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1. 发明申请

US20050270048A1 Spring-loaded, removable test fixture for circuit board testers 有权
标题翻译：用于电路板测试仪的弹簧式可拆卸测试夹具
公开(公告)号：US20050270048A1
公开(公告)日：2005-12-08
申请号：US10874410
申请日：2004-06-22
申请人： Stuart Eickhoff , Jon Hample
发明人： Stuart Eickhoff , Jon Hample
IPC分类号： G01R31/26 , G01R31/28
CPC分类号： G01R31/2808
摘要： A circuit board tester that uses an axial translation to bring a unit under test (UUT) into physical and electric contact with a series of electrical probes. The element on the tester that comes into contact with the UUT, on the side opposite the probes, is both spring-loaded and removable. For a first configuration in which a UUT has a heat sink, an internal heat sink snaps into the top of the tester. When the UUT is tested, the heat sink on the UUT contacts the internal heat sink and depresses it slightly into the top, under the influence of a spring-loaded support. For a second configuration in which the UUT has no heat sink, a block snaps into the top of the tester, and is spring-loaded through a series of receptacles to a module that contacts the UUT during operation.
摘要翻译：使用轴向平移的电路板测试仪使被测单元（UUT）与一系列电探针物理和电接触。测试仪上与UUT相接触的元件在探针的相反侧是弹簧加载和可移动的。对于UUT具有散热器的第一种配置，内部散热片卡入测试仪的顶部。当UUT被测试时，UUT上的散热器接触内部散热器，并在弹簧支撑的影响下将其略微压入顶部。对于其中UUT没有散热器的第二种配置，一个块卡入测试仪的顶部，并通过一系列插座弹簧加载到在运行期间与UUT接触的模块。

2. 发明授权

US07852096B2 Spring-loaded, removable test fixture for circuit board testers 有权
标题翻译：用于电路板测试仪的弹簧式可拆卸测试夹具
公开(公告)号：US07852096B2
公开(公告)日：2010-12-14
申请号：US10874410
申请日：2004-06-22
申请人： Stuart Eickhoff , Jon Hample
发明人： Stuart Eickhoff , Jon Hample
IPC分类号： G01R31/26
CPC分类号： G01R31/2808
摘要： A circuit board tester that uses an axial translation to bring a unit under test (UUT) into physical and electric contact with a series of electrical probes. The element on the tester that comes into contact with the UUT, on the side opposite the probes, is both spring-loaded and removable. For a first configuration in which a UUT has a heat sink, an internal heat sink snaps into the top of the tester. When the UUT is tested, the heat sink on the UUT contacts the internal heat sink and depresses it slightly into the top, under the influence of a spring-loaded support. For a second configuration in which the UUT has no heat sink, a block snaps into the top of the tester, and is spring-loaded through a series of receptacles to a module that contacts the UUT during operation.
摘要翻译：使用轴向平移的电路板测试仪使被测单元（UUT）与一系列电探针物理和电接触。测试仪上与UUT相接触的元件在探针的相反侧是弹簧加载和可移动的。对于UUT具有散热器的第一种配置，内部散热片卡入测试仪的顶部。当UUT被测试时，UUT上的散热器接触内部散热器，并在弹簧支撑的影响下将其略微压入顶部。对于其中UUT没有散热器的第二种配置，一个块卡入测试仪的顶部，并通过一系列插座弹簧加载到在运行期间与UUT接触的模块。

