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1. 发明授权

US08214170B2 Test pattern compression 失效
标题翻译：测试模式压缩
公开(公告)号：US08214170B2
公开(公告)日：2012-07-03
申请号：US12354063
申请日：2009-01-15
申请人： Patrick R. Crosby , Daniel W. Cervantes , Johnny J. LeBlanc , Samuel I. Ward
发明人： Patrick R. Crosby , Daniel W. Cervantes , Johnny J. LeBlanc , Samuel I. Ward
IPC分类号： G01R31/14
CPC分类号： G01R31/318547
摘要： A method for test pattern compression generates a first test pattern comprising a plurality of bits. The method identifies bits comprising a don't-care bit value in the first test pattern and replaces the identified bit values with random bit values, to generate a second test pattern. The method determines a fault coverage level of the second test pattern. In the event the determined fault coverage level of the second test pattern exceeds a predetermined individual test pattern fault coverage level, for at least one bit position in the second test pattern corresponding to a replaced identified bit value and detecting at least one fault, the method exchanges the don't care value in the bit position in the first test pattern with the bit value in the corresponding bit position in the second test pattern. The method merges subsequent test patterns that increase fault coverage with the second test pattern.
摘要翻译：测试图案压缩的方法产生包括多个位的第一测试图案。该方法识别在第一测试模式中包含不关心位值的位，并且用随机位值替换所识别的位值，以产生第二测试模式。该方法确定第二测试模式的故障覆盖水平。在第二测试模式的所确定的故障覆盖水平超过预定的单独测试模式故障覆盖水平的情况下，对于与替换的所识别的位值相对应的第二测试模式中的至少一个位位置并检测至少一个故障，该方法在第一测试模式中的位位置交换不关心值的第二测试模式中相应位位置的位值。该方法将随后的测试模式合并，以增加第二个测试模式的故障覆盖。

2. 发明申请

US20100179784A1 TEST PATTERN COMPRESSION 失效
标题翻译：测试图案压缩
公开(公告)号：US20100179784A1
公开(公告)日：2010-07-15
申请号：US12354063
申请日：2009-01-15
申请人： Patrick R. Crosby , Daniel W. Cervantes , Johnny J. LeBlanc , Samuel I. Ward
发明人： Patrick R. Crosby , Daniel W. Cervantes , Johnny J. LeBlanc , Samuel I. Ward
IPC分类号： G01R31/00 , G01R31/02
CPC分类号： G01R31/318547
摘要： A method for test pattern compression generates a first test pattern comprising a plurality of bits. The method identifies bits comprising a don't-care bit value in the first test pattern and replaces the identified bit values with random bit values, to generate a second test pattern. The method determines a fault coverage level of the second test pattern. In the event the determined fault coverage level of the second test pattern exceeds a predetermined individual test pattern fault coverage level, for at least one bit position in the second test pattern corresponding to a replaced identified bit value and detecting at least one fault, the method exchanges the don't care value in the bit position in the first test pattern with the bit value in the corresponding bit position in the second test pattern. The method merges subsequent test patterns that increase fault coverage with the second test pattern.
摘要翻译：测试图案压缩的方法产生包括多个位的第一测试图案。该方法识别在第一测试模式中包含不关心位值的位，并且用随机位值替换所识别的位值，以产生第二测试模式。该方法确定第二测试模式的故障覆盖水平。在第二测试模式的所确定的故障覆盖水平超过预定的单独测试模式故障覆盖水平的情况下，对于与替换的所识别的位值相对应的第二测试模式中的至少一个位位置并检测至少一个故障，该方法在第一测试模式中的位位置交换不关心值的第二测试模式中相应位位置的位值。该方法将随后的测试模式合并，以增加第二个测试模式的故障覆盖。

3. 发明授权

US08006152B2 Scan chain fail diagnostics 有权
标题翻译：扫描链失败诊断
公开(公告)号：US08006152B2
公开(公告)日：2011-08-23
申请号：US12351950
申请日：2009-01-12
申请人： Samuel I. Ward , Patrick R. Crosby , William D. Ramsour , Bao G. Truong
发明人： Samuel I. Ward , Patrick R. Crosby , William D. Ramsour , Bao G. Truong
IPC分类号： G01R31/28
CPC分类号： G01R31/318566 , G01R31/318547
摘要： A method comprises generating a test pattern for a device under test (DUT), wherein the DUT comprises a plurality of scan chains coupled to a plurality of multiple input shift registers (MISRs). The plurality of faults detected by a first MISR and by a second MISR are identified. In the event the plurality of faults detected by the first MISR does not include any of the plurality of faults detected by the second MISR and the plurality of faults detected by the second MISR does not include any of the plurality of faults detected by the first MISR, the first MISR and the second MISR are coupled as an independent MISR pair. The test pattern is applied to the DUT to generate a scan chain output. The independent MISR pair captures the scan chain output to generate a test signature. The test signature is compared with a known good signature.
摘要翻译：一种方法包括产生被测器件（DUT）的测试图案，其中DUT包括耦合到多个多输入移位寄存器（MISR）的多个扫描链。识别由第一MISR和第二MISR检测到的多个故障。在由第一MISR检测到的多个故障不包括由第二MISR检测到的多个故障中的任何一个故障的情况下，由第二MISR检测到的多个故障不包括由第一MISR检测到的多个故障中的任何一个，第一MISR和第二MISR作为独立MISR对耦合。将测试模式应用于DUT以生成扫描链输出。独立的MISR对捕获扫描链输出以生成测试签名。将测试签名与已知的良好签名进行比较。

4. 发明申请

US20100180168A1 SCAN CHAIN FAIL DIAGNOSTICS 有权
标题翻译：扫描链失败诊断
公开(公告)号：US20100180168A1
公开(公告)日：2010-07-15
申请号：US12351950
申请日：2009-01-12
申请人： Samuel I. Ward , Patrick R. Crosby , William D. Ramsour , Bao G. Truong
发明人： Samuel I. Ward , Patrick R. Crosby , William D. Ramsour , Bao G. Truong
IPC分类号： G01R31/3177 , G06F11/25
CPC分类号： G01R31/318566 , G01R31/318547
摘要： A method comprises generating a test pattern for a device under test (DUT), wherein the DUT comprises a plurality of scan chains coupled to a plurality of multiple input shift registers (MISRs). The plurality of faults detected by a first MISR and by a second MISR are identified. In the event the plurality of faults detected by the first MISR does not include any of the plurality of faults detected by the second MISR and the plurality of faults detected by the second MISR does not include any of the plurality of faults detected by the first MISR, the first MISR and the second MISR are coupled as an independent MISR pair. The test pattern is applied to the DUT to generate a scan chain output. The independent MISR pair captures the scan chain output to generate a test signature. The test signature is compared with a known good signature.
摘要翻译：一种方法包括产生被测器件（DUT）的测试图案，其中DUT包括耦合到多个多输入移位寄存器（MISR）的多个扫描链。识别由第一MISR和第二MISR检测到的多个故障。在由第一MISR检测到的多个故障不包括由第二MISR检测到的多个故障中的任何一个故障的情况下，由第二MISR检测到的多个故障不包括由第一MISR检测到的多个故障中的任何一个，第一MISR和第二MISR作为独立MISR对耦合。将测试模式应用于DUT以生成扫描链输出。独立的MISR对捕获扫描链输出以生成测试签名。将测试签名与已知的良好签名进行比较。

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