专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20130077754A1 ANALYSIS METHOD FOR X-RAY DIFFRACTION MEASUREMENT DATA 有权
标题翻译： X射线衍射测量数据分析方法
公开(公告)号：US20130077754A1
公开(公告)日：2013-03-28
申请号：US13600740
申请日：2012-08-31
申请人： Akito SASAKI , Keiichi MORIKAWA , Akihiro HIMEDA , Hiroki YOSHIDA
发明人： Akito SASAKI , Keiichi MORIKAWA , Akihiro HIMEDA , Hiroki YOSHIDA
IPC分类号： G01N23/20
CPC分类号： G01N23/207 , G01J3/28 , G01N23/20
摘要： Peak positions and integrated intensities of diffraction X-ray are determined on the basis of X-ray diffraction measurement data output from an X-ray diffractometer, the number of determined peaks of the diffraction X-ray is counted, and analysis processing is started when the counted number of peaks reaches a preset peak number. The analysis processing is repetitively executed on the basis of X-ray diffraction measurement data. The peak positions and the integrated intensities of the diffraction X-ray are determined from the X-ray diffraction measurement data obtained from the start of the measurement till the analysis processing concerned, and qualitative analysis of collating the determined peak positions and integrated intensities with standard peak card data whose data base is made in advance and searching materials contained in a measurement sample, and quantitative analysis of determining the quantities of the materials contained in the measurement sample are executed.
摘要翻译：基于从X射线衍射仪输出的X射线衍射测定数据求出衍射X射线的峰值位置和积分强度，对衍射X射线的确定峰值的数量进行计数，开始分析处理计数的峰值达到预设的峰值。基于X射线衍射测量数据重复执行分析处理。衍射X射线的峰值位置和积分强度由从开始测量直到相关分析处理得到的X射线衍射测量数据确定，并且将所确定的峰值位置和积分强度与标准对照提前提供数据库的峰值卡数据和测量样本中包含的搜索材料，以及确定测量样本中包含的材料的量的定量分析。

2. 发明授权

US06504102B2 Insulating material, windings using same, and a manufacturing method thereof 有权
标题翻译：绝缘材料，使用其的绕组及其制造方法
公开(公告)号：US06504102B2
公开(公告)日：2003-01-07
申请号：US09944135
申请日：2001-09-04
申请人： Tomoya Tsunoda , Keiichi Morikawa , Mitsuru Onoda , Shigeo Amagi , Tatsuo Honda
发明人： Tomoya Tsunoda , Keiichi Morikawa , Mitsuru Onoda , Shigeo Amagi , Tatsuo Honda
IPC分类号： H01B1754
CPC分类号： H02K3/40 , H02K3/345
摘要： In order to provide windings for electrical rotating machines having an insulating film superior in electrical characteristics, a high heat conductive insulating film 11 is formed at outer periphery of wound conductor 10 using a high heat conductive insulating tape, which includes a mica layer 3, a reinforcement layer 5, and a high heat conductive filler layer 7, wherein the resin content in each layer of the mica layer 3 and the high heat conductive filler layer 7 is specified in the range of 10-25% by weight based on the whole weight of the material. 1-80% by weight of said filler is spherical.
摘要翻译：为了提供具有优异的电气特性的绝缘膜的旋转电机的绕组，使用高导热绝缘带在缠绕导体10的外周形成高导热绝缘膜11，该导热绝缘带包括云母层3，加强层5和高导热性填充层7，其中云母层3和高导热性填充层7的各层中的树脂含量以10-25重量％为基准，以整体重量为基准的材料。所述填料的1-80重量％为球形。

