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    • 2. 发明授权
    • Signal calibration for memory interface
    • 存储器接口的信号校准
    • US08134878B1
    • 2012-03-13
    • US12695099
    • 2010-01-27
    • Schuyler E. ShimanekMikhail A. WolfSanford L. HeltonJohn G. O'Dwyer
    • Schuyler E. ShimanekMikhail A. WolfSanford L. HeltonJohn G. O'Dwyer
    • G11C7/00
    • H03K19/1776H03K19/17736H03K19/1774
    • A method of calibrating memory controller signals within an integrated circuit (IC) can include determining an internal delay of a clock network of the IC and generating a calibrated clock signal by applying a first delay to an uncalibrated clock signal, wherein the first delay is determined by subtracting the internal delay of the clock network of the IC from a bitperiod of the uncalibrated clock signal. The method can include determining a classification of at least one data signal according to timing of positive and negative edges of the at least one data signal in comparison with edges of the calibrated clock signal and aligning at least one of positive or negative edges of the at least one data signal to occur at midpoints between edges of the calibrated clock signal according to the classification of the at least one data signal.
    • 校准集成电路(IC)内的存储器控​​制器信号的方法可以包括:确定IC的时钟网络的内部延迟并通过向未校准的时钟信号施加第一延迟并产生校准时钟信号,其中确定第一延迟 通过从未校准的时钟信号的比特周减去IC的时钟网络的内部延迟。 该方法可以包括根据校准的时钟信号的边缘与至少一个数据信号的正边缘和负边缘的定时相对应地确定至少一个数据信号的分类,并且对准至少一个数据信号的正或负边缘 至少一个数据信号根据至少一个数据信号的分类在校准时钟信号的边缘之间的中点发生。
    • 3. 发明授权
    • Method and apparatus for preamble detection for a control signal
    • 用于控制信号的前同步码检测的方法和装置
    • US08742791B1
    • 2014-06-03
    • US12689585
    • 2010-01-19
    • Schuyler E. ShimanekMikhail A. Wolf
    • Schuyler E. ShimanekMikhail A. Wolf
    • H03K19/00G11C8/00
    • H03K19/1776H03K19/17736H03K19/1774
    • An embodiment of a technique to determine an expected occurrence of a signal is disclosed. The technique includes receiving first and second signals, and storing delay information representing an expected time delay from an occurrence of the first signal to a point in time corresponding approximately to an expected occurrence of the second signal. The technique further includes responding to an occurrence of the first signal by: waiting for a time interval equivalent to the expected time delay, evaluating the second signal at approximately the end of the time interval, and adjusting the stored delay information if the second signal occurred outside a time window associated with the end of the time interval.
    • 公开了一种用于确定信号的预期发生的技术的实施例。 该技术包括接收第一和第二信号,以及将表示预期时间延迟的延迟信息从第一信号的出现存储到大致相当于第二信号的期望出现的时间点。 该技术还包括通过以下步骤来响应第一信号的发生:等待与预期时间延迟相当的时间间隔,在大约时间间隔结束时评估第二信号,以及如果发生第二信号则调整存储的延迟信息 在与时间间隔结束相关联的时间窗外。
    • 5. 发明授权
    • Boundary scan analysis
    • 边界扫描分析
    • US07188043B1
    • 2007-03-06
    • US10769241
    • 2004-01-30
    • Mikhail A. Wolf
    • Mikhail A. Wolf
    • G01R31/14
    • G01R31/318536G01R31/318378G01R31/318544
    • A circuit testing approach involves the generation of boundary scan information using test vectors to identify characteristics of a circuit design and a boundary scan implementation therefor. According to an example embodiment of the present invention, test vectors are used in simulation to identify circuit design characteristics for establishing a boundary scan test program. The test vectors are generated using a netlist of the circuit design. The test vectors are used to simulate operation of the circuit, and responses to the simulation are detected and used to identify design-specific circuit characteristics and a boundary scan test program is generated using the design-specific circuit characteristics.
    • 电路测试方法涉及使用测试向量生成边界扫描信息,以识别电路设计的特性和用于其的边界扫描实现。 根据本发明的示例性实施例,在仿真中使用测试向量来识别用于建立边界扫描测试程序的电路设计特性。 使用电路设计的网表生成测试向量。 测试矢量用于模拟电路的运行,并检测对仿真的响应,并用于识别设计特定的电路特性,并使用设计特定的电路特性生成边界扫描测试程序。