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1. 发明授权

US08355641B2 Paper wrinkle sign monitoring device, paper wrinkle sign monitoring method, and computer readable medium 有权
标题翻译：纸皱纹标志监测装置，纸张皱纹标志监测方法和计算机可读介质
公开(公告)号：US08355641B2
公开(公告)日：2013-01-15
申请号：US12422510
申请日：2009-04-13
申请人： Koji Adachi , Kaoru Yasukawa , Shigehiro Furukawa , Norikazu Yamada , Koki Uwatoko , Tetsuichi Satonaga
发明人： Koji Adachi , Kaoru Yasukawa , Shigehiro Furukawa , Norikazu Yamada , Koki Uwatoko , Tetsuichi Satonaga
IPC分类号： G03G15/00 , G03G15/20
CPC分类号： G03G15/70 , G03G2215/00548
摘要： A paper wrinkle sign monitoring device includes: at least one timing detecting unit that is set on a transport path of a printing medium, and that detects transport timing of the printing medium; and a sign output unit that detects a sign of paper wrinkle generation in the transporting time of the printing medium based on the transport timing of the printing medium detected by the timing detecting unit, and that outputs the sign.
摘要翻译：纸张皱纹标志监视装置包括：至少一个定时检测单元，设置在打印介质的传送路径上，并检测打印介质的传送定时; 以及符号输出单元，其基于由定时检测单元检测到的打印介质的传送定时，检测打印介质的传送时间中的纸张皱纹生成的符号，并且输出该符号。

2. 发明申请

US20100161546A1 FAILURE DIAGNOSIS SYSTEM, A FAILURE DIAGNOSIS DEVICE, AN INFORMATION UPDATE DEVICE, AND A COMPUTER-READABLE MEDIUM 有权
标题翻译：故障诊断系统，故障诊断设备，信息更新设备和计算机可读介质
公开(公告)号：US20100161546A1
公开(公告)日：2010-06-24
申请号：US12549112
申请日：2009-08-27
申请人： Norikazu YAMADA , Koji ADACHI , Kaoru YASUKAWA , Shigehiro FURUKAWA , Koki UWATOKO , Tetuichi SATONAGA
发明人： Norikazu YAMADA , Koji ADACHI , Kaoru YASUKAWA , Shigehiro FURUKAWA , Koki UWATOKO , Tetuichi SATONAGA
IPC分类号： G06N5/02
CPC分类号： G06N5/04 , G06F11/008
摘要： According to an aspect of the present invention, there is provided a failure diagnosis system including: a causal relationship information storage unit configured to store causal relationship information representing a causal relationship between events regarding a diagnosis-target apparatus, the causal relationship information including: common causal relationship information that is commonly used in a plurality of types of failure diagnosis regarding the diagnosis-target apparatus; and specific causal relationship information that is used in each specific type of failure diagnosis among the plurality of types of failure diagnosis; and a diagnosis execution unit configured to selectively execute the plural types of failure diagnosis by using a combined causal relationship information that is a combination of the common causal relationship information and a piece of the specific causal relationship information corresponding to a diagnosis-target type of failure diagnosis.
摘要翻译：根据本发明的一个方面，提供一种故障诊断系统，包括：因果关系信息存储单元，被配置为存储表示诊断对象装置的事件之间的因果关系的因果关系信息，所述因果关系信息包括：共同在关于诊断对象装置的多种故障诊断中通常使用的因果关系信息; 以及在各种故障诊断中的每种特定类型的故障诊断中使用的具体因果关系信息; 以及诊断执行单元，被配置为通过使用作为所述共同因果关系信息和与诊断对象类型的故障相对应的特定因果关系信息的组合的组合因果关系信息来选择性地执行所述多种类型的故障诊断诊断。

