专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US08713382B2 Control apparatus and control method 有权
标题翻译：控制装置及控制方法
公开(公告)号：US08713382B2
公开(公告)日：2014-04-29
申请号：US13213054
申请日：2011-08-18
申请人： Makoto Tabata
发明人： Makoto Tabata
IPC分类号： G11C29/00
CPC分类号： G11C29/56 , G11C29/56008 , G11C29/808 , G11C29/81
摘要： A control apparatus controlling testing of a memory under test that includes one or more row repair memory blocks and column repair memory blocks. The control apparatus comprises a counting section that sequentially receives test results respectively indicating pass/fail of a plurality of test blocks of the memory under test, and sequentially counts, for each first-type memory block, which is a row-oriented memory block or a column-oriented memory block, a fail memory block number among second-type memory blocks; a selecting section that selects memory blocks first-type memory blocks for which the fail memory block number exceeds a reference value, such that the number of selected memory blocks is no greater than the number of first-type repair memory blocks of the memory under test; and a test control section that masks test blocks among the memory blocks selected by the selecting section and causes further testing of the memory under test.
摘要翻译：控制装置，其控制包括一个或多个行修复存储器块和列修复存储器块的被测存储器的测试。该控制装置包括计数部分，其依次接收分别指示被测存储器的多个测试块的通过/失败的测试结果，并且对于作为面向行的存储器块的每个第一类型存储器块，一个面向列的存储器块，第二类型存储器块中的故障存储器块号; 选择部，其选择存储块，其中所述故障存储器块号超过参考值的第一类型存储块，使得所选存储块的数量不大于被测存储器的第一类型修复存储块的数量 ; 以及测试控制部分，其对由所述选择部分选择的所述存储器块中的测试块进行掩蔽，并且对被测试的存储器进行进一步测试。

2. 发明授权

US08627837B2 Thin plate member washing apparatus 有权
公开(公告)号：US08627837B2
公开(公告)日：2014-01-14
申请号：US13524703
申请日：2012-06-15
申请人： Yusuke Kato , Takanobu Yamauchi , Kei Asai , Makoto Tabata , Yusaku Sakoda
发明人： Yusuke Kato , Takanobu Yamauchi , Kei Asai , Makoto Tabata , Yusaku Sakoda
IPC分类号： B08B3/12 , B08B6/00
摘要： In a thin plate member washing apparatus, when a rotary arm member supporting a mesh member holding portion is rotated using a rotary handle, tap water flows over the surface of a mesh member, and medicinal fluid residue deposited on the mesh member is removed.

3. 发明授权

US08072232B2 Test apparatus that tests a device under test having a test function for sequentially outputting signals 失效
标题翻译：测试被测设备具有用于顺序地输出信号的测试功能的测试装置
公开(公告)号：US08072232B2
公开(公告)日：2011-12-06
申请号：US12618619
申请日：2009-11-13
申请人： Makoto Tabata
发明人： Makoto Tabata
IPC分类号： G01R31/26
CPC分类号： G11C29/56 , G11C29/48 , G11C2029/5602 , G11C2029/5606
摘要： Provided is a test apparatus that tests a device under test having a test function for sequentially outputting, from a single test terminal, signals that would be output from a plurality of terminals, the test apparatus comprising: a test section that supplies the device under test with a test signal and receives signals that are sequentially output from the test terminal in response to the test signal; an identifying section that identifies a correspondence between each signal sequentially received by the test section and a signal that would be output from one of the terminals of the device under test; and a counting section that counts a number of signals judged to be unacceptable from among the signals sequentially received by the test section for each terminal of the device under test, based on the correspondence identified by the identifying section.
摘要翻译：提供了一种测试装置，其具有测试功能，用于从单个测试终端顺次地输出将从多个终端输出的信号，所述测试设备包括：测试部分，其供应被测设备具有测试信号并接收响应于测试信号从测试终端顺序地输出的信号; 标识部分，其识别由测试部分顺序接收的每个信号与将从被测设备的一个终端输出的信号之间的对应关系; 以及计数部，其基于由识别部识别的对应关系，对从被测设备的每个终端按测试部分顺序接收的信号中判定为不可接受的信号数进行计数。

