会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 2. 发明申请
    • OPTICAL MEASUREMENT DEVICE
    • 光学测量装置
    • US20110317166A1
    • 2011-12-29
    • US13170057
    • 2011-06-27
    • Kimihiko ArimotoSo Takagi
    • Kimihiko ArimotoSo Takagi
    • G01N21/59
    • G01N21/0303G01N21/03G01N21/59
    • An optical measurement device is adapted to measure characteristics of a measurement targeted fluid based on a transmitted inspection light. The device comprises a cell having an internal space for accommodating the measurement targeted fluid to flow therein and having a pair of opposing through holes for transmitting the inspection light, each of the through holes sealed with a transparent member. The device includes a projection optical system member having a port for projecting the inspection light and a light-receiving optical system member having a port for receiving the inspection light transmitted through the internal space. A base member is provided for supporting the cell, the projection optical system member, and the light-receiving optical system member in a configuration with gaps between the cell and the respective optical system members to accommodate movement in a predetermined range along a direction perpendicular to an optical axis of the inspection light.
    • 光学测量装置适于基于传输的检查光来测量测量目标流体的特性。 该装置包括具有用于容纳测量对象流体在其中流动的内部空间的单元,并且具有用于透射检查光的一对相对的通孔,每个通孔用透明构件密封。 该装置包括具有用于投射检查光的端口的投影光学系统构件和具有用于接收透过内部空间的检查光的端口的光接收光学系统构件。 提供了一种基座构件,用于将电池,投影光学系统构件和受光光学系统构件支撑在具有电池单元和各个光学系统构件之间的间隙的构造中,以适应沿着垂直于电池的方向在预定范围内的移动 检查光的光轴。
    • 4. 发明授权
    • Analyzer
    • 分析仪
    • US08305574B2
    • 2012-11-06
    • US12858709
    • 2010-08-18
    • Kimihiko ArimotoKunio OhtsukiYoko Nakai
    • Kimihiko ArimotoKunio OhtsukiYoko Nakai
    • G01J3/427
    • G01J3/02G01J3/0208G01J3/0218G01J3/0232
    • This invention is to make the detection sensitivities as even as possible among a plurality of specimens to be inspected in an analyzer that leads light transmitted from the plurality of specimens to be inspected to a single spectrometer via optical fibers, the analyzer includes first and second light guide members provided for every first and second specimen to be inspected so as to lead the light obtained from each of the specimens to be inspected to a photo-detecting part, and light projection side end portions of a plurality of optical fiber elements composing the first and second light guide members are arranged in mixture.
    • 本发明是为了使检测灵敏度尽可能地在通过光纤将检测到的多个试样的光传输到单个光谱仪的分析仪中进行检查的多个试样中,检测器包括第一和第二光 引导构件,其被设置用于要检查的每个第一和第二样本,以将从每个待检查的样本获得的光引导到光检测部分;以及构成第一检测部件的多个光纤元件的光投射侧端部 并且第二导光构件被布置成混合。
    • 5. 发明申请
    • OPTICAL MEASUREMENT CELL
    • 光学测量单元
    • US20110299067A1
    • 2011-12-08
    • US13153228
    • 2011-06-03
    • Issei YokoyamaKimihiko Arimoto
    • Issei YokoyamaKimihiko Arimoto
    • G01J1/00
    • G01N21/05G01N21/09G01N2021/0346G01N2021/058
    • To make it possible to alter a cell length with reduction of a manufacturing cost so that a spacer can be securely positioned at a desired position, a cell includes: a pair of optical windows sandwiching a flow channel; a cell body provided with an accommodating recess and a solution introduction part and a solution deriving part; a pair of light transmitting members in the accommodating recess and forming the pair of optical windows; a spacer defining a distance between the opposing surfaces of the pair of light transmitting members; and a pressing mechanism for pressing the light transmitting members and the spacer toward the bottom surface of the accommodating recess so as to form the flow channel, wherein a positioning recess having a shape corresponding to the spacer is provided on at least one of the opposing surfaces and the spacer is fitted therein.
    • 为了能够以减少制造成本来改变电池长度,从而可以将间隔件牢固地定位在期望的位置,电池包括:夹持流动通道的一对光学窗口; 设置有容纳凹部的池体,溶液导入部和溶液导出部; 一对在所述容纳凹部中的透光构件,并形成所述一对光学窗; 限定所述一对光透射构件的相对表面之间的距离的间隔件; 以及用于将光透射构件和间隔件朝向容纳凹部的底表面按压以形成流动通道的按压机构,其中具有与间隔件相对应的形状的定位凹槽设置在至少一个相对表面 并且间隔件装配在其中。
    • 6. 发明授权
    • Substrate inspection apparatus and method
    • 基板检查装置及方法
    • US07327444B2
    • 2008-02-05
    • US11196947
    • 2005-08-04
    • Nobuyuki NakaAkihiro KatanishiMasaaki MagariYoshiyuki NakajimaKimihiko Arimoto
    • Nobuyuki NakaAkihiro KatanishiMasaaki MagariYoshiyuki NakajimaKimihiko Arimoto
    • G01B11/06G01N21/21G01N21/65
    • H01L22/20G01N21/65G01N21/9501H01L22/12
    • The present invention provides a method and substrate examining device that sequentially and automatically measures at least the thickness and the internal stress of the thin film at a predetermined measurement point on the surface of every manufactured semiconductor substrate to perform quality control on each substrate, and reliably recognizes the cause of defects to improve productivity. The examining device and method accurately analyzes the correlation between film thickness and stress to establish the manufacturing processes necessary for manufacturing a semiconductor substrate of higher performance, and measures the distribution of a physical quantity such as internal stress, index of refraction, and composition of the semiconductor substrate in the film thickness direction, without being influenced by change in ambient environmental temperature thereby further improving examination precision.