3. 发明申请

US20080231299A1 Vacuum chamber with two-stage longitudinal translation for circuit board testing 有权
标题翻译：真空室具有两级纵向平移电路板测试
公开(公告)号：US20080231299A1
公开(公告)日：2008-09-25
申请号：US11732087
申请日：2007-04-02
申请人： Neil Adams , Stuart Eickhoff , Jon Hample
发明人： Neil Adams , Stuart Eickhoff , Jon Hample
IPC分类号： G01R31/02
CPC分类号： G01R31/2808 , Y10S439/931
摘要： A circuit board tester that uses a dual-stage translation to bring a unit under test (UUT) into physical and electric contact first with a series of tall probes, then with a series of short probes. Initially, the UUT is mounted on a support plate, and spaced apart from both the tall and short probes. First, in order to perform a functional test on the UUT, a first vacuum stage is engaged, and atmospheric pressure translates the UUT longitudinally until contact is made with a first hard stop, defining a first position. At this first position, the UUT is in contact with a series of tall probes, and is spaced apart from a series of short probes. After a function test is performed, a second vacuum stage is engaged in addition to, and independent of, the first vacuum stage. Atmospheric pressure translates the UUT longitudinally until contact is made with a second hard stop, defining a second position.
摘要翻译：使用双级转换的电路板测试仪首先将一个测试单元（UUT）与一系列高探头物理和电接触，然后使用一系列短探针。最初，UUT安装在支撑板上，并与高和短探头隔开。首先，为了对UUT执行功能测试，接合第一真空级，并且大气压力纵向平移UUT，直到与形成第一位置的第一硬止动件接触。在该第一位置，UUT与一系列高探针接触，并且与一系列短探针间隔开。在执行功能测试之后，除了第一真空级之外并且独立于第一真空级，接合第二真空级。大气压力将UUT纵向平移，直到用第二个硬止动件进行接触，定义了第二个位置。

4. 发明授权

US07695766B2 Method of identifying specific holes in an interface guiding plate 有权
标题翻译：识别接口导板中特定孔的方法
公开(公告)号：US07695766B2
公开(公告)日：2010-04-13
申请号：US11732087
申请日：2007-04-02
申请人： Neil Adams , Stuart Eickhoff , Jon Hample
发明人： Neil Adams , Stuart Eickhoff , Jon Hample
IPC分类号： B05D3/00
CPC分类号： G01R31/2808 , Y10S439/931
摘要： A circuit board tester that uses a dual-stage translation to bring a unit under test (UUT) into physical and electric contact first with a series of tall probes, then with a series of short probes. Initially, the UUT is mounted on a support plate, and spaced apart from both the tall and short probes. First, in order to perform a functional test on the UUT, a first vacuum stage is engaged, and atmospheric pressure translates the UUT longitudinally until contact is made with a first hard stop, defining a first position. At this first position, the UUT is in contact with a series of tall probes, and is spaced apart from a series of short probes. After a function test is performed, a second vacuum stage is engaged in addition to, and independent of, the first vacuum stage. Atmospheric pressure translates the UUT longitudinally until contact is made with a second hard stop, defining a second position.
摘要翻译：使用双级转换的电路板测试仪首先将一个测试单元（UUT）与一系列高探头物理和电接触，然后使用一系列短探针。最初，UUT安装在支撑板上，并与高和短探头隔开。首先，为了对UUT执行功能测试，接合第一真空级，并且大气压力纵向平移UUT，直到与形成第一位置的第一硬止动件接触。在该第一位置，UUT与一系列高探针接触，并且与一系列短探针间隔开。在执行功能测试之后，除了第一真空级之外并且独立于第一真空级，接合第二真空级。大气压力将UUT纵向平移，直到用第二个硬止动件进行接触，定义了第二个位置。

5. 发明授权

US07469920B2 Kingpin lock 有权
标题翻译：金锁锁
公开(公告)号：US07469920B2
公开(公告)日：2008-12-30
申请号：US11440480
申请日：2006-05-25
申请人： Avron Rosenberg , Kirk Busse , Jon Hample
发明人： Avron Rosenberg , Kirk Busse , Jon Hample
IPC分类号： B60D1/60
CPC分类号： B60D1/60 , B60D1/52 , Y10T70/5867
摘要： A kingpin lock including a body having a substantially frustoconical portion and a kingpin cavity having a central axis, a slide channel having a central axis and a sleeve channel having a central axis. The slide channel intersects the kingpin cavity such that its central axis is substantially offset from a radius that extends outwardly from the central axis of the kingpin cavity. The sleeve channel intersects the slide channel. A slide member is shiftable between an engaged position extending partially into the kingpin cavity and a disengaged position where the slide member does not engage the kingpin. A locking member is shiftable between an engaged position and a disengaged position such that the locking member engages an indentation in the slide member so that the slide member is secured in the engaged position and the kingpin lock is secured to the kingpin.
摘要翻译：主销锁包括具有基本截头圆锥形部分的主体和具有中心轴线的主销腔，具有中心轴线的滑动通道和具有中心轴线的套筒通道。滑动通道与主销腔相交，使得其中心轴线基本上偏离从主销腔的中心轴线向外延伸的半径。套筒通道与滑动通道相交。滑动构件可以在部分地延伸到中心销腔中的接合位置和滑动构件不接合主销的分离位置之间移动。锁定构件可在接合位置和脱离位置之间移动，使得锁定构件接合滑动构件中的凹陷，使得滑动构件固定在接合位置，并且主销锁固定到主销。

