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    • 1. 发明申请
    • APPARATUS, SYSTEM, AND METHOD FOR MEASURING MAGNETORESISTIVE HEAD RESISTANCE
    • 用于测量磁阻电阻的装置,系统和方法
    • US20060244442A1
    • 2006-11-02
    • US11116782
    • 2005-04-28
    • Larry Tretter
    • Larry Tretter
    • G01R33/12
    • G11B5/455G11B5/39G11B2005/0018
    • An apparatus, system, and method are disclosed for measuring magnetoresistive head assembly resistance. A measurement module measures a reference voltage across a reference resistance while applying a reference current to the reference resistance. In addition, the measurement module measures a test voltage across a first biasing resistor, a MR head assembly, and a second biasing resistor connected in series while applying the reference current to the first biasing resistor, the MR head assembly, and the second biasing resistor. A computation module calculates the MR head assembly resistance from the reference voltage, the test voltage, the reference resistance, and the resistances of the first and second biasing resistors.
    • 公开了用于测量磁阻头组件电阻的装置,系统和方法。 测量模块在参考电阻施加参考电流时测量参考电阻两端的参考电压。 此外,测量模块测量跨第一偏置电阻器,MR头组件和串联连接的第二偏置电阻器的测试电压,同时将参考电流施加到第一偏置电阻器,MR头组件和第二偏置电阻器 。 计算模块根据参考电压,测试电压,参考电阻和第一和第二偏置电阻器的电阻计算MR磁头组装电阻。
    • 4. 发明申请
    • APPARATUS, SYSTEM, AND METHOD FOR TESTING AN ANALOG TO DIGITAL CONVERTER
    • 用于测试数字转换器的装置,系统和方法
    • US20060085154A1
    • 2006-04-20
    • US10966596
    • 2004-10-15
    • Jacob DahleLarry Tretter
    • Jacob DahleLarry Tretter
    • G06F19/00
    • H03M1/1071
    • An apparatus, system, and method are disclosed for testing an analog to digital converter with a known analog signal applied. A first register module stores a first digitized instance of an analog signal. A second register module stores a second digitized instance of the analog signal. A difference module calculates the absolute difference between the first and second digitized instances. A bad code module identifies an erroneous digitized instance wherein the absolute difference is greater than a limit value. In one embodiment, a counter module counts the erroneous digitized instance. A test system may identify a failed analog to digital converter if the erroneous digitized instance count is greater than a specified target value.
    • 公开了一种用于利用已知模拟信号来测试模数转换器的装置,系统和方法。 第一寄存器模块存储模拟信号的第一数字化实例。 第二寄存器模块存储模拟信号的第二数字化实例。 差分模块计算第一和第二数字化实例之间的绝对差。 错误代码模块识别错误的数字化实例,其中绝对差大于限制值。 在一个实施例中,计数器模块对错误的数字化实例进行计数。 如果错误的数字化实例计数大于指定的目标值,则测试系统可以识别失败的模数转换器。