3. 发明申请

US20100072172A1 SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD 审中-公开
标题翻译：基板处理装置和基板处理方法
公开(公告)号：US20100072172A1
公开(公告)日：2010-03-25
申请号：US12562137
申请日：2009-09-18
申请人： Akio Ui , Hisataka Hayashi , Takeshi Kaminatsui , Shinji Himori , Norikazu Yamada , Takeshi Ohse , Jun Abe
发明人： Akio Ui , Hisataka Hayashi , Takeshi Kaminatsui , Shinji Himori , Norikazu Yamada , Takeshi Ohse , Jun Abe
IPC分类号： H01L21/3065 , C23F1/02
CPC分类号： H01L21/67069 , H01J37/32009 , H01J37/32027 , H01J37/32045 , H01J37/32091 , H01J37/321 , H01J37/32137 , H01J37/32532 , H01J2237/3341 , H01L21/3065 , H01L21/31116 , H01L21/31138 , H01L21/32136 , H01L21/67253 , H01L22/14 , H01L22/26
摘要： There are provided a substrate processing apparatus and a substrate processing method realizing an effective reduction of a voltage change of a substrate on an electrode to reduce the variation of incident energy of ions entering the substrate. The substrate processing apparatus includes: a first electrode holding a substrate on a main surface of the first electrode; a second electrode facing the first electrode; a RF power source applying to the first electrode a RF voltage whose frequency is equal to or higher than 40 MHz; and a pulse voltage applying unit applying to the first electrode a pulse voltage decreasing in accordance with a lapse of time, by superimposing the pulse voltage on the RF voltage.
摘要翻译：提供了一种基板处理装置和基板处理方法，其实现有效地降低电极上的基板的电压变化，以减少进入基板的离子的入射能量的变化。基板处理装置包括：第一电极，其在第一电极的主表面上保持基板; 面对所述第一电极的第二电极; RF电源，其向所述第一电极施加频率等于或高于40MHz的RF电压; 以及脉冲电压施加单元，通过将所述脉冲电压叠加在所述RF电压上，向所述第一电极施加按照经过的时间降低的脉冲电压。

4. 发明授权

US07489881B2 Failure prevention diagnosis support system, failure prevention diagnosis support method, and program product of failure prevention diagnosis support 有权
标题翻译：故障预防诊断支持系统，故障预防诊断支持方法和故障预防诊断支持的程序产品
公开(公告)号：US07489881B2
公开(公告)日：2009-02-10
申请号：US11646254
申请日：2006-12-28
申请人： Kaoru Yasukawa , Koji Adachi , Koki Uwatoko , Tetsuichi Satonaga , Norikazu Yamada , Eigo Nakagawa
发明人： Kaoru Yasukawa , Koji Adachi , Koki Uwatoko , Tetsuichi Satonaga , Norikazu Yamada , Eigo Nakagawa
IPC分类号： G03G15/00
CPC分类号： G03G15/70 , G03G15/5079 , G03G15/55 , G03G2215/00113
摘要： A failure prevention diagnosis support system includes: an acquiring portion that acquires internal information about an internal state of an image forming apparatus; a storage portion that stores one or a plurality of logistic regression models that define an estimate value of a regression coefficient through a logistic regression analysis using the internal information obtained when the image forming apparatus is in a failed state and in a normal state; and a controller that performs a control operation to select a logistic regression model from the one or the plurality of the logistic regression models stored in the storage portion in accordance with the image forming apparatus, and to calculate risk degrees as objective variables that are indicators of failure degrees in the image forming apparatus by assigning the internal information acquired by the acquiring portion or the value obtained from the internal information to the selected logistic regression model.
摘要翻译：故障预防诊断支持系统包括：获取部，其获取关于图像形成装置的内部状态的内部信息; 存储部，其存储通过使用在图像形成装置处于故障状态而获得的正常状态下获得的内部信息的逻辑回归分析来定义回归系数的估计值的一个或多个逻辑回归模型; 以及控制器，其执行控制操作以根据图像形成装置从存储在存储部分中的一个或多个逻辑回归模型中选择逻辑回归模型，并将风险度计算为作为通过将由获取部分获取的内部信息或从内部信息获得的值分配给所选择的逻辑回归模型，图像形成装置中的故障程度。

5. 发明授权

US07250781B2 Circuit board inspection device 失效
标题翻译：电路板检测装置
公开(公告)号：US07250781B2
公开(公告)日：2007-07-31
申请号：US10721461
申请日：2003-11-26
申请人： Eigo Nakagawa , Koji Adachi , Kaoru Yasukawa , Norikazu Yamada , Koki Uwatoko , Tetsuichi Satonaga
发明人： Eigo Nakagawa , Koji Adachi , Kaoru Yasukawa , Norikazu Yamada , Koki Uwatoko , Tetsuichi Satonaga
IPC分类号： G01R31/02
CPC分类号： G01R31/281 , G01R31/2818 , G01R31/315
摘要： A circuit board inspection device for inspecting the operation of a circuit board having a predetermined part or wire formed therein includes a supporting substrate disposed substantially in parallel with the parts mounting surface of the circuit board, and a signal change detection unit made of a coil or a capacitor disposed in a position of the supporting substrate corresponding to the part or wire of the circuit board, with the supporting substrate being disposed substantially in parallel with the circuit board.
摘要翻译：用于检查其中形成有预定部分或线的电路板的操作的电路板检查装置包括基本上平行于电路板的部件安装表面设置的支撑基板，以及信号变化检测单元，其由线圈或电容器，其设置在所述支撑基板的对应于所述电路板的所述部分或导线的位置，所述支撑基板大致平行于所述电路板。