6. 发明授权

US07200509B2 Vacuum chamber with two-stage longitudinal translation for circuit board testing 有权
标题翻译：真空室具有两级纵向平移电路板测试
公开(公告)号：US07200509B2
公开(公告)日：2007-04-03
申请号：US10867164
申请日：2004-06-14
申请人： Neil Adams , Stuart Eickhoff , Jon Hample
发明人： Neil Adams , Stuart Eickhoff , Jon Hample
IPC分类号： G01R31/00 , G01R31/14
CPC分类号： G01R31/2808 , Y10S439/931
摘要： A circuit board tester that uses a dual-stage translation to bring a unit under test (UUT) into physical and electric contact first with a series of tall probes, then with a series of short probes. Initially, the UUT is mounted on a support plate, and spaced apart from both the tall and short probes. First, in order to perform a functional test on the UUT, a first vacuum stage is engaged, and atmospheric pressure translates the UUT longitudinally until contact is made with a first hard stop, defining a first position. At this first position, the UUT is in contact with a series of tall probes, and is spaced apart from a series of short probes. After a function test is performed, a second vacuum stage is engaged in addition to, and independent of, the first vacuum stage. Atmospheric pressure translates the UUT longitudinally until contact is made with a second hard stop, defining a second position.
摘要翻译：使用双级转换的电路板测试仪首先将一个测试单元（UUT）与一系列高探头物理和电接触，然后使用一系列短探针。最初，UUT安装在支撑板上，并与高和短探头隔开。首先，为了对UUT执行功能测试，接合第一真空级，并且大气压力纵向平移UUT，直到与形成第一位置的第一硬止动件接触。在该第一位置，UUT与一系列高探针接触，并且与一系列短探针间隔开。在执行功能测试之后，除了第一真空级之外并且独立于第一真空级，接合第二真空级。大气压力将UUT纵向平移，直到用第二个硬止动件进行接触，定义了第二个位置。

7. 发明申请

US20060290101A1 Kingpin lock 有权
标题翻译：金锁锁
公开(公告)号：US20060290101A1
公开(公告)日：2006-12-28
申请号：US11440480
申请日：2006-05-25
申请人： Avron Rosenberg , Kirk Busse , Jon Hample
发明人： Avron Rosenberg , Kirk Busse , Jon Hample
IPC分类号： B60D1/60
CPC分类号： B60D1/60 , B60D1/52 , Y10T70/5867
摘要： A kingpin lock including a body having a substantially frustoconical portion and a kingpin cavity having a central axis, a slide channel having a central axis and a sleeve channel having a central axis. The slide channel intersects the kingpin cavity such that its central axis is substantially offset from a radius that extends outwardly from the central axis of the kingpin cavity. The sleeve channel intersects the slide channel. A slide member is shiftable between an engaged position extending partially into the kingpin cavity and a disengaged position where the slide member does not engage the kingpin. A locking member is shiftable between an engaged position and a disengaged position such that the locking member engages an indentation in the slide member so that the slide member is secured in the engaged position and the kingpin lock is secured to the kingpin.
摘要翻译：主销锁包括具有基本截头圆锥形部分的主体和具有中心轴线的主销腔，具有中心轴线的滑动通道和具有中心轴线的套筒通道。滑动通道与主销腔相交，使得其中心