会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明申请
    • RADIATION DETECTOR
    • 辐射探测器
    • US20110163306A1
    • 2011-07-07
    • US13063061
    • 2008-09-10
    • Shingo FuruiToshinori YoshimutaJunichi SuzukiKoji WatadaniSatoru Morita
    • Shingo FuruiToshinori YoshimutaJunichi SuzukiKoji WatadaniSatoru Morita
    • H01L31/0272
    • G01T1/244H01L27/14618H01L27/14676H01L2924/0002H01L2924/00
    • A radiation detector of this invention has a curable synthetic resin film covering exposed surfaces of a radiation sensitive semiconductor layer, a carrier selective high resistance film and a common electrode, in which a material allowing no chloride to mix in is used in a manufacturing process of the curable synthetic resin film. This prevents pinholes and voids from being formed by chlorine ions in the carrier selective high resistance film and semiconductor layer. Also a protective film which does not transmit ionic materials may be provided between the exposed surface of the common electrode and the curable synthetic resin film, thereby to prevent the carrier selective high resistance film from being corroded by chlorine ions included in the curable synthetic resin film, and to prevent an increase of dark current flowing through the semiconductor layer.
    • 本发明的放射线检测器具有可固化的合成树脂膜,其覆盖辐射敏感半导体层,载体选择性高电阻膜和公共电极的暴露表面,其中不含氯化物的材料混合使用在制造过程中 可固化合成树脂膜。 这样可以防止载流子选择性高电阻膜和半导体层中的氯离子形成针孔和空隙。 也可以在公共电极的露出表面和可固化合成树脂膜之间设置不透过离子性材料的保护膜,由此防止载体选择性高电阻膜被包含在可固化合成树脂膜中的氯离子腐蚀 ,并且防止流过半导体层的暗电流增加。
    • 2. 发明授权
    • Radiation detector
    • 辐射检测器
    • US07233003B2
    • 2007-06-19
    • US10942846
    • 2004-09-17
    • Koji WatadaniKenji SatoYoichiro ShimuraHideo Tsuruta
    • Koji WatadaniKenji SatoYoichiro ShimuraHideo Tsuruta
    • G01T1/00
    • H01L27/14676
    • The radiation detector according to this invention has a common electrode for bias voltage application formed on a surface of an amorphous selenium semiconductor film (a-Se semiconductor film) sensitive to radiation. The common electrode is a gold thin film having a thickness in a range of 100 to 1,000 Å. The gold thin film acting as the common electrode may be formed on the surface of the a-Se semiconductor film at a relatively low vapor deposition temperature and in a reduced vapor deposition time. This feature suppresses a generation of defects in the a-Se semiconductor film due to formation of the common electrode. The gold thin film for the common electrode is not so thick as in the prior art, but is 1,000 Å or less. With the reduced thickness, the common electrode has improved boding property with respect to the a-Se semiconductor film.
    • 根据本发明的辐射检测器具有在对辐射敏感的非晶硒半导体膜(a-Se半导体膜)的表面上形成用于偏置电压的公共电极。 公共电极是厚度在100至1000埃范围内的金薄膜。 作为公共电极的金薄膜可以在相对低的气相沉积温度和减少的蒸镀时间形成在a-Se半导体膜的表面上。 该特征抑制由于共用电极的形成而导致的a-Se半导体膜的缺陷的产生。 用于公共电极的金薄膜不像现有技术那样厚,但为1000或更小。 随着厚度减小,公共电极相对于a-Se半导体膜具有改善的粘合性能。
    • 6. 发明授权
    • Radiation detector
    • 辐射检测器
    • US08564082B2
    • 2013-10-22
    • US13063061
    • 2008-09-10
    • Shingo FuruiToshinori YoshimutaJunichi SuzukiKoji WatadaniSatoru Morita
    • Shingo FuruiToshinori YoshimutaJunichi SuzukiKoji WatadaniSatoru Morita
    • H01L27/22H01L33/00
    • G01T1/244H01L27/14618H01L27/14676H01L2924/0002H01L2924/00
    • A radiation detector of this invention has a curable synthetic resin film covering exposed surfaces of a radiation sensitive semiconductor layer, a carrier selective high resistance film and a common electrode, in which a material allowing no chloride to mix in is used in a manufacturing process of the curable synthetic resin film. This prevents pinholes and voids from being formed by chlorine ions in the carrier selective high resistance film and semiconductor layer. Also a protective film which does not transmit ionic materials may be provided between the exposed surface of the common electrode and the curable synthetic resin film, thereby to prevent the carrier selective high resistance film from being corroded by chlorine ions included in the curable synthetic resin film, and to prevent an increase of dark current flowing through the semiconductor layer.
    • 本发明的放射线检测器具有可固化的合成树脂膜,其覆盖辐射敏感半导体层,载体选择性高电阻膜和公共电极的暴露表面,其中不含氯化物的材料混合使用在制造过程中 可固化合成树脂膜。 这样可以防止载流子选择性高电阻膜和半导体层中的氯离子形成针孔和空隙。 也可以在公共电极的露出表面和可固化合成树脂膜之间设置不透过离子性材料的保护膜,由此防止载体选择性高电阻膜被包含在可固化合成树脂膜中的氯离子腐蚀 ,并且防止流过半导体层的暗电流增加。
    • 10. 发明申请
    • Radiation detector
    • 辐射检测器
    • US20050061987A1
    • 2005-03-24
    • US10942846
    • 2004-09-17
    • Koji WatadaniKenji SatoYoichiro ShimuraHideo Tsuruta
    • Koji WatadaniKenji SatoYoichiro ShimuraHideo Tsuruta
    • G01T1/24A61B6/00G01J1/02H01L27/14H01L27/146H01L31/0224H01L31/08H01L31/09H01L31/115
    • H01L27/14676
    • The radiation detector according to this invention has a common electrode for bias voltage application formed on a surface of an amorphous selenium semiconductor film (a-Se semiconductor film) sensitive to radiation. The common electrode is a gold thin film having a thickness in a range of 100 to 1,000 Å. The gold thin film acting as the common electrode may be formed on the surface of the a-Se semiconductor film at a relatively low vapor deposition temperature and in a reduced vapor deposition time. This feature suppresses a generation of defects in the a-Se semiconductor film due to formation of the common electrode. The gold thin film for the common electrode is not so thick as in the prior art, but is 1,000 Å or less. With the reduced thickness, the common electrode has improved boding property with respect to the a-Se semiconductor film.
    • 根据本发明的辐射检测器具有在对辐射敏感的非晶硒半导体膜(a-Se半导体膜)的表面上形成用于偏置电压的公共电极。 公共电极是厚度在100至1000埃范围内的金薄膜。 作为公共电极的金薄膜可以在相对低的气相沉积温度和减少的蒸镀时间形成在a-Se半导体膜的表面上。 该特征抑制由于共用电极的形成而导致的a-Se半导体膜的缺陷的产生。 用于公共电极的金薄膜不像现有技术那样厚,但为1000或更小。 随着厚度减小,公共电极相对于a-Se半导体膜具有改善的粘合性能。