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    • 5. 发明申请
    • PROBE CARD FOR SEMICONDUCTOR TEST
    • 用于半导体测试的探针卡
    • US20090039907A1
    • 2009-02-12
    • US12281478
    • 2006-12-22
    • Kwang-Suk Song
    • Kwang-Suk Song
    • G01R31/26
    • G01R1/06733G01R1/07342
    • A probe card for testing semiconductor devices is disclosed, which can precisely test semi-conductor chips, in which probes, probe bars, and a probe block housing of the probe card are improved, such that the durability of each part of the probe card is increased. The probe card comprises: a probe for absorbing and dispersing elasticity; a probe bar for receiving the probe and preventing the probe from bending; and a probe block housing for mounting probe blocks connected in parallel with each other. Each probe block is formed as the probe bars are assembled thereto.
    • 公开了一种用于测试半导体器件的探针卡,其可以精确地测试半导体芯片,其中探针,探针杆和探针卡的探针块壳体被改进,使得探针卡的每个部分的耐久性为 增加。 探针卡包括:用于吸收和分散弹性的探针; 用于接收探头并防止探头弯曲的探针杆; 以及用于安装彼此并联连接的探针块的探针块壳体。 当探针棒组装在其上时形成每个探针块。