3. 发明申请

US20080056452A1 X-ray analysis apparatus 有权
标题翻译： X射线分析仪
公开(公告)号：US20080056452A1
公开(公告)日：2008-03-06
申请号：US11880638
申请日：2007-07-23
申请人： Akito Sasaki , Aya Kuribayashi , Keiichi Morikawa , Kunio Nishi , Takao Ohara , Toshiyuki Kato , Yuji Tsuji
发明人： Akito Sasaki , Aya Kuribayashi , Keiichi Morikawa , Kunio Nishi , Takao Ohara , Toshiyuki Kato , Yuji Tsuji
IPC分类号： H05G1/00
CPC分类号： G01N23/207
摘要： An X-ray analysis apparatus has information about a relationship between selection of a measurement type and a replacement work of optical parts and shows, on a screen of a display, graphical information about optical parts which should be changed, to make it easy for an operator to perform a preliminary work before measurement. When the operator selects one desired measurement type among a plurality of measurement types in a selection window, there is displayed on the display, depending on the selected measurement type, graphical information about necessary optical parts which should be newly installed and/or installed optical parts which should be removed. The operator looks at the operating instructions and then performs the replacement work. The graphical information may be: graphical indication of the installation locations of the optical parts; different pictorial expressions about the installation and the removal works; and graphical indication of the identification marks of the optical parts.
摘要翻译： X射线分析装置具有关于测量类型的选择和光学部件的替换工作之间的关系的信息，并且在显示器的屏幕上显示关于应当改变的光学部件的图形信息，以使得易于操作员在测量前进行初步工作。当操作者在选择窗口中选择多个测量类型中的一个期望的测量类型时，根据所选择的测量类型，在显示器上显示有关新安装的光学部件和/或安装的光学部件的图形信息应该删除。操作员查看操作说明，然后执行更换工作。图形信息可以是：光学部件的安装位置的图形指示; 有关安装及拆卸工程的不同图示; 以及光学部件的识别标记的图形指示。

4. 发明授权

US6069430A Insulating material and windings thereby 有权
标题翻译：因此绝缘材料和绕组
公开(公告)号：US6069430A
公开(公告)日：2000-05-30
申请号：US257013
申请日：1999-02-25
申请人： Tomoya Tsunoda , Keiichi Morikawa , Mitsuru Onoda , Shigeo Amagi , Tatsuo Honda
发明人： Tomoya Tsunoda , Keiichi Morikawa , Mitsuru Onoda , Shigeo Amagi , Tatsuo Honda
IPC分类号： H01F5/06 , H01B3/30 , H01B7/02 , H01B17/60 , H02K3/34 , H02K3/40 , H02K1/00
CPC分类号： H02K3/345 , H02K3/40 , Y10T29/49009
摘要： The high thermoconductive insulating film 11 was formed around the outer periphery of the wound conductors 10, using the high thermoconductive insulating tape 1 comprising the mica layer 3, the reinforcement layer 5, and the high thermoconductive filler layer 7, wherein the resin content in each layer of the mica layer 3 and the high thermoconductive filler layer 7 is specified to the range of 10-25% by weight of the total weight of the material.
摘要翻译：使用包括云母层3，加强层5和高导热性填充层7的高导热绝缘带1，在缠绕导体10的外周形成高导热绝缘膜11，其中，云母层3和高导热性填充剂层7的层被规定为材料总重量的10-25重量％的范围。

5. 发明授权

US08971492B2 Analysis method for X-ray diffraction measurement data 有权
$Analysis method for X-ray diffraction measurement data$
标题翻译： X射线衍射测量数据分析方法
公开(公告)号：US08971492B2
公开(公告)日：2015-03-03
申请号：US13600740
申请日：2012-08-31
申请人： Akito Sasaki , Keiichi Morikawa , Akihiro Himeda , Hiroki Yoshida
发明人： Akito Sasaki , Keiichi Morikawa , Akihiro Himeda , Hiroki Yoshida
IPC分类号： G01N23/207 , G01N23/20 , G01J3/28
CPC分类号： G01N23/207 , G01J3/28 , G01N23/20
摘要： Peak positions and integrated intensities of diffraction X-ray are determined on the basis of X-ray diffraction measurement data output from an X-ray diffractometer, the number of determined peaks of the diffraction X-ray is counted, and analysis processing is started when the counted number of peaks reaches a preset peak number. The analysis processing is repetitively executed on the basis of X-ray diffraction measurement data. The peak positions and the integrated intensities of the diffraction X-ray are determined from the X-ray diffraction measurement data obtained from the start of the measurement till the analysis processing concerned, and qualitative analysis of collating the determined peak positions and integrated intensities with standard peak card data whose data base is made in advance and searching materials contained in a measurement sample, and quantitative analysis of determining the quantities of the materials contained in the measurement sample are executed.
摘要翻译：基于从X射线衍射仪输出的X射线衍射测定数据求出衍射X射线的峰值位置和积分强度，对衍射X射线的确定峰值的数量进行计数，开始分析处理计数的峰值达到预设的峰值。基于X射线衍射测量数据重复执行分析处理。衍射X射线的峰值位置和积分强度由从开始测量直到相关分析处理得到的X射线衍射测量数据确定，并且将所确定的峰值位置和积分强度与标准对照提前提供数据库的峰值卡数据和测量样本中包含的搜索材料，以及确定测量样本中包含的材料的量的定量分析。

