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    • 3. 发明授权
    • Micro array lens using optical fiber
    • 微阵列镜头采用光纤
    • US07916397B2
    • 2011-03-29
    • US12822070
    • 2010-06-23
    • Joseph Martin Patterson
    • Joseph Martin Patterson
    • G02B27/10
    • G02B3/0056
    • An optical fiber micro array lens is provided along with an associated fabrication method. The micro array lens is fabricated from a mesh of optical fibers. The mesh includes a first plurality of cylindrical optical fibers. Each fiber from the first plurality has a flat bottom surface and a hemicylindrical top surface. The top and bottom surfaces are aligned in parallel with a central fiber axis. The mesh also includes a second plurality of cylindrical optical fibers. Each fiber from the second plurality has a hemicylindrical bottom surface overlying and in contact with the top surfaces of the first plurality of optical fibers, and a flat top surface. The top and bottom surfaces are aligned in parallel with a central fiber axis. Each contact of the first and second plurality of optical fibers forms a lens assembly in a micro array of lenses.
    • 提供了一种光纤微阵列透镜以及相关的制造方法。 微阵列透镜由光纤网制成。 网格包括第一多个圆柱形光纤。 来自第一多个的每个纤维具有平坦的底表面和半圆柱形顶表面。 顶部和底部表面与中心纤维轴平行排列。 网格还包括第二多个圆柱形光纤。 来自第二多个光纤的每个光纤具有覆盖并与第一多个光纤的顶表面接触的半圆柱形底表面和平坦的顶表面。 顶部和底部表面与中心纤维轴平行排列。 第一和第二多个光纤的每个接触在透镜的微阵列中形成透镜组件。
    • 4. 发明申请
    • Integrated Circuit Thermally Induced Noise Analysis
    • 集成电路热诱导噪声分析
    • US20100327875A1
    • 2010-12-30
    • US12490729
    • 2009-06-24
    • Joseph Martin Patterson
    • Joseph Martin Patterson
    • G01R31/26G01R31/00
    • G01R31/2875G01R31/303
    • A system and method are provided for testing an integrated circuit (IC) using thermally induced noise analysis. The method provides an IC die and supplies electrical power to the IC die. The IC die surface is scanned with a laser, and the laser beam irradiated locations on the IC die surface are tracked. The laser scanning heats active electrical elements underlying the scanned IC die surface. A frequency response of an IC die electrical interface is measured and correlated to irradiated locations. IC die defect regions are determined in response to identifying location-correlated frequency measurements exceeding a noise threshold. For example, a frequency measurement may be correlated to a die surface location, and if frequency measurement exceeds the noise threshold, then circuitry underlying that surface area may be identified as defective. Typically, die defect regions are associated with measurements in the frequency range between about 1 Hertz and 10 kilohertz.
    • 提供了一种使用热感应噪声分析测试集成电路(IC)的系统和方法。 该方法提供IC芯片并且为IC芯片提供电力。 利用激光扫描IC芯片表面,并跟踪IC芯片表面上的激光束照射位置。 激光扫描加热扫描IC芯片表面下方的有源电气元件。 测量IC芯片电接口的频率响应并将其与辐射位置相关联。 响应于识别超过噪声阈值的位置相关频率测量来确定IC芯片缺陷区域。 例如,频率测量可以与模具表面位置相关联,并且如果频率测量超过噪声阈值,则该表面积下面的电路可能被识别为有缺陷的。 通常,管芯缺陷区域在约1赫兹和10千赫兹之间的频率范围内的测量值相关联。
    • 5. 发明申请
    • Optical Fiber Micro Array Lens
    • 光纤微阵列透镜
    • US20100177405A1
    • 2010-07-15
    • US12352640
    • 2009-01-13
    • Joseph Martin Patterson
    • Joseph Martin Patterson
    • G02B3/06G02B9/04
    • G02B3/0056
    • An optical fiber micro array lens is provided along with an associated fabrication method. The micro array lens is fabricated from a mesh of optical fibers. The mesh includes a first plurality of cylindrical optical fibers. Each fiber from the first plurality has a flat bottom surface and a hemicylindrical top surface. The top and bottom surfaces are aligned in parallel with a central fiber axis. The mesh also includes a second plurality of cylindrical optical fibers. Each fiber from the second plurality has a hemicylindrical bottom surface overlying and in contact with the top surfaces of the first plurality of optical fibers, and a flat top surface. The top and bottom surfaces are aligned in parallel with a central fiber axis. Each contact of the first and second plurality of optical fibers forms a lens assembly in a micro array of lenses.