6. 发明申请

US20070113692A1 Fault diagnosis apparatus 失效
公开(公告)号：US20070113692A1
公开(公告)日：2007-05-24
申请号：US11645673
申请日：2006-12-27
申请人： Kaoru Yasukawa , Koji Adachi , Eigo Nakagawa , Tetsuichi Satonaga , Norikazu Yamada , Koki Uwatoko
发明人： Kaoru Yasukawa , Koji Adachi , Eigo Nakagawa , Tetsuichi Satonaga , Norikazu Yamada , Koki Uwatoko
IPC分类号： G01N19/00
CPC分类号： B41J29/38
摘要： A fault diagnosis section activates a driving component alone, measures an operation state signal and a paper passage time, and stores feature values (Vm, σv, Tqs, σts) extracted as a determination reference in a storage medium. A paper passage fault determination section determines whether or not a fault has arisen on the basis of the paper passage time when an apparatus is under normal operating conditions. A diagnosis target block determination section determines an order to operate a detail fault diagnosis when it is determined that there is a plurality of diagnosis target blocks. When the driving component is activated alone under actual operation conditions, the operation state signal Vf is obtained, and an operation state fault determination section conducts diagnosis on whether or not a fault has arisen on the driving component and a state of the fault, and whether or not a fault has arisen on other power transmission components and a nature of the fault with reference to the feature values as the determination reference on the basis of a degree of deviation from a normal range.

7. 发明授权

US07174264B2 Fault diagnosis apparatus 失效
标题翻译：故障诊断装置
公开(公告)号：US07174264B2
公开(公告)日：2007-02-06
申请号：US10889055
申请日：2004-07-13
申请人： Kaoru Yasukawa , Koji Adachi , Eigo Nakagawa , Tetsuichi Satonaga , Norikazu Yamada , Koki Uwatoko
发明人： Kaoru Yasukawa , Koji Adachi , Eigo Nakagawa , Tetsuichi Satonaga , Norikazu Yamada , Koki Uwatoko
IPC分类号： G01M13/00
CPC分类号： B41J29/38
摘要： A fault diagnosis section activates a driving component alone, measures an operation state signal and a paper passage time, and stores feature values (Vm, ov, Tqs, ots) extracted as a determination reference in a storage medium. A paper passage fault determination section determines whether or not a fault has arisen on the basis of the paper passage time when an apparatus is under normal operating conditions. A diagnosis target block determination section determines an order to operate a detail fault diagnosis when it is determined that there is a plurality of diagnosis target blocks. When the driving component is activated alone under actual operation conditions, the operation state signal Vf is obtained, and an operation state fault determination section conducts diagnosis on whether or not a fault has arisen on the driving component and a state of the fault, and whether or not a fault has arisen on other power transmission components and a nature of fault with reference to the feature values as the determination reference on the basis of a degree of deviation from a normal range.
摘要翻译：故障诊断部分单独激活驱动部件，测量操作状态信号和纸张通过时间，并将作为确定基准提取的特征值（Vm，ov，Tqs，ots）存储在存储介质中。纸通过故障判定部根据设备处于正常工作条件下的纸张通过时间来判定故障是否发生。当确定存在多个诊断目标块时，诊断目标块确定部分确定操作细节故障诊断的顺序。当在实际操作条件下单独激活驱动部件时，获得操作状态信号Vf，并且操作状态故障确定部分是否对驱动部件发生故障和故障状态进行诊断，以及是否或者不是基于与正常范围的偏离程度参照作为确定参考的特征值而在其它动力传递部件和故障的性质上产生故障。