6. 发明授权

US07711091B2 X-ray analysis apparatus 有权
标题翻译： X射线分析仪
公开(公告)号：US07711091B2
公开(公告)日：2010-05-04
申请号：US11880638
申请日：2007-07-23
申请人： Akito Sasaki , Aya Kuribayashi , Keiichi Morikawa , Kunio Nishi , Takao Ohara , Toshiyuki Kato , Yuji Tsuji
发明人： Akito Sasaki , Aya Kuribayashi , Keiichi Morikawa , Kunio Nishi , Takao Ohara , Toshiyuki Kato , Yuji Tsuji
IPC分类号： H05G1/58 , H05G1/00
CPC分类号： G01N23/207
摘要： An X-ray analysis apparatus has information about a relationship between selection of a measurement type and a replacement work of optical parts and shows, on a screen of a display, graphical information about optical parts which should be changed, to make it easy for an operator to perform a preliminary work before measurement. When the operator selects one desired measurement type among a plurality of measurement types in a selection window, there is displayed on the display, depending on the selected measurement type, graphical information about necessary optical parts which should be newly installed and/or installed optical parts which should be removed. The operator looks at the operating instructions and then performs the replacement work. The graphical information may be: graphical indication of the installation locations of the optical parts; different pictorial expressions about the installation and the removal works; and graphical indication of the identification marks of the optical parts.
摘要翻译： X射线分析装置具有关于测量类型的选择和光学部件的替换工作之间的关系的信息，并且在显示器的屏幕上显示关于应当改变的光学部件的图形信息，以使得易于操作员在测量前进行初步工作。当操作者在选择窗口中选择多个测量类型中的一个期望的测量类型时，根据所选择的测量类型，在显示器上显示有关新安装的光学部件和/或安装的光学部件的图形信息应该删除。操作员查看操作说明，然后执行更换工作。图形信息可以是：光学部件的安装位置的图形指示; 有关安装及拆卸工程的不同图示; 以及光学部件的识别标记的图形指示。

7. 发明授权

US06288341B1 Insulating material windings using same and a manufacturing method thereof 有权
标题翻译：使用其绝缘材料绕组及其制造方法
公开(公告)号：US06288341B1
公开(公告)日：2001-09-11
申请号：US09457259
申请日：1999-12-09
申请人： Tomoya Tsunoda , Keiichi Morikawa , Mitsuru Onoda , Shigeo Amagi , Tatsuo Honda
发明人： Tomoya Tsunoda , Keiichi Morikawa , Mitsuru Onoda , Shigeo Amagi , Tatsuo Honda
IPC分类号： H01B1762
CPC分类号： H02K3/40 , H02K3/345
摘要： In order to provide windings for electrical rotating machines having an insulating film superior in electrical characteristics, a high heat conductive insulating film 11 is formed at outer periphery of wound conductor 10 using a high heat conductive insulating tape, which includes a mica layer 3, a reinforcement layer 5, and a high heat conductive filler layer 7, wherein the resin content in each layer of the mica layer 3 and the high heat conductive filler layer 7 is specified in the range of 10-25% by weight based on the whole weight of the material. 1-80% by weight of said filler is spherical.
摘要翻译：为了提供具有优异的电气特性的绝缘膜的旋转电机的绕组，使用高导热绝缘带在缠绕导体10的外周形成高导热绝缘膜11，该导热绝缘带包括云母层3，加强层5和高导热性填充层7，其中云母层3和高导热性填充层7的各层中的树脂含量以10-25重量％为基准，以整体重量为基准的材料。所述填料的1-80重量％为球形。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式