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    • 2. 发明授权
    • Method and apparatus for measuring spectroscopic absorbance
    • 用于测量光谱吸光度的方法和装置
    • US07767969B2
    • 2010-08-03
    • US12319332
    • 2009-01-06
    • Kiyoshi NagaiHarumi ShibataSayaka Hamaguchi
    • Kiyoshi NagaiHarumi ShibataSayaka Hamaguchi
    • G01J5/06
    • G01J3/45G01N21/3563G01N2021/3568G01N2021/3595
    • An object of the present invention is to provide a spectroscopic method and an apparatus which can measure a trace element accurately with high sensitivity. In order to achieve this object, for example, in Fourier transformation infrared spectroscopy (FT-IR), a reference spectrum and a measurement spectrum including an impurity spectrum are measured in order to obtain a differential spectrum comprising the impurity spectrum and a flat baseline, correction including a frequency shift of the reference spectrum before calculating a differential spectrum, is performed on the reference spectrum. This makes it possible to remove baseline deformation due to phonon absorbance of silicon included in the conventional differential spectrum, and to obtain an infrared absorption spectrum of the substitutional carbon with high accuracy and high sensitivity.
    • 本发明的目的是提供一种能够以高灵敏度精确地测量微量元素的分光方法和装置。 为了实现该目的,例如在傅里叶变换红外光谱(FT-IR)中,测量参考光谱和包含杂质光谱的测量光谱,以获得包含杂质光谱和平坦基线的差分光谱, 在参考光谱上执行包括计算差分光谱之前的参考光谱的频移的校正。 这使得可以消除由常规差分光谱中包含的硅的声子吸收引起的基线变形,并以高精度和高灵敏度获得取代碳的红外吸收光谱。
    • 3. 发明申请
    • Method and apparatus for measuring spectroscopic absorbance
    • 用于测量光谱吸光度的方法和装置
    • US20090173884A1
    • 2009-07-09
    • US12319332
    • 2009-01-06
    • Kiyoshi NagaiHarumi ShibataSayaka Hamaguchi
    • Kiyoshi NagaiHarumi ShibataSayaka Hamaguchi
    • G01J5/02G01J3/45
    • G01J3/45G01N21/3563G01N2021/3568G01N2021/3595
    • An object of the present invention is to provide a spectroscopic method and an apparatus which can measure a trace element accurately with high sensitivity. In order to achieve this object, for example, in Fourier transformation infrared spectroscopy (FT-IR), a reference spectrum and a measurement spectrum including an impurity spectrum are measured in order to obtain a differential spectrum comprising the impurity spectrum and a flat baseline, correction including a frequency shift of the reference spectrum before calculating a differential spectrum, is performed on the reference spectrum. This makes it possible to remove baseline deformation due to phonon absorbance of silicon included in the conventional differential spectrum, and to obtain an infrared absorption spectrum of the substitutional carbon with high accuracy and high sensitivity.
    • 本发明的目的是提供一种能够以高灵敏度精确地测量微量元素的分光方法和装置。 为了实现该目的,例如在傅里叶变换红外光谱(FT-IR)中,测量参考光谱和包含杂质光谱的测量光谱,以获得包含杂质光谱和平坦基线的差分光谱, 在参考光谱上执行包括计算差分光谱之前的参考光谱的频移的校正。 这使得可以消除由常规差分光谱中包含的硅的声子吸收引起的基线变形,并以高精度和高灵敏度获得取代碳的红外吸收光谱。
    • 9. 发明授权
    • Composite filter and illuminating device
    • 复合过滤器和照明装置
    • US5115379A
    • 1992-05-19
    • US635795
    • 1990-12-31
    • Kiyoshi Nagai
    • Kiyoshi Nagai
    • G01D11/28G12B11/00G12B11/02
    • G01D11/28G12B11/00
    • A composite filter advantageously employable for dark field observation systems which comprises a dyed organic resin layer provided on a dyed glass plate. The organic resin layer and the glass plate in combination absorb light of a radiation spectrum in the region of longer than 600 nm under the condition that the transmission of light at 650 nm is defined to a level of 1.times.10.sup.-4 % to 5% and the transmission of light at 800 nm is defined to a level of lower than 2.times.10.sup.-5 %. Another dyed glass plate which shows an absorption spectrum having absorption peaks in regions of 480-535 nm and 560-600 nm may be incorporated into the composite filter. The composite filter can be introduced into or provided to an illuminating device.
    • 有利地用于暗场观察系统的复合过滤器,其包括设在染色玻璃板上的染色有机树脂层。 有机树脂层和玻璃板在650nm以上的光的透过率定义为1×10 -4%〜5%的水平的条件下,组合吸收了长于600nm以上的区域的辐射光谱, 在800nm处的光的透射被定义为低于2×10-5%的水平。 另外,在480-535nm和560-600nm的区域显示出具有吸收峰的吸收光谱的染色玻璃板可以并入到复合滤光器中。 复合过滤器可被引入照明装置或提供给照明装置。