专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US07748901B2 Universal x-ray test bed 有权
标题翻译：通用X射线试验台
公开(公告)号：US07748901B2
公开(公告)日：2010-07-06
申请号：US12062894
申请日：2008-04-04
申请人： Nickolas Markoff , Christopher M. Cone , Mike M. Tesic
发明人： Nickolas Markoff , Christopher M. Cone , Mike M. Tesic
IPC分类号： G01D18/00
CPC分类号： A61B8/58 , A61B6/583 , A61B6/585 , A61B6/586 , A61B8/4444 , G01N29/30 , G01R27/2605 , G01R31/026 , G01R31/04 , G01R31/11 , G01R31/2886 , Y10T29/49004
摘要： Systems and methods presented herein provide for the testing and reconfiguration of x-ray devices. In one embodiment, a test bed effectuates testing of an acquired x-ray device to determine a cause of the inoperability of the device. The x-ray device test bed may be provided to test a plurality of x-ray devices and, therefore, readily adaptable to such devices. The x-ray device test bed may include a mount for an x-ray tube. A variable power supply may be coupled to the x-ray tube to provide the requisite high-voltage electrical energy thereto. The x-ray device test bed may also include a mount for an imaging module (e.g., a “flat-panel sensor”). A processor may be coupled to the imaging module to determine the operational characteristics thereof. If certain x-ray components are deemed inoperable, the x-ray components may be replaced such that the x-ray device may be reintroduced to a medical industry segment.
摘要翻译：本文提出的系统和方法提供了X射线设备的测试和重新配置。在一个实施例中，测试台对所获得的X射线设备进行测试，以确定设备的不可操作性的原因。可以提供x射线装置试验台来测试多个x射线装置，因此可以容易地适应这种装置。 X射线装置测试台可以包括用于X射线管的安装座。可变电源可以耦合到X射线管，以向其提供必要的高压电能。 x射线装置测试台还可以包括用于成像模块的安装件（例如，“平板传感器”）。处理器可以耦合到成像模块以确定其操作特性。如果某些X射线成分被认为是不可操作的，则X射线成分可以被替换，使得X射线装置可以被重新引入到医疗工业部分。

2. 发明授权

US09429609B2 Ultrasound device testing 有权
标题翻译：超声波设备测试
公开(公告)号：US09429609B2
公开(公告)日：2016-08-30
申请号：US13430261
申请日：2012-03-26
申请人： Nickolas Markoff , Christopher M. Cone
发明人： Nickolas Markoff , Christopher M. Cone
IPC分类号： G01R31/08 , G01R31/20 , A61B8/14 , A61B8/00 , G01R27/26 , G01R31/04 , A61B6/00 , G01R31/28
CPC分类号： A61B8/58 , A61B6/583 , A61B6/585 , A61B6/586 , A61B8/4444 , G01N29/30 , G01R27/2605 , G01R31/026 , G01R31/04 , G01R31/11 , G01R31/2886 , Y10T29/49004
摘要： Systems and methods disclosed herein provide for the assessment of acousto-electrical probes, such as their connections (e.g., transducer leads) and their response characteristics. An example method of determining a capacitance capability of an electrical lead for an ultrasound device includes discharging stored capacitance of the electrical lead; applying power to the electrical lead; during applying power to the electrical lead, counting clock cycles from a microprocessor; comparing a electrical lead voltage to a reference voltage; stopping counting clock cycles when the electrical lead voltage passes the reference voltage; and processing a number of counted clock cycles, in response to stopping the counting clock cycles to determine a capacitance of the electrical lead.
摘要翻译：这里公开的系统和方法提供了声 - 电探针的评估，例如它们的连接（例如，换能器引线）及其响应特性。确定用于超声波装置的电线的电容容量的示例性方法包括放电电引线的存储电容; 对电线施加电力; 在对电线施加电力时，从微处理器计数时钟周期; 将电引线电压与参考电压进行比较; 当电引线电压通过参考电压时停止计数时钟周期; 以及响应于停止计数时钟周期来确定电引线的电容，来处理多个计数的时钟周期。

