专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20070221911A1 Polymer Optoelectronic Device and Methods for Making the Same 无效
标题翻译：聚合物光电器件及其制造方法
公开(公告)号：US20070221911A1
公开(公告)日：2007-09-27
申请号：US11547522
申请日：2005-04-01
申请人： Antonius Van Mol , Frank Grob , Marinus Koetse
发明人： Antonius Van Mol , Frank Grob , Marinus Koetse
IPC分类号： H01L51/00 , H01L21/44
CPC分类号： H01L51/5262 , H01L51/5206 , H01L51/5209
摘要： The invention relates to a polymer optoelectronic device comprising at least a transparent conductive oxide layer, an active polymer layer, a back electrode layer and a substrate layer, wherein the transparent conductive oxide (TCO) layer has a controlled surface structure which is characterised by having an X-value in the range of from 10 nm to 500 nm, and a Y-value in the range of from 15 nm to 1000 nm, wherein the ratio between the X-value and the Y-value (X/Y) is at most 1, whereby the X-value is defined as the average value of the height of the peaks on the surface, the Y-value is defined as the average peak to peak distance on the surface, and both the X and Y values are measured by means of SEM (Scanning Electron Microscopy) or Atomic Force Microscopy (AFM).
摘要翻译：本发明涉及至少包括透明导电氧化物层，活性聚合物层，背电极层和基底层的聚合物光电器件，其中透明导电氧化物（TCO）层具有受控的表面结构，其特征在于具有在10nm至500nm范围内的X值和在15nm至1000nm范围内的Y值，其中X值和Y值（X / Y）之间的比率为最多为1，由此将X值定义为表面上的峰的高度的平均值，将Y值定义为表面上的平均峰 - 峰距离，并且X和Y值均为通过SEM（扫描电子显微镜）或原子力显微镜（AFM）测量。

IPRDB

热门服务

关于我们

友情链接

联系方式