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    • 1. 发明申请
    • METHOD AND APPARATUS FOR USING CEPSTRUM AND WAVELET BASED ALGORITHMS FOR WALL THICKNESS MEASUREMENT
    • 使用基于CEPSTRUM和WAVELET的算法进行厚度测量的方法和装置
    • US20130247673A1
    • 2013-09-26
    • US13583253
    • 2011-03-09
    • Michael A. DavisMark A. Foss
    • Michael A. DavisMark A. Foss
    • G01B17/02
    • G01B17/02
    • New techniques are provided for measuring the thickness of a pipe wall using ultrasonic reflections. The apparatus includes a signal processor that receives a signal containing information about ultrasonic pulses injected into a pipe wall; and determines a pipe wall thickness measurement based at least partly on decomposing the signal received in order to identify either peaks using a cepstrum analysis or repeated spacing using a wavelet analysis. The wavelet analysis includes dividing data in the signal received into a specific frequency component and a defined temporal component in order to detect correct pulses where multiple reflections are caused by irregularities in the pipe wall surface being measured. The cepstrum analysis includes processing repeating pulses in the signal in order to detect correct pulses where multiple reflections are caused by irregularities in the pipe wall surface being measured.
    • 提供了用于使用超声波反射来测量管壁的厚度的新技术。 该装置包括信号处理器,其接收包含注入到管壁中的关于超声脉冲的信息的信号; 并且至少部分地基于分解所接收的信号来确定管壁厚度测量,以便使用小波分析使用倒谱分析或重复间隔来识别峰。 小波分析包括将接收到的信号中的数据划分成特定频率分量和定义的时间分量,以便检测正在测量的管壁表面中的不规则性导致多次反射的正确脉冲。 倒谱分析包括处理信号中的重复脉冲,以便检测正在测量的管壁表面中由不规则性引起多次反射的脉冲。