8. 发明授权

US06336209B1 Information processing system that processes portions of an application program using programmable logic circuits 有权
标题翻译：使用可编程逻辑电路处理应用程序的部分的信息处理系统
公开(公告)号：US06336209B1
公开(公告)日：2002-01-01
申请号：US09280681
申请日：1999-03-29
申请人： Yoshio Nishihara , Yoshihide Sato , Norikazu Yamada , Hiroyuki Miyake , Eigo Nakagawa
发明人： Yoshio Nishihara , Yoshihide Sato , Norikazu Yamada , Hiroyuki Miyake , Eigo Nakagawa
IPC分类号： G06F1750
CPC分类号： G06F17/5054 , G06F15/7867
摘要： By reusing circuit information designed in the past, the amount of computation for combining circuit information for layout and wirings is significantly reduced. A memory part stores a plurality of pieces of circuit information for forming circuits in programmable logic circuits. Each of pieces of the circuit information has an identifier of its own circuit information, and in the case where part or all of the circuit information is formed with other circuit information, has the identifiers of the other circuit information as reference identifiers, as circuit data thereof. An acquisition part passes specification circuit information from an application program to an editing part, obtains circuit information of a specified circuit, sent from the editing part, and forms the specified circuit in the programmable logic circuits according to the circuit information. The editing part generates circuit information of a circuit specified by specification information from the acquisition part from circuit information of the specified circuit and other circuit information indicated by reference identifiers, obtained from the memory part.
摘要翻译：通过重用以往设计的电路信息，用于组合用于布局和布线的电路信息的计算量显着降低。存储器部分存储用于在可编程逻辑电路中形成电路的多条电路信息。电路信息中的每一个具有其自己的电路信息的标识符，并且在使用其他电路信息形成电路信息的一部分或全部的情况下，将其他电路信息的标识符作为参考标识符，作为电路数据其中。获取部件将规定电路信息从应用程序传递到编辑部分，获得从编辑部分发送的指定电路的电路信息，并根据电路信息在可编程逻辑电路中形成指定的电路。编辑部分从存储部分获得的由指定电路的电路信息和由参考标识符指示的其他电路信息从获取部分指定的电路的电路信息生成。

9. 发明授权

US5164580A Electroluminescent light-source-incorporated image sensor 失效
标题翻译：电致发光光源并入图像传感器
公开(公告)号：US5164580A
公开(公告)日：1992-11-17
申请号：US708713
申请日：1991-05-31
申请人： Masao Funada , Norikazu Yamada
发明人： Masao Funada , Norikazu Yamada
IPC分类号： H04N1/028 , H01L27/146 , H01L31/12 , H04N1/031 , H04N1/04
CPC分类号： H04N1/0317 , H01L31/12 , H04N1/0313
摘要： A light-source-incorporated image sensor in which a light receiving element formed on an insulating substrate is confronted through a light transmission layer with an EL light emitting element formed on a transparent substrate. In the image sensor, the thickness of the transparent substrate is smaller than that of the light transmission layer, whereby the focal depth can be set to a value which is sufficient in practical use.
摘要翻译：其中形成在绝缘基板上的光接收元件通过透光层与形成在透明基板上的EL发光元件相面对的光源引入图像传感器。在图像传感器中，透明基板的厚度小于透光层的厚度，由此可以将焦深设定为在实际使用中足够的值。

10. 发明授权

US08568606B2 Substrate processing apparatus and substrate processing method using same 有权
标题翻译：基板处理装置及基板处理方法
公开(公告)号：US08568606B2
公开(公告)日：2013-10-29
申请号：US12750015
申请日：2010-03-30
申请人： Takeshi Ohse , Shinji Himori , Jun Abe , Norikazu Yamada
发明人： Takeshi Ohse , Shinji Himori , Jun Abe , Norikazu Yamada
IPC分类号： C03C15/00
CPC分类号： H01J37/02 , H01J37/32091 , H01J37/32146 , H01J37/32165
摘要： A substrate processing method uses a substrate processing apparatus including a chamber for accommodating a substrate, a lower electrode to mount the substrate, a first RF power applying unit for applying an RF power for plasma generation into the chamber, and a second RF power applying unit for applying an RF power for bias to the lower electrode. The RF power for plasma generation is controlled to be intermittently changed by changing an output of the first RF power applying unit at a predetermined timing. If no plasma state or an afterglow state exists in the chamber by a control of the first RF power applying unit, an output of the second RF power applying unit is controlled to be in an OFF state or decreased below an output of the second RF power applying unit when the output of the first RF power applying unit is a set output.
摘要翻译：基板处理方法使用基板处理装置，其包括用于容纳基板的室，用于安装基板的下电极，用于将用于等离子体产生的RF功率施加到室中的第一RF功率施加单元和第二RF功率施加单元用于向下电极施加用于偏压的RF功率。通过在预定的定时改变第一RF功率施加单元的输出来控制等离子体产生的RF功率间歇地改变。如果通过第一RF功率施加单元的控制在腔室中不存在等离子体状态或余辉状态，则第二RF功率施加单元的输出被控制为处于OFF状态或降低到低于第二RF功率的输出当第一RF功率施加单元的输出为设定输出时，施加单元。

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