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    • 1. 发明申请
    • Method of determining FET junction temperature
    • 确定FET结温的方法
    • US20070061099A1
    • 2007-03-15
    • US11212254
    • 2005-08-26
    • Steven TurnerMohammed Zakaria
    • Steven TurnerMohammed Zakaria
    • G01K1/00
    • G01K7/01G01K7/22G01K7/42G01R31/2628
    • A processor is responsive to a thermistor temperature Tth adjacent a FET functioning as a switch to control power to a load (L) and responsive to drain-to-source voltage (VDS) of the FET. The processor stores the characteristics of the FET and a thermal model of the system hardware and uses a first set of equations to determine the temperature TJ at the junction of the FET in a stable region of operation where TJ−Tth is nearly constant. The processor is further responsive to a step change in successive measurements of VDS indicative of a lag of Tth relative to TJ thereby rendering Tth unusable in the first set of equations and immediately determines an initial FET current IFET. The processor then resolves TJ based upon a second set of equations comprising TJ=Tth+ΔTSS(1−e−t/τ) when ΔTSS+Tth≧TJ and TJ=Tth+ΔTSS(e−t/τ) when ΔTSS+Tth≦TJ where τ is a constant and ΔTSS is the steady-state temperature difference between the TJ and Tth at the initial FET current IFET determined in accordance with ΔTSS=IFET2RDSθJ−th.
    • 处理器响应于用作开关的FET附近的热敏电阻温度T SUB以控制对负载(L)的功率,并且响应于漏极 - 源极电压(V SUB) SUB>)。 处理器存储FET的特性和系统硬件的热模型,并使用第一组方程来确定FET在运行稳定区域中的结处的温度T SUB,其中T 几何 - 第几乎是一定的。 处理器还响应于指示相对于T SUB的滞后的V SUB的连续测量中的阶跃变化,从而使得T 在第一组方程式中不能使用,并且立即确定初始FET电流I FET 。 然后,处理器基于包括第二组方程式的第二组方程式来解析T 1,其中T 1,N 2,T 3,..., (1-e-t / tau)当ΔTSS + T T T T T T T T T T T T T T T T 当DeltaT SS J T T T T T T T T T T T T T T T 其中τ是常数,并且ΔTSS SS是T T S之间的稳态温度差, 在根据DeltaT SSI = I FET确定的初始FET电流I FET FET处的第一和第三个/ 第二级第二级第二级第二级第二级。