4. 发明申请

US20100255893A1 MOBILE COMMUNICATION APPARATUS AND ANTENNA STRUCTURE 审中-公开
标题翻译：移动通信装置和天线结构
公开(公告)号：US20100255893A1
公开(公告)日：2010-10-07
申请号：US12693616
申请日：2010-01-26
申请人： Akio Ihara , Minoru Sakurai , Makoto Tabata
发明人： Akio Ihara , Minoru Sakurai , Makoto Tabata
IPC分类号： H04W88/02 , H01Q1/24
CPC分类号： H01Q1/243 , H01Q21/28 , H04W88/02
摘要： A mobile communication apparatus configured to be provided with an extra antenna has a printed board provided with an antenna feed point, an antenna having a spring-like contact and provided on the printed board, and a housing constituted by a first case and a second case fixed into each other. The printed board and the antenna are arranged between and pressed by the first case and the second case. The antenna feed point and the spring-like contact are in contact with and electrically connected to each other by means of elastic force of the spring-like contact caused upon the first case and the second case being fixed into each other. The housing has a space for containing the extra antenna such that the extra antenna is electrically connected to the antenna feed point by means of the elastic force.
摘要翻译：配置成设置有额外天线的移动通信装置具有设置有天线馈电点的印刷电路板，具有弹簧状接触并设置在印刷电路板上的天线以及由第一壳体和第二壳体构成的壳体相互固定印刷电路板和天线布置在第一壳体和第二壳体之间并被第一壳体和第二壳体按压之间。天线馈电点和弹簧状触点通过在第一壳体上引起的弹簧状接触的弹力彼此接触并彼此电连接，并且第二壳体彼此固定。壳体具有用于容纳额外天线的空间，使得额外的天线通过弹性力电连接到天线馈电点。

5. 发明申请

US20100148815A1 TEST APPARATUS 失效
标题翻译：测试仪器
公开(公告)号：US20100148815A1
公开(公告)日：2010-06-17
申请号：US12618619
申请日：2009-11-13
申请人： Makoto TABATA
发明人： Makoto TABATA
IPC分类号： G01R31/02
CPC分类号： G11C29/56 , G11C29/48 , G11C2029/5602 , G11C2029/5606
摘要： Provided is a test apparatus that tests a device under test having a test function for sequentially outputting, from a single test terminal, signals that would be output from a plurality of terminals, the test apparatus comprising: a test section that supplies the device under test with a test signal and receives signals that are sequentially output from the test terminal in response to the test signal; an identifying section that identifies a correspondence between each signal sequentially received by the test section and a signal that would be output from one of the terminals of the device under test; and a counting section that counts a number of signals judged to be unacceptable from among the signals sequentially received by the test section for each terminal of the device under test, based on the correspondence identified by the identifying section.
摘要翻译：提供了一种测试装置，其具有测试功能，用于从单个测试终端顺序地输出将从多个终端输出的信号，该测试装置包括：供给被测设备的测试部分具有测试信号并接收响应于测试信号从测试终端顺序地输出的信号; 标识部分，其识别由测试部分顺序接收的每个信号与将从被测设备的一个终端输出的信号之间的对应关系; 以及计数部，其基于由识别部识别的对应关系，对从被测设备的每个终端按测试部分顺序接收的信号中判定为不可接受的信号数进行计数。

6. 发明授权

US07733721B2 Semiconductor testing device and method of testing semiconductor memory 失效
公开(公告)号：US07733721B2
公开(公告)日：2010-06-08
申请号：US11991368
申请日：2007-08-22
申请人： Makoto Tabata
发明人： Makoto Tabata
IPC分类号： G11C7/00
CPC分类号： G11C29/56 , G11C29/56004 , G11C29/56008 , G11C2029/1208 , G11C2029/5604 , G11C2029/5606
摘要： The disclosure concerns a semiconductor tester for testing a MUT, comprising a pattern generator; a pattern formatter; a comparator comparing a result signal from the MUT with an expectation value; a bad block memory; an AFM pre-storing pass/fail information of each of memory cells; a data compressor compressing data of pass/fail information in the AFM; a compression failure buffer memory storing data compressed; a good block register storing an address number of a good block prepared; and an address generator, wherein when the block to be compressed is a good one, the good block register sends a address number of the good block to the compress failure buffer memory.

7. 发明申请

US20100056027A1 Method For Polishing A Semiconductor Wafer 有权
标题翻译：抛光半导体晶片的方法
公开(公告)号：US20100056027A1
公开(公告)日：2010-03-04
申请号：US12542920
申请日：2009-08-18
申请人： Clemens Zapilko , Thomas Jaeschke , Makoto Tabata , Klaus Roettger
发明人： Clemens Zapilko , Thomas Jaeschke , Makoto Tabata , Klaus Roettger
IPC分类号： B24B1/00 , B24B7/17
CPC分类号： B24B37/042 , H01L21/02024
摘要： Semiconductor wafers are CMP polished by polishing the rear side of the semiconductor wafer by means of CMP with a material removal with a profile along the diameter of the wafer wherein material removal is higher at the center than at the edge of the rear side; and polishing the front side of the wafer by means of CMP with a material removal with a profile along the diameter of the wafer wherein material removal is lower in the center of the front side than in an edge region of the front side.
摘要翻译：半导体晶片通过CMP抛光半导体晶片的后侧，通过沿着晶片直径的轮廓去除材料进行抛光，其中材料去除在中心处比后侧的边缘更高; 并且通过CMP沿着沿着晶片直径的轮廓的材料除去材料抛光晶片的前侧，其中在前侧的中心处的材料去除比在前侧的边缘区域更低。

