. Martin
发明人： Peter R. McCann , John T. Martin
IPC分类号： G01R1/06 , G01R31/302 , G02B6/36 , G02B6/38 , G02B6/42 , H01L21/66 , G02B6/00
CPC分类号： G02B6/4292 , G02B6/3604 , G02B6/3858
摘要： A fiber optic wafer probe that includes a fiber optic cable for approaching a device under test.
摘要翻译：一种光纤晶片探针，其包括用于接近待测器件的光纤电缆。

4. 发明授权

US06885197B2 Indexing rotatable chuck for a probe station 失效
标题翻译：用于探针台的可转动卡盘分度
公开(公告)号：US06885197B2
公开(公告)日：2005-04-26
申请号：US10856279
申请日：2004-05-28
申请人： Daniel L. Harris , Peter R. McCann
发明人： Daniel L. Harris , Peter R. McCann
IPC分类号： G01R31/26 , G01R1/04 , G01R31/28 , H01L21/00 , H01L21/66 , H01L21/68 , H01L21/683 , H01H31/02 , G01R31/02
CPC分类号： H01L21/6835 , G01R1/0408 , G01R31/2831 , H01L21/67271
摘要： A rotary chuck with indexed rotation promotes rapid rotation of a device under test and increases the productivity of a probe station on which the device is being tested. A device mounting member of a rotatable chuck is supported for rotation on a first surface of a base until a vacuum is applied drawing the device mounting member into contact with a second surface of the base and constraining the device mounting member against rotation.
摘要翻译：具有分度旋转的旋转卡盘促进了被测器件的快速旋转，并且提高了测试装置上的探针台的生产率。可旋转卡盘的装置安装构件被支撑以在基座的第一表面上旋转，直到施加真空，使装置安装构件与基座的第二表面接触并且限制装置安装构件的旋转。

5. 发明授权

US06771090B2 Indexing rotatable chuck for a probe station 失效
标题翻译：用于探针台的可转动卡盘分度
公开(公告)号：US06771090B2
公开(公告)日：2004-08-03
申请号：US10179796
申请日：2002-06-24
申请人： Daniel L. Harris , Peter R. McCann
发明人： Daniel L. Harris , Peter R. McCann
IPC分类号： G01R3126
CPC分类号： H01L21/6835 , G01R1/0408 , G01R31/2831 , H01L21/67271
摘要： The arrangement of test points on an integrated circuit (IC) undergoing testing in a probe station often requires rotation of the IC or the probes when performing a series of tests. A chuck with indexed rotation promotes rapid rotation of the device under test to a new test position and increases the productivity of the probe station. The device under test is mounted on a device mounting member that is affixed to a shaft rotationally mounted in a base. A resilient seal supports the device mounting member and forms a sealed chamber over a substantial part of the area of the device mounting member. Applying vacuum or pressure to the sealed chamber urges the device mounting member and base toward contact. The support provided by the resilient seal over substantial portion of device mounting member's diameter promotes stability and consistent planarity of the device mounting member without regard to the orientation of the shaft to device mounting member.
摘要翻译：在进行测试的集成电路（IC）上的测试点的布置通常需要在进行一系列测试时旋转IC或探头。具有分度旋转的卡盘促进被测设备的快速旋转到新的测试位置，并且提高探测台的生产率。被测装置安装在固定在旋转安装在基座中的轴上的装置安装构件上。弹性密封件支撑装置安装构件并且在装置安装构件的该区域的大部分上形成密封室。对密封室施加真空或压力促使装置安装构件和底座接触。在装置安装构件的直径的大部分上由弹性密封件提供的支撑促进了装置安装构件的稳定性和一致的平面度，而不考虑轴与装置安装构件的取向。

6. 发明授权

US06483336B1 Indexing rotatable chuck for a probe station 失效
标题翻译：用于探针台的可转动卡盘分度
公开(公告)号：US06483336B1
公开(公告)日：2002-11-19
申请号：US09564591
申请日：2000-05-03
申请人： Daniel L. Harris , Peter R. McCann
发明人： Daniel L. Harris , Peter R. McCann
IPC分类号： G01R3126
CPC分类号： H01L21/6835 , G01R1/0408 , G01R31/2831 , H01L21/67271
摘要： The arrangement of test points on an integrated circuit (IC) undergoing testing in a probe station often requires rotation of the IC or the probes when performing a series of tests. A chuck with indexed rotation promotes rapid rotation of the device under test to a new test position and increases the productivity of the probe station. The device under test is mounted on a device mounting member that is affixed to a shaft rotationally mounted in a base. A resilient seal supports the device mounting member and forms a sealed chamber over a substantial part of the area of the device mounting member. Applying vacuum or pressure to the sealed chamber urges the device mounting member and base toward contact. The support provided by the resilient seal over substantial portion of device mounting member's diameter promotes stability and consistent planarity of the device mounting member without regard to the orientation of the shaft to device mounting member.
摘要翻译：在进行测试的集成电路（IC）上的测试点的布置通常需要在进行一系列测试时旋转IC或探头。具有分度旋转的卡盘促进被测设备的快速旋转到新的测试位置，并且提高探测台的生产率。被测装置安装在固定在旋转安装在基座中的轴上的装置安装构件上。弹性密封件支撑装置安装构件并且在装置安装构件的该区域的大部分上形成密封室。对密封室施加真空或压力促使装置安装构件和底座接触。在装置安装构件的直径的大部分上由弹性密封件提供的支撑促进了装置安装构件的稳定性和一致的平面度，而不考虑轴与装置安装构件的取向。

7. 发明授权

US06836135B2 Optical testing device 失效
标题翻译：光学测试装置
公开(公告)号：US06836135B2
公开(公告)日：2004-12-28
申请号：US10214888
申请日：2002-08-07
申请人： Daniel L. Harris , Peter R. McCann
发明人： Daniel L. Harris , Peter R. McCann
IPC分类号： G01R3102
CPC分类号： G01M11/00 , G01R1/0408 , G01R31/2831 , G01R31/2887 , G01R31/311
摘要： A chuck adapted to test electrical and/or optical components on a device-under-test (DUT).
摘要翻译：卡盘，用于测试被测设备（DUT）上的电气和/或光学部件。

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