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    • 1. 发明授权
    • Method and apparatus for improving fault test coverage for an integrated circuit
    • 用于改善集成电路的故障测试覆盖的方法和装置
    • US06532557B1
    • 2003-03-11
    • US09405521
    • 1999-09-23
    • Mark WongPhilip Hurlow
    • Mark WongPhilip Hurlow
    • G01R3128
    • G01R31/3187G01R31/3181
    • An integrated circuit is disclosed that includes an output pad, a first functional unit block (FUB) coupled to the output pad and a control circuit coupled to the first FUB. According to one embodiment, the control circuit is adaptable to select a first group or a second group of internal signals within the first FUB that are to be transmitted to the output pad upon initiating a test mode at the integrated circuit. According to a further embodiment, the control circuit is further adaptable to receive a test vector including data that determines whether the first or second group of internal signals are transmitted to the output pad. According to yet another embodiment, the integrated circuit includes a second FUB coupled to the output pad and the control circuit. The control circuit is adaptable to select between a third group of internal signals and a fourth group of internal signals within the second FUB that are to be transmitted to the output pad.
    • 公开了一种集成电路,其包括输出焊盘,耦合到输出焊盘的第一功能单元块(FUB)和耦合到第一FUB的控制电路。 根据一个实施例,控制电路可适应于在集成电路上启动测试模式时,选择要在第一FUB内发送到输出焊盘的第一组或第二组内部信号。 根据另一实施例,控制电路进一步适于接收包括确定第一组或第二组内部信号是否被发送到输出焊盘的数据的测试矢量。 根据又一个实施例,集成电路包括耦合到输出焊盘和控制电路的第二FUB。 控制电路适于在第三组内部信号和第二组FUB内的第四组内部信号之间进行选择,以将第二组内部信号传输到输出焊盘。