8. 发明申请

US20100008170A1 Semiconductor tester and testing method of semiconductor memory 审中-公开
标题翻译：半导体测试仪和半导体存储器的测试方法
公开(公告)号：US20100008170A1
公开(公告)日：2010-01-14
申请号：US11919585
申请日：2007-04-20
申请人： Shinya Sato , Makoto Tabata
发明人： Shinya Sato , Makoto Tabata
IPC分类号： G11C29/00 , G06F19/00
CPC分类号： G11C29/56 , G11C29/56004
摘要： The disclosure concerns a semiconductor tester for testing a memory under test. The semiconductor tester comprises a pattern generator generating address information on the pages and generating a test pattern; a waveform shaper shaping the test pattern and outputting a test signal based on the shaped test pattern to the memory cells in the page identified by the address information; a comparator comparing a result signal output from the memory under test receiving the test signal with an expectation value; and a bad block memory storing information on a bad block in the memory under test in advance, when the page identified by the address information is included in the bad block, the bad block memory outputting a bad signal used to skip from the address information on the page included in the bad block to the address information on the page included in a next block under test.
摘要翻译：本公开涉及用于测试被测存储器的半导体测试器。半导体测试器包括在页面上产生地址信息并生成测试图案的模式发生器; 波形整形器整形所述测试图案，并且将基于所述成形测试图案的测试信号输出到由所述地址信息标识的所述页面中的所述存储器单元; 比较将来自被测存储器的结果信号接收测试信号与期望值进行比较的比较器; 以及坏块存储器，其中，当由所述地址信息识别的页面被包括在所述坏块中时，预先存储有被测试存储器中的坏块的信息，所述坏块存储器输出用于从所述地址信息跳过的坏信号包含在坏块中的页面包含在下一个被测试块中的页面上的地址信息。

9. 发明申请

US20090015490A1 ELECTRONIC DEVICE AND METHOD FOR MANUFACTURING SAME 审中-公开
标题翻译：电子设备及其制造方法
公开(公告)号：US20090015490A1
公开(公告)日：2009-01-15
申请号：US12171592
申请日：2008-07-11
申请人： Satoru HONDA , Tomoko Honda , Nobuyoshi Kuroiwa , Masaomi Nakahata , Jun Morimoto , Yoshikazu Hata , Koichi Sato , Akihiro Tsujimura , Makoto Tabata , Minoru Sakurai , Shoji Kato
发明人： Satoru HONDA , Tomoko Honda , Nobuyoshi Kuroiwa , Masaomi Nakahata , Jun Morimoto , Yoshikazu Hata , Koichi Sato , Akihiro Tsujimura , Makoto Tabata , Minoru Sakurai , Shoji Kato
IPC分类号： H01Q1/24 , H01Q1/40
CPC分类号： H01Q1/243 , H01Q9/0421 , H01Q9/16 , H01Q9/26 , H01Q9/30 , H01Q9/42
摘要： An electronic device includes: a first molded body having a recessed cross section and made of resin; a second molded body having a recessed cross section and made of resin, the second molded body being fitted inside the first molded body; and an antenna pattern sandwiched between the first and second molded body. Among the surfaces of the first molded body, the surface on the side not adjacent to the antenna pattern constitutes an outer surface.
摘要翻译：电子设备包括：第一成型体，其具有凹入的横截面并由树脂制成; 第二成型体，其具有凹入的横截面并由树脂制成，所述第二模制体装配在所述第一模制体内; 以及夹在第一和第二成型体之间的天线图案。在第一成型体的表面中，与天线图案不相邻的一侧的表面构成外表面。

10. 发明申请

US20080182539A1 Electronic apparatus 有权
标题翻译：电子仪器
公开(公告)号：US20080182539A1
公开(公告)日：2008-07-31
申请号：US11902450
申请日：2007-09-21
申请人： Yoshikazu Hata , Tomoko Honda , Satoru Honda , Nobuyoshi Kuroiwa , Masaomi Nakahata , Jun Morimoto , Koichi Sato , Akihiro Tsujimura , Makoto Tabata , Minoru Sakurai , Shoji Kato
发明人： Yoshikazu Hata , Tomoko Honda , Satoru Honda , Nobuyoshi Kuroiwa , Masaomi Nakahata , Jun Morimoto , Koichi Sato , Akihiro Tsujimura , Makoto Tabata , Minoru Sakurai , Shoji Kato
IPC分类号： H04B1/08
CPC分类号： H05K7/06 , H01Q1/22 , H01Q1/243 , H01Q1/40 , H01Q9/0407
摘要： An electronic apparatus includes: a first molded body; a second molded body which composes housing with the first molded body; a first conductive pattern provided in the housing; a second conductive pattern provided on an outer surface of the housing; and a first conductive member. The first conductive member passes through a gap of a mating face between the first molded body and the second molded body. The first conductive member connects the first conductive pattern and the second conductive pattern.
摘要翻译：电子设备包括：第一成型体; 第二成型体，其与第一成型体构成壳体; 设置在所述壳体中的第一导电图案; 设置在所述壳体的外表面上的第二导电图案; 和第一导电构件。第一导电构件穿过第一模制体和第二模制体之间的配合面的间隙。第一导电构件连接第一导电图案和第二导电图案。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式