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    • 1. 发明授权
    • Measuring method and device for determining transmission and/or reflection properties
    • 用于确定透射和/或反射特性的测量方法和装置
    • US08970830B2
    • 2015-03-03
    • US13492306
    • 2012-06-08
    • Joerg MargrafPeter Lamparter
    • Joerg MargrafPeter Lamparter
    • G01N21/00G01N21/89G01N21/47G01N21/896
    • G01N21/8901G01N21/474G01N21/896G01N2201/065
    • The disclosure relates to optical measuring methods and apparatus for determining the transmission and/or reflection properties of translucent objects with utility for process monitoring and quality inspection in the manufacture of surface-coated substrates. According to the disclosure the transmission and reflection properties are determined in such a way that sequentially: a first large surface of the object is illuminated by a first illuminating device, with a photodetector measuring the total transmittance (Ttotal), a second, large surface of the object, lying opposite and parallel to the first one, is illuminated by a second illuminating device, with a photodetector measuring the diffuse transmittance (Tdiffuse), and optionally the first large surface of the object is illuminated by the first illuminating device, with the photodetector measuring the reflectance, and/or the second large surface of the object is illuminated by the second illuminating device, with the photodetector measuring the reflectance.
    • 本公开涉及用于确定半透明物体的透射和/或反射特性的光学测量方法和装置,其用于在表面涂覆的基底的制造中用于过程监测和质量检查。 根据本公开,透射和反射特性以如下方式确定:顺序地:物体的第一大表面由第一照明装置照射,光电检测器测量总透射率(T total),第二大表面 与第一照明装置相对并平行的物体由第二照明装置照射,光电检测器测量漫透射率(Tdiffuse),并且可选地,物体的第一大表面被第一照明装置照射, 测量反射率的光电检测器和/或物体的第二大表面由第二照明装置照射,光电检测器测量反射率。
    • 2. 发明申请
    • MEASURING METHOD AND DEVICE FOR DETERMINING TRANSMISSION AND/OR REFLECTION PROPERTIES
    • 用于确定传输和/或反射特性的测量方法和装置
    • US20120314208A1
    • 2012-12-13
    • US13492306
    • 2012-06-08
    • Joerg MARGRAFPeter LAMPARTER
    • Joerg MARGRAFPeter LAMPARTER
    • G01N21/59G01N21/55
    • G01N21/8901G01N21/474G01N21/896G01N2201/065
    • The disclosure relates to optical measuring methods and apparatus for determining the transmission and/or reflection properties of translucent objects with utility for process monitoring and quality inspection in the manufacture of surface-coated substrates. According to the disclosure the transmission and reflection properties are determined in such a way that sequentially: a first large surface of the object is illuminated by a first illuminating device, with a photodetector measuring the total transmittance (Ttotal), a second, large surface of the object, lying opposite and parallel to the first one, is illuminated by a second illuminating device, with a photodetector measuring the diffuse transmittance (Tdiffuse), and optionally the first large surface of the object is illuminated by the first illuminating device, with the photodetector measuring the reflectance, and/or the second large surface of the object is illuminated by the second illuminating device, with the photodetector measuring the reflectance.
    • 本公开涉及用于确定半透明物体的透射和/或反射特性的光学测量方法和装置,其用于在表面涂覆的基底的制造中用于过程监测和质量检查。 根据本公开,透射和反射特性以如下方式确定:顺序地:物体的第一大表面由第一照明装置照射,光电检测器测量总透射率(T total),第二大表面 与第一照明装置相对并平行的物体由第二照明装置照射,光电检测器测量漫透射率(Tdiffuse),并且可选地,物体的第一大表面被第一照明装置照射, 测量反射率的光电检测器和/或物体的第二大表面由第二照明装置照射,光电检测器测量反射率。