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    • 1. 发明授权
    • Infrared gas analyzer
    • 红外气体分析仪
    • US4157470A
    • 1979-06-05
    • US888223
    • 1978-03-20
    • Mitsuo KotakaHisao TakaharaKaisuke MurakiRyo TakahashiTamizo Matsuura
    • Mitsuo KotakaHisao TakaharaKaisuke MurakiRyo TakahashiTamizo Matsuura
    • G01N21/35G01N21/26
    • G01N21/3504
    • To detect the density of a measurement component of a sample gas, infrared light is directed alternately through a measuring-light optical system and a reference-light optical system to a heated light sensor. The measuring-light optical system includes a sample cell, a first filter for transmitting infrared rays of a fixed wave-length band, and a temperature compensating cell having a gas which has a part of its absorption wave-length band within the transmission wave-length band of the first filter but has a spectrum different from the spectrum of the measurement component. The reference-light optical system includes a light throttle, an interference cell having a gas containing a fixed density of the measurement component, an adjustable-length interference compensating cell filled with the sample gas, and a second filter for transmitting rays of a wave-length band that includes the major part of the transmission wave-length band of the first filter. The compensating cell is set such that, with temperature fluctuations, variations in absorption by the temperature compensating cell in the wave-length band of the first filter are equal to variations in absorption by the interference cell within the wave-length band of the second filter.
    • 为了检测样品气体的测量部件的密度,红外光被交替地通过测量光学系统和参考光学系统引导到加热的光传感器。 测量光学系统包括样本单元,用于传输固定波长带的红外线的第一滤波器和具有在发射波长范围内具有其吸收波长带的一部分的气体的温度补偿单元, 第一滤光器的长度带,但是具有与测量部件的光谱不同的光谱。 参考光光学系统包括光节流器,具有包含测量部件的固定密度的气体的干涉单元,填充有样品气体的可调长度干涉补偿单元,以及用于传输波长的光的第二滤光器, 长度带包括第一滤波器的发送波长带的主要部分。 补偿单元被设置为使得随着温度波动,第一滤波器的波长带中的温度补偿单元的吸收变化等于第二滤波器的波长带内的干扰单元的吸收变化 。