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    • 1. 发明申请
    • Roundness Measuring Instrument and Method of Determining Quality of Tip Head
    • 圆度测量仪及其头尖质量测定方法
    • US20090259435A1
    • 2009-10-15
    • US12085292
    • 2006-12-01
    • Masato EnomotoSusumu Sawafuji
    • Masato EnomotoSusumu Sawafuji
    • G01B11/24
    • G01B5/201G01B21/045
    • To realize a roundness measuring instrument of which the measurement precision when there is eccentricity has been improved. The instrument comprises a mount base 1, a tip head 11 having a spherical tip portion and capable of moving in a first plane including an axis of rotation of the mount base, which comes into contact with the surface of an object to be measured and moves, a measurement probe 12-14 that detects the displacement of the tip head and outputs measurement data, and a processing controller 15 that processes the measurement data, wherein the processing controller calculates a roundness by correcting a shift of the contact position of the surface of the object to be measured and the tip head in the first plane due to eccentricity between the center of the object to be measured and the center of rotation of the mount base, and further, the processing controller calculates a roundness by calculating a shift due to eccentricity of the contact position in a direction perpendicular to the first plane and also correcting a shift of the contact position due to the calculated shift in the first plane.
    • 实现圆偏心测量仪器,其具有偏心时的测量精度得到改善。 该仪器包括安装基座1,具有球形尖端部分的尖端头部11,其能够在包括安装基座的旋转轴线的第一平面内移动,该第一平面与被测量物体的表面接触并移动 ,检测前端头的位移并输出测量数据的测量探针12-14以及处理测量数据的处理控制器15,其中处理控制器通过校正表面的接触位置的偏移来计算圆度 要测量的物体和由于被测量物体的中心与安装基座的旋转中心之间的偏心引起的第一平面中的尖端头,此外,处理控制器通过计算由于 接触位置在垂直于第一平面的方向上的偏心度,并且还校正由于计算出的第一平面中的移位引起的接触位置的偏移。
    • 2. 发明授权
    • Roughness measuring method and apparatus, using a filter having a plurality of cutoff values
    • 粗糙度测量方法和装置,使用具有多个截止值的滤波器
    • US06696697B2
    • 2004-02-24
    • US09956952
    • 2001-09-21
    • Masato Enomoto
    • Masato Enomoto
    • G01N2186
    • G01B7/34
    • The roughness measuring method and roughness measuring apparatus enable accurate measurement of the surface roughness of a work with no cutoff values specified. An auxiliary storage device storing therein a plurality of cutoff values is included in a data processing apparatus of the roughness measuring apparatus. These cutoff values are read by a CPU. Then, the CPU uses a filter having a plurality of cutoff values to calculate a plurality of temporary evaluation values for each evaluation length corresponding to a plurality of cutoff values from measurement data, and obtains a maximum value out of these temporary evaluation values. Then, the CPU controls an evaluation value outputting device to have this maximum value outputted to a monitor as an effective evaluation value of the roughness of the measurement area in the cutoff value with the calculated maximum value falling within its roughness range.
    • 粗糙度测量方法和粗糙度测量装置能够精确测量没有指定截止值的工件的表面粗糙度。 其中存储有多个截止值的辅助存储装置包括在粗糙度测量装置的数据处理装置中。 这些截止值由CPU读取。 然后,CPU使用具有多个截止值的滤波器,从与测量数据对应的多个截止值的每个评估长度计算出多个临时评估值,并从这些临时评估值中获得最大值。 然后,CPU将评估值输出装置控制为将该最大值输出到监视器,作为计算出的最大值处于其粗糙范围内的截止值中的测量区域的粗糙度的有效评估值。