3. 发明申请

US20090067581A1 UNIVERSAL X-RAY TEST BED 有权
标题翻译：通用X射线测试台
公开(公告)号：US20090067581A1
公开(公告)日：2009-03-12
申请号：US12062894
申请日：2008-04-04
申请人： Nickolas Markoff , Christopher M. Cone , Mike M. Tesic
发明人： Nickolas Markoff , Christopher M. Cone , Mike M. Tesic
IPC分类号： G01D18/00
CPC分类号： A61B8/58 , A61B6/583 , A61B6/585 , A61B6/586 , A61B8/4444 , G01N29/30 , G01R27/2605 , G01R31/026 , G01R31/04 , G01R31/11 , G01R31/2886 , Y10T29/49004
摘要： Systems and methods presented herein provide for the testing and reconfiguration of x-ray devices. In one embodiment, a test bed effectuates testing of an acquired x-ray device to determine a cause of the inoperability of the device. The x-ray device test bed may be provided to test a plurality of x-ray devices and, therefore, readily adaptable to such devices. The x-ray device test bed may include a mount for an x-ray tube. A variable power supply may be coupled to the x-ray tube to provide the requisite high-voltage electrical energy thereto. The x-ray device test bed may also include a mount for an imaging module (e.g., a “flat-panel sensor”). A processor may be coupled to the imaging module to determine the operational characteristics thereof. If certain x-ray components are deemed inoperable, the x-ray components may be replaced such that the x-ray device may be reintroduced to a medical industry segment.
摘要翻译：本文提出的系统和方法提供了X射线设备的测试和重新配置。在一个实施例中，测试台对所获得的X射线设备进行测试，以确定设备的不可操作性的原因。可以提供x射线装置试验台来测试多个x射线装置，因此可以容易地适应这种装置。 X射线装置测试台可以包括用于X射线管的安装座。可变电源可以耦合到X射线管，以向其提供必要的高压电能。 x射线装置测试台还可以包括用于成像模块的安装件（例如，“平板传感器”）。处理器可以耦合到成像模块以确定其操作特性。如果某些X射线成分被认为是不可操作的，则X射线成分可以被替换，使得X射线装置可以被重新引入到医疗工业部分。

4. 发明申请

US20110019802A1 UNIVERSAL X-RAY TEST BED 审中-公开
标题翻译：通用X射线测试台
公开(公告)号：US20110019802A1
公开(公告)日：2011-01-27
申请号：US12828975
申请日：2010-07-01
申请人： Nickolas Markoff , Christopher M. Cone , Mike M. Tesic
发明人： Nickolas Markoff , Christopher M. Cone , Mike M. Tesic
IPC分类号： G01D18/00
CPC分类号： A61B8/58 , A61B6/583 , A61B6/585 , A61B6/586 , A61B8/4444 , G01N29/30 , G01R27/2605 , G01R31/026 , G01R31/04 , G01R31/11 , G01R31/2886 , Y10T29/49004
摘要： Systems and methods presented herein provide for the testing and reconfiguration of x-ray devices. In one embodiment, a test bed effectuates testing of an acquired x-ray device to determine a cause of the inoperability of the device. The x-ray device test bed may be provided to test a plurality of x-ray devices and, therefore, readily adaptable to such devices. The x-ray device test bed may include a mount for an x-ray tube. A variable power supply may be coupled to the x-ray tube to provide the requisite high-voltage electrical energy thereto. The x-ray device test bed may also include a mount for an imaging module (e.g., a “flat-panel sensor”). A processor may be coupled to the imaging module to determine the operational characteristics thereof. If certain x-ray components are deemed inoperable, the x-ray components may be replaced such that the x-ray device may be reintroduced to a medical industry segment.
摘要翻译：本文提出的系统和方法提供了X射线设备的测试和重新配置。在一个实施例中，测试台对所获得的X射线设备进行测试，以确定设备的不可操作性的原因。可以提供x射线装置试验台来测试多个x射线装置，因此可以容易地适应这种装置。 X射线装置测试台可以包括用于X射线管的安装座。可变电源可以耦合到X射线管，以向其提供必要的高压电能。 x射线装置测试台还可以包括用于成像模块的安装件（例如，“平板传感器”）。处理器可以耦合到成像模块以确定其操作特性。如果某些X射线成分被认为是不可操作的，则X射线成分可以被替换，使得X射线装置可以被重新引入到医疗工业部分。

