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    • 1. 发明授权
    • Optical detection device based on semi-conductor laser array
    • 基于半导体激光阵列的光学检测装置
    • US06469785B1
    • 2002-10-22
    • US09039701
    • 1998-03-16
    • Gert Ludwig DuveneckKarlheinz GuldenRino Ernst KunzJürgen Söchtig
    • Gert Ludwig DuveneckKarlheinz GuldenRino Ernst KunzJürgen Söchtig
    • G01N2101
    • G01N21/648B01J2219/00707G01N21/7703
    • The invention relates to an optical detection device for chemical analyses, comprising at least one light source, at least one photoelectric detection unit and at least one measuring cell, one or more optical paths coupled to the at least one measuring cell being formed between the light source(s) and the photoelectric detection unit(s). In the course of the miniaturization of such detection devices in arrays for the simultaneous detection of a plurality of analytes, according to the prior art edge-emitting semiconductor lasers that had been separated and applied to a substrate were used. Instead of the latter, the invention provides for surface-emitting semiconductor lasers to be used as light sources, which have the advantage of comparatively simple manufacture and of requiring substantially less space. The process of separating the lasers from the mother substrate and affixing them to a foreign substrate, which was necessary hitherto, is eliminated in the detection device according to the invention.
    • 本发明涉及一种用于化学分析的光学检测装置,包括至少一个光源,至少一个光电检测单元和至少一个测量单元,耦合到至少一个测量单元的一个或多个光路,形成在光 源和光电检测单元。 在这种用于同时检测多种分析物的阵列中的这种检测装置的小型化过程中,根据已经分离并施加到基底的现有技术的边缘发射半导体激光器被使用。 代替后者,本发明提供了用作光源的表面发射半导体激光器,其具有相对简单的制造和要求实质上更少的空间的优点。 在根据本发明的检测装置中,消除了将母体基板上的激光与母基板分离并将其固定到外来基板上的过程,这是迄今为止所必需的。