会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • High purity titanium sputtering targets
    • 高纯钛溅射靶
    • US5772860A
    • 1998-06-30
    • US308234
    • 1994-09-19
    • Susumu SawadaHideaki FukuyoMasaru Nagasawa
    • Susumu SawadaHideaki FukuyoMasaru Nagasawa
    • C23C14/34
    • C23C14/3414
    • A high-purity titanium sputtering target having controlled crystal characteristics. The uniform problem of film thickness distribution on a substrate can be solved by adopting the requirements that (a) the average crystal grain diameters at various portions of the sputtering surface of the target are 500 .mu.m or less, preferably 100 .mu.m or less, and their dispersions are within .+-.20%, and (b) the defined orientation content ratios A have dispersions within .+-.20% and (c) a Ti target crystal structure has a recrystallization structure. The problems in connection with particle generation and lowered film forming rate in collimation sputtering can be solved by adopting the requirements that (d) said orientation content ratios A are is 80% or less, preferably 50% or less, and (e) the defined orientation content ratios B are 20% or less, as necessary, in combination with the aforementioned (a) to (c) requirements.
    • 具有受控晶体特性的高纯钛溅射靶。 可以通过以下要求来解决基板上的膜厚分布的均匀问题:(a)靶的溅射表面的各部分的平均晶粒直径为500μm以下,优选为100μm以下, 并且它们的分散体在+/- 20%内,和(b)定义的取向含量比A具有在+/- 20%内的分散体,(c)Ti靶晶体结构具有重结晶结构。 通过采用(d)所述取向含有率A为80%以下,优选为50%以下的要求,可以解决与准直溅射中的粒子产生和降低成膜速度有关的问题,(e) 取向含量比B在必要时为20%以下,与上述(a)〜(c)要求相结合。
    • 4. 发明授权
    • Sputtering targets of high-purity aluminum or alloy thereof
    • 高纯度铝或其合金的溅射靶
    • US5456815A
    • 1995-10-10
    • US364073
    • 1994-12-27
    • Hideaki FukuyoSusumu SawadaMasaru Nagasawa
    • Hideaki FukuyoSusumu SawadaMasaru Nagasawa
    • C23C14/34
    • C23C14/3414
    • A sputtering target of a high-purity Al or Al alloy having (1) a target crystal structure as a recrystallization structure and average grain diameters in various portions of 500 .mu.m or less, with dispersions within .+-.15%, and (2) a {200} crystalline orientation content ratio on the sputtering surface of at least 0.35 in various portions of the target, with dispersions within .+-.15%, said {200} crystalline orientation content ratio being defined by the following formula: ##EQU1## where I.sub.{200}, I.sub.{111}, I.sub.{220} and I.sub.{311} are peak strengths for (200), (111), (220) and (311) crystal planes, respectively, as obtained X-ray diffraction method. Simultaneous realization of (1)+(2) is desirable. For these purposes, uniform warm or cold working to a desired final geometry below the recrystallization temperature must be followed by uniform heat treatment throughout the target at the recrystallization temperature of the material to finish the recrystallization.
    • 一种高纯度Al或Al合金的溅射靶,其具有(1)作为再结晶结构的靶晶体结构,各种部分的平均粒径为500μm以下,分散在±15%以内,(2 )在溅射表面上的{200}晶体取向含量比在靶的各个部分中至少为0.35,分散体在+/- 15%内,所述{200}结晶取向含量比由下式定义:其中I {200},I {111},I {220}和I {311}分别是(200),(111),(220)和(311)晶面的峰值强度,如X射线 衍射法。 同时实现(1)+(2)是可取的。 为了这些目的,在再结晶温度以下的期望最终几何形状的均匀加热或冷加工必须在材料的再结晶温度下在整个靶材上进行均匀的热处理,以完成重结晶。