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1. 发明授权

US6141038A Alignment correction prior to image sampling in inspection systems 失效
标题翻译：在检查系统中进行图像采样之前的对准校正
公开(公告)号：US6141038A
公开(公告)日：2000-10-31
申请号：US884466
申请日：1997-06-27
申请人： Scott A. Young , Roger Kroeze , Curt H. Chadwick , Nicholas Szabo , Kent E. Douglas , Fred E. Babian
发明人： Scott A. Young , Roger Kroeze , Curt H. Chadwick , Nicholas Szabo , Kent E. Douglas , Fred E. Babian
IPC分类号： G01N21/95 , G01N21/956 , G06K9/00 , G06T7/00 , H04N7/18
CPC分类号： G06T7/001 , G01N21/95607 , G01N21/9501 , G06T2207/30148
摘要： A method and apparatus, and variations of each, for inspecting a wafer defining at least one die thereon is disclosed. The present invention first obtains the electronic image equivalent of two die, and then determines the x and y offset between those electronic images. Prior to inspection for defects, those two electronic images are aligned by adjusting the x and y positions of one electronic image of one die with respect to the electronic image of the other die. Once that is accomplished, those electronic images are compared to detect any defects that may exist on one of the die.
摘要翻译：公开了一种用于检查在其上限定至少一个管芯的晶片的方法和装置及其变化。本发明首先获得两个模具的电子图像等价物，然后确定这些电子图像之间的x和y偏移。在检查缺陷之前，通过相对于另一个管芯的电子图像调整一个管芯的一个电子图像的x和y位置来对准这两个电子图像。一旦完成，那些电子图像被比较以检测可能存在于其中一个模具上的任何缺陷。

2. 发明申请

US20080304734A1 Alignment correction prio to image sampling in inspection systems 审中-公开
标题翻译：校准校正prio到检查系统中的图像采样
公开(公告)号：US20080304734A1
公开(公告)日：2008-12-11
申请号：US12221806
申请日：2008-08-07
申请人： Scott A. Young , Roger Kroeze , Curt H. Chadwick , Nicholas Szabo , Kent E. Douglas , Fred E. Babian
发明人： Scott A. Young , Roger Kroeze , Curt H. Chadwick , Nicholas Szabo , Kent E. Douglas , Fred E. Babian
IPC分类号： G06K9/00
CPC分类号： G06T7/001 , G01N21/9501 , G01N21/95607 , G06T2207/30148
摘要： A method and apparatus, and variations of each, for inspecting a wafer defining at least one die thereon is disclosed. The present invention first obtains the electronic image equivalent of two die, and then determines the x and y offset between those electronic images. Prior to inspection for defects, those two electronic images are aligned by adjusting the x and y positions of one electronic image of one die with respect to the electronic image of the other die. Once that is accomplished, the those electronic images are compared to detect any defects that may exist on one of the die.
摘要翻译：公开了一种用于检查在其上限定至少一个管芯的晶片的方法和装置及其变化。本发明首先获得两个模具的电子图像等价物，然后确定这些电子图像之间的x和y偏移。在检查缺陷之前，通过相对于另一个管芯的电子图像调整一个管芯的一个电子图像的x和y位置来对准这两个电子图像。一旦完成，将这些电子图像进行比较，以检测其中一个模具上可能存在的任何缺陷。

3. 发明授权

US4223434A Method of manufacturing a niobium-aluminum-germanium superconductive material 失效
标题翻译：制造铌 - 铝 - 锗超导材料的方法
公开(公告)号：US4223434A
公开(公告)日：1980-09-23
申请号：US8622
申请日：1979-02-01
申请人： John L. Wang , Milton R. Pickus , Kent E. Douglas
发明人： John L. Wang , Milton R. Pickus , Kent E. Douglas
IPC分类号： H01L39/12 , H01L39/24 , H01V11/00 , B22F3/24
CPC分类号： H01L39/2409 , H01L39/12 , Y10S505/92 , Y10S505/921 , Y10T29/49014 , Y10T428/12819
摘要： A method for manufacturing flexible Nb.sub.3 (Al,Ge) multifilamentary superconductive material in which a sintered porous niobium compact is infiltrated with an aluminum-germanium alloy and thereafter deformed and heat treated in a series of steps at different successively higher temperatures preferably below 1000.degree. C. to produce filaments composed of Nb.sub.3 (Al,G3) within the compact. By avoiding temperatures in excess of 1000.degree. C. during the heat treatment, cladding material such as copper can be applied to facilitate a deformation step preceding the heat treatment and can remain in place through the heat treatment to also serve as a temperature stabilizer for supeconductive material produced. Further, these lower heat treatment temperatures favor formation of filaments with reduced grain size and, hence with more grain boundaries which in turn increase the current-carrying capacity of the superconductive material.
摘要翻译：一种制造柔性Nb3（Al，Ge）复丝超导材料的方法，其中烧结的多孔铌压坯用铝 - 锗合金渗透，然后在不同连续较高温度，优选低于1000℃的一系列步骤中变形和热处理在压块内产生由Nb3（Al，G3）组成的长丝。通过在热处理期间避免超过1000℃的温度，可以施加诸如铜的包层材料以促进热处理之前的变形步骤，并且可以通过热处理保持在适当位置，以用作超导体的温度稳定剂材料生产。此外，这些较低的热处理温度有利于形成具有减小的晶粒尺寸的长丝，因此具有更多的晶界，这又增加了超导材料的载流能力。

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