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1. 发明授权

US07208936B2 Socket lid and test device 失效
标题翻译：插座盖和测试装置
公开(公告)号：US07208936B2
公开(公告)日：2007-04-24
申请号：US10823049
申请日：2004-04-12
申请人： Kurt R. Goldsmith , James J. Grealish
发明人： Kurt R. Goldsmith , James J. Grealish
IPC分类号： G01R31/02
CPC分类号： G01R31/045 , G01R1/0433 , G01R31/2808 , G01R35/00
摘要： Various embodiments related to an integrated lid and test device for a socket, such as a land grid array (LGA) socket, that functions as a lid, as a testing device, and/or as a pick and place lid. Specifically, the integrated lid may provide test capability, in manufacturing of the socket and/or a printed circuit board (PCB) such as a motherboard, onto which the socket is attached. Thus the integrated lid may allow for testing the socket and/or the PCB for correct assembly and connectivity without requiring removal of the integrated lid to insert a test device prior to testing, or removal of a test device and replacement of the lid after testing.
摘要翻译：涉及用作插座的集成盖和测试装置的各种实施例，例如用作盖的地面栅格阵列（LGA）插座，作为测试装置和/或拾取和放置盖。具体来说，一体化盖可以在插座和/或诸如母板的印刷电路板（PCB）的制造中提供测试能力，插座附接到该主板上。因此，集成的盖可以允许测试插座和/或PCB以进行正确的组装和连接，而不需要在测试之前去除集成的盖以插入测试装置，或者在测试之后移除测试装置和更换盖子。

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