5. 发明授权

US08143898B1 Systems and methods for reconfiguring an ultrasound device 有权
标题翻译：用于重新配置超声装置的系统和方法
公开(公告)号：US08143898B1
公开(公告)日：2012-03-27
申请号：US12062852
申请日：2008-04-04
申请人： Nickolas Markoff , Christopher M. Cone
发明人： Nickolas Markoff , Christopher M. Cone
IPC分类号： G01R31/08 , G01R31/20
CPC分类号： A61B8/58 , A61B6/583 , A61B6/585 , A61B6/586 , A61B8/4444 , G01N29/30 , G01R27/2605 , G01R31/026 , G01R31/04 , G01R31/11 , G01R31/2886 , Y10T29/49004
摘要： Systems and methods (the “utility”) presented herein provide for the assessment of acousto-electrical probes, such as their connections (e.g., transducer leads) and their response characteristics. For example, the utility may provide for readily evaluating transducer leads that have been broken and/or detached from transducers within an ultrasound probe. Due to the increasing complexity of ultrasound probes, identification of broken and/or detached transducer leads also becomes increasingly complex. Being able to identify such disconnected transducer leads may enable a person to repair, or “reterminate”, these transducer leads leading to a potentially substantial cost savings, the least of which being incurred by avoiding total replacement of an ultrasound probe.
摘要翻译：本文中提出的系统和方法（“效用”）提供了对电 - 电探针的评估，例如它们的连接（例如换能器引线）及其响应特性。例如，该实用程序可以提供容易地评估已经在超声波探头内的换能器断开和/或分离的换能器引线。由于超声波探头越来越复杂，识别破损和/或分离的换能器引线也越来越复杂。能够识别这种断开的换能器引线可以使得人们能够修复或“重新终止”这些换能器引线，从而导致潜在的巨大成本节约，其中最少的是通过避免完全更换超声波探头来实现的。

6. 发明申请

US20120271573A1 SYSTEMS AND METHODS FOR RECONFIGURING AN ULTRASOUND DEVICE 有权
标题翻译：用于重新构造超声波装置的系统和方法
公开(公告)号：US20120271573A1
公开(公告)日：2012-10-25
申请号：US13430261
申请日：2012-03-26
申请人： Nickolas Markoff , Christopher M. Cone
发明人： Nickolas Markoff , Christopher M. Cone
IPC分类号： H04R31/00 , G06F19/00 , G01R27/00
CPC分类号： A61B8/58 , A61B6/583 , A61B6/585 , A61B6/586 , A61B8/4444 , G01N29/30 , G01R27/2605 , G01R31/026 , G01R31/04 , G01R31/11 , G01R31/2886 , Y10T29/49004
摘要： Systems and methods (the “utility”) presented herein provide for the assessment of acousto-electrical probes, such as their connections (e.g., transducer leads) and their response characteristics. For example, the utility may provide for readily evaluating transducer leads that have been broken and/or detached from transducers within an ultrasound probe. Due to the increasing complexity of ultrasound probes, identification of broken and/or detached transducer leads also becomes increasingly complex. Being able to identify such disconnected transducer leads may enable a person to repair, or “reterminate”, these transducer leads leading to a potentially substantial cost savings, the least of which being incurred by avoiding total replacement of an ultrasound probe.
摘要翻译：本文中提出的系统和方法（实用）提供了声 - 电探针的评估，例如它们的连接（例如，换能器引线）及其响应特性。例如，该实用程序可以提供容易地评估已经在超声波探头内的换能器断开和/或分离的换能器引线。由于超声波探头越来越复杂，识别破损和/或分离的换能器引线也越来越复杂。能够识别这种断开的换能器引线可以使人能够修复或重新终止这些换能器引线，从而导致潜在的显着的成本节约，其中最少的是通过避免完全更换超声波探头而引起的。

7. 发明申请

US20090296894A1 UNIVERSAL X-RAY TEST BED 审中-公开
公开(公告)号：US20090296894A1
公开(公告)日：2009-12-03
申请号：US12539081
申请日：2009-08-11
申请人： NICKOLAS MARKOFF , CHRISTOPHER M. CONE , MIKE M. TESIC
发明人： NICKOLAS MARKOFF , CHRISTOPHER M. CONE , MIKE M. TESIC
IPC分类号： G01D18/00 , A61B6/04
CPC分类号： A61B8/58 , A61B6/583 , A61B6/585 , A61B6/586 , A61B8/4444 , G01N29/30 , G01R27/2605 , G01R31/026 , G01R31/04 , G01R31/11 , G01R31/2886 , Y10T29/49004
摘要： Systems and methods presented herein provide for the testing and reconfiguration of x-ray devices. In one embodiment, a test bed effectuates testing of an acquired x-ray device to determine a cause of the inoperability of the device. The x-ray device test bed may be provided to test a plurality of x-ray devices and, therefore, readily adaptable to such devices. The x-ray device test bed may include a mount for an x-ray tube. A variable power supply may be coupled to the x-ray tube to provide the requisite high-voltage electrical energy thereto. The x-ray device test bed may also include a mount for an imaging module (e.g., a “flat-panel sensor”). A processor may be coupled to the imaging module to determine the operational characteristics thereof. If certain x-ray components are deemed inoperable, the x-ray components may be replaced such that the x-ray device may be reintroduced to a medical industry segment.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式