    • 本发明提供了一种方法和基板检查装置,其在每个制造的半导体基板的表面上的预定测量点处至少依次测量薄膜的厚度和内部应力,以对每个基板执行质量控制,并且可靠地 认识到缺陷的原因,以提高生产力。 检查装置和方法准确地分析膜厚和应力之间的相关性,以建立制造具有更高性能的半导体衬底所需的制造工艺,并且测量诸如内应力,折射率和物理量的物理量的分布 半导体衬底在膜厚度方向上,而不受周围环境温度的变化的影响,从而进一步提高检查精度。
    • 7. 发明申请
    • Substrate inspection apparatus and method
    • 基板检查装置及方法
    • US20060038980A1
    • 2006-02-23
    • US11196947
    • 2005-08-04
    • Nobuyuki NakaAkihiro KatanishiMasaaki MagariYoshiyuki NakajimaKimihiko Arimoto
    • Nobuyuki NakaAkihiro KatanishiMasaaki MagariYoshiyuki NakajimaKimihiko Arimoto
    • G01N21/00
    • H01L22/20G01N21/65G01N21/9501H01L22/12
    • The present invention provides a method and substrate examining device that sequentially and automatically measures at least the thickness and the internal stress of the thin film at a predetermined measurement point on the surface of every manufactured semiconductor substrate to perform quality control on each substrate, and reliably recognizes the cause of defects to improve productivity. The examining device and method accurately analyzes the correlation between film thickness and stress to establish the manufacturing processes necessary for manufacturing a semiconductor substrate of higher performance, and measures the distribution of a physical quantity such as internal stress, index of refraction, and composition of the semiconductor substrate in the film thickness direction, without being influenced by change in ambient environmental temperature thereby further improving examination precision.
    • 本发明提供了一种方法和基板检查装置,其在每个制造的半导体基板的表面上的预定测量点处至少依次测量薄膜的厚度和内部应力,以对每个基板执行质量控制,并且可靠地 认识到缺陷的原因,以提高生产力。 检查装置和方法准确地分析膜厚和应力之间的相关性,以建立制造具有更高性能的半导体衬底所需的制造工艺,并且测量诸如内应力,折射率和物理量的物理量的分布 半导体衬底在膜厚度方向上,而不受周围环境温度的变化的影响,从而进一步提高检查精度。
    • 8. 发明授权
    • Optical measurement device
    • 光学测量装置
    • US08699031B2
    • 2014-04-15
    • US13170057
    • 2011-06-27
    • Kimihiko ArimotoSo Takagi
    • Kimihiko ArimotoSo Takagi
    • G01N21/00G01N21/03
    • G01N21/0303G01N21/03G01N21/59
    • An optical measurement device is adapted to measure characteristics of a measurement targeted fluid based on a transmitted inspection light. The device comprises a cell having an internal space for accommodating the measurement targeted fluid to flow therein and having a pair of opposing through holes for transmitting the inspection light, each of the through holes sealed with a transparent member. The device includes a projection optical system member having a port for projecting the inspection light and a light-receiving optical system member having a port for receiving the inspection light transmitted through the internal space. A base member is provided for supporting the cell, the projection optical system member, and the light-receiving optical system member in a configuration with gaps between the cell and the respective optical system members to accommodate movement in a predetermined range along a direction perpendicular to an optical axis of the inspection light.
    • 光学测量装置适于基于传输的检查光来测量测量目标流体的特性。 该装置包括具有用于容纳测量对象流体在其中流动的内部空间的单元,并且具有用于透射检查光的一对相对的通孔,每个通孔用透明构件密封。 该装置包括具有用于投射检查光的端口的投影光学系统构件和具有用于接收透过内部空间的检查光的端口的光接收光学系统构件。 提供了一种基座构件,用于将电池,投影光学系统构件和受光光学系统构件支撑在具有电池单元和各个光学系统构件之间的间隙的构造中,以适应沿着垂直于电池的方向在预定范围内的移动 检查光的光轴。
    • 9. 发明授权
    • Optical measurement cell
    • 光学测量单元
    • US08390812B2
    • 2013-03-05
    • US13153228
    • 2011-06-03
    • Issei YokoyamaKimihiko Arimoto
    • Issei YokoyamaKimihiko Arimoto
    • G01N21/00
    • G01N21/05G01N21/09G01N2021/0346G01N2021/058
    • To make it possible to alter a cell length with reduction of a manufacturing cost so that a spacer can be securely positioned at a desired position, a cell includes: a pair of optical windows sandwiching a flow channel; a cell body provided with an accommodating recess and a solution introduction part and a solution deriving part; a pair of light transmitting members in the accommodating recess and forming the pair of optical windows; a spacer defining a distance between the opposing surfaces of the pair of light transmitting members; and a pressing mechanism for pressing the light transmitting members and the spacer toward the bottom surface of the accommodating recess so as to form the flow channel, wherein a positioning recess having a shape corresponding to the spacer is provided on at least one of the opposing surfaces and the spacer is fitted therein.
    • 为了能够以减少制造成本来改变电池长度,从而可以将间隔件牢固地定位在期望的位置,电池包括:夹持流动通道的一对光学窗口; 设置有容纳凹部的池体,溶液导入部和溶液导出部; 一对在所述容纳凹部中的透光构件,并形成所述一对光学窗; 限定所述一对光透射构件的相对表面之间的距离的间隔件; 以及用于将光透射构件和间隔件朝向容纳凹部的底表面按压以形成流动通道的按压机构,其中具有与间隔件相对应的形状的定位凹槽设置在至少一个相对表面 并且间隔件装配在其中。