    • 提供了一种光纤微阵列透镜以及相关的制造方法。 微阵列透镜由光纤网制成。 网格包括第一多个圆柱形光纤。 来自第一多个的每个纤维具有平坦的底表面和半圆柱形顶表面。 顶部和底部表面与中心纤维轴平行排列。 网格还包括第二多个圆柱形光纤。 来自第二多个光纤的每个光纤具有覆盖并与第一多个光纤的顶表面接触的半圆柱形底表面和平坦的顶表面。 顶部和底部表面与中心纤维轴平行排列。 第一和第二多个光纤的每个接触在透镜的微阵列中形成透镜组件。
    • 7. 发明授权
    • Thermal electric NOR gate
    • 热电NOR门
    • US07659750B2
    • 2010-02-09
    • US12120109
    • 2008-05-13
    • Joseph Martin Patterson
    • Joseph Martin Patterson
    • H03K19/20
    • H03K19/02
    • A thermal electric (TE) binary NOR gate logic circuit is provided with a method for NOR logic gating. The method accepts a first input voltage representing an input binary logic state and generates a first thermal electric (TE) temperature in response to the first input voltage. A second input voltage is accepted representing an input binary logic state, and a second TE temperature is generated in response to the second input voltage. In response to the first and second TE temperatures, a NOR logic state output voltage is generated. More explicitly, a first control voltage is generated in response to the first TE temperature, and a second control voltage is generated in response to the second TE temperature. Then, a third TE temperature is generated in response to the first and second control voltages, which in turn generates the output voltage.
    • 热电(TE)二进制或非门逻辑电路提供了一种用于或非逻辑门控的方法。 该方法接受表示输入二进制逻辑状态的第一输入电压,并且响应于第一输入电压产生第一热电(TE)温度。 接受表示输入二进制逻辑状态的第二输入电压,并且响应于第二输入电压产生第二TE温度。 响应于第一和第二TE温度,产生NOR逻辑状态输出电压。 更明确地,响应于第一TE温度产生第一控制电压,并且响应于第二TE温度产生第二控制电压。 然后,响应于第一和第二控制电压产生第三TE温度,其又产生输出电压。
    • 9. 发明申请
    • Integrated Circuit Cooling Apparatus for Focused Beam Processes
    • 用于聚焦光束处理的集成电路冷却装置
    • US20090323287A1
    • 2009-12-31
    • US12330376
    • 2008-12-08
    • Joseph Martin Patterson
    • Joseph Martin Patterson
    • H05K7/20
    • H01L21/67098B23K26/703H01J37/20H01J37/28H01J2237/2001H01J2237/2007H01J2237/2817H01J2237/31745H01J2237/31749
    • A fixture and method are provided for cooling an IC in the performance of focused beam processes. The method provides a holding/cooling fixture with thermal electric (TE) jaws having an IC interface surface and a heatsink interface. An IC die is secured between the IC interface surfaces of the jaws. Electrical energy is supplied to the TE jaws, creating a negative temperature differential between the IC interface and heatsink interfaces. As a result, the IC die is cooled. A focused beam is applied to a local region of the IC die. Some examples of the focused beam include a focused ion beam (FIB), scanning electron microscope (SEM), E-beam, or a laser scanning microscope (LSM). The focused beam heats the local region of the IC, while the bulk of the IC remains cooled. Typically, each TE jaw includes a plurality of TE elements thermally connected in series.
    • 提供了一种夹具和方法,用于在聚焦光束过程的执行中冷却IC。 该方法提供具有具有IC接口表面和散热器接口的热电(TE)钳口的保持/冷却固定装置。 IC芯片固定在钳口的IC接口表面之间。 电能供应到TE钳口,在IC接口和散热器接口之间产生负温差。 结果,IC管芯被冷却。 聚焦光束被施加到IC芯片的局部区域。 聚焦光束的一些实例包括聚焦离子束(FIB),扫描电子显微镜(SEM),电子束或激光扫描显微镜(LSM)。 聚焦光束加热IC的局部区域,而大部分IC仍然冷却。 通常,每个TE卡爪包括串联热连接的多个TE元件。
    • 10. 发明申请
    • Thermaltronic Analog Device
    • Thermaltronic模拟器件
    • US20090206907A1
    • 2009-08-20
    • US12237027
    • 2008-09-24
    • Joseph Martin Patterson
    • Joseph Martin Patterson
    • G06G7/24
    • H03K19/02
    • A method is provided for the electronic processing of analog signals in thermaltronic device. The method accepts an analog input signal, e.g., an AC signal, at a thermaltronic device input and generates a thermal electric (TE) temperature having a first transfer function responsive to the input signal. As opposed to having a digital response, the transfer function is either linear or logarithmic. An analog output signal, e.g., an AC signal, is generated having a second transfer function responsive to the TE, which is likewise either linear or logarithmic.
    • 提供了一种用于在热电子器件中进行模拟信号的电子处理的方法。 该方法在热电子设备输入处接收模拟输入信号,例如AC信号,并产生响应于输入信号的具有第一传递函数的热电(TE)温度。 与数字响应相反,传递函数是线性或对数的。 产生具有响应于TE的第二传递函数的模拟输出信号,例如AC信号,其同样是线性或对数的。