会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 2. 发明授权
    • Toner cartridge
    • 墨粉盒
    • US08532522B2
    • 2013-09-10
    • US12922789
    • 2009-03-16
    • Yoshihide KawamuraMasashi Hasegawa
    • Yoshihide KawamuraMasashi Hasegawa
    • G03G15/08
    • G03G15/0872G03G15/0881G03G2215/0668
    • A toner cartridge contains a toner container including an opening and configured to contain a toner. An engaging member includes a ring-shaped seal member disposed on a seal member installation surface. The engaging member is engaged with the toner container to cover the opening and rotatably mounted to the toner container while an edge of the opening is frictionally slid on a surface of the seal member. The toner container is configured to convey the toner into the engage member through the opening and discharge the toner therefrom as the toner container is rotated. The seal member includes a non-contact portion at a surface thereof facing the installation surface and being free from any contact with the installation surface so that the engage member includes a space extending from the surface of the seal member where the edge of the opening is frictionally slid to the non-contact portion.
    • 调色剂盒包括一个包括开口并构造成容纳调色剂的调色剂容器。 接合构件包括设置在密封构件安装表面上的环形密封构件。 接合构件与调色剂容器接合以覆盖开口并可旋转地安装到调色剂容器,同时开口的边缘在密封构件的表面上摩擦滑动。 调色剂容器构造成通过开口将调色剂输送到接合构件中,并随着调色剂容器旋转而将调色剂从其中排出。 密封构件包括在其面向安装表面的表面处的非接触部分,并且不与安装表面接触,使得接合构件包括从密封构件的表面延伸的空间,其中开口的边缘为 摩擦滑动到非接触部分。
    • 4. 发明授权
    • Testing apparatus for integrated circuit
    • 集成电路测试仪
    • US08253433B2
    • 2012-08-28
    • US12790373
    • 2010-05-28
    • Kenichi WashioMasashi Hasegawa
    • Kenichi WashioMasashi Hasegawa
    • G01R31/02
    • G01R31/2887G01R1/07371G01R31/2889
    • An apparatus for testing an integrated circuit comprises: a chip unit with a plurality of electronic parts such as chip units arranged on the upside of a chip support; a probe unit having a plurality of contacts arranged on the underside of a probe support and spaced downward from the chip unit; a connection unit supporting the probe unit spaced downward from the chip unit on a pin support so as to penetrate the pin support in an up-down direction; and a coupling unit which couples separably the chip unit, the probe unit and the connection unit and displaces one of the chip support and the probe support and the pin support in a direction to approach each other and to be away from each other relative to the connection unit.
    • 一种用于集成电路测试的装置包括:芯片单元,具有布置在芯片支架的上侧上的诸如芯片单元的多个电子部件; 探针单元,具有布置在探针支架的下侧并与芯片单元向下间隔的多个触点; 连接单元,其支撑所述探针单元,其在所述芯支撑件上与所述芯片单元向下隔开,以便沿着上下方向穿过所述销支撑件; 以及联接单元,其可分离地将所述芯片单元,所述探针单元和所述连接单元耦合,并使所述芯片支撑件和所述探针支架中的一个以及所述销支撑沿着彼此接近的方向相对移动并相对于所述连接单元彼此远离 连接单元
    • 9. 发明申请
    • PROBE ASSEMBLY
    • 探测组件
    • US20080007282A1
    • 2008-01-10
    • US11757888
    • 2007-06-04
    • Yoshiei HasegawaMasashi Hasegawa
    • Yoshiei HasegawaMasashi Hasegawa
    • G01R1/073
    • G01R1/07357
    • A probe assembly having a plurality of probes, each of which is secured to an anchor portion on a probe base plate, extends in a direction apart from the anchor portion through a fulcrum, has a tip at the front end thereof, and the tip is elastically deformable at its front end side when pressed against a corresponding electrode pad. Two probe groups are constituted: in the first group, the tips are arranged on one side of an imaginary straight line of the probe base plate, while in the second probe group, the tips are arranged on the other side of the imaginary straight line. The numbers of the probes of both probe groups are different, and a part of the probes forming one probe group with more probes are arranged in the opposite direction to that of the other probes of the same probe group.
    • 具有多个探针的探针组件,每个探针固定在探针基板上的锚定部分上,沿着与锚定部分相反的方向通过支点延伸,其前端具有尖端,并且尖端是 当压靠在相应的电极垫上时,其前端侧可弹性变形。 构成两个探针组:在第一组中,尖端布置在探针基板的假想直线的一侧,而在第二探针组中,尖端布置在假想直线的另一侧。 两个探针组的探针数目不同,形成具有更多探针的探针组的探针的一部分与相同探针组的其它探针的方向相反的方向排列。
    • 10. 发明申请
    • Probing apparatus
    • 探测仪器
    • US20070159194A1
    • 2007-07-12
    • US11651851
    • 2007-01-09
    • Yoshiei HasegawaHikaru MasudaKatsuo YasudaKenichi WashioMasashi Hasegawa
    • Yoshiei HasegawaHikaru MasudaKatsuo YasudaKenichi WashioMasashi Hasegawa
    • G01R31/02
    • G01R31/2889
    • A probing apparatus comprising: an inspection stage for receiving a flat plate-like device under test with a plurality of electrodes and moving the device under test on the inspection stage in at least three directions, that is, an X direction and a Y direction intersecting each other within a parallel plane to the device under test, and a Z direction intersecting both the directions; a probe card having a plurality of probes and spaced apart from the inspection stage in the Z direction such that the probe tips face the inspection stage; a displacement mechanism for relatively displacing the probe card and the inspection stage for adjustment of parallelism of the device under test on the inspection stage and the probe card; a plurality of measuring instruments respectively for measuring the interval between the inspection stage and the probe card and arranged at intervals in one of the inspection stage and the probe card in the X direction and the Y direction; a control portion for controlling at least the measuring instruments, the inspection stage and the displacement mechanism; and a memory portion for storing the measured interval by each measuring instrument.
    • 一种探测装置,包括:检查台,用于接收具有多个电极的被测试的平板状器件,并且在检查台上至少在三个方向上移动被测器件,即X方向和Y方向相交 在与被测设备的平行平面内彼此相对,并且Z方向与两个方向相交; 探针卡,其具有多个探针,并且在Z方向上与检查台间隔开,使得探针末端面向检查台; 用于相对移位探针卡和检查台的位移机构,用于调节检查台和探针卡上的被测器件的平行度; 多个测量仪器,分别用于测量检查台和探针卡之间的间隔,并且在X方向和Y方向上间隔地布置在检查台和探针卡之一上; 用于至少控制测量仪器,检查台和位移机构的控制部分; 以及存储部分,用于存储每个测量仪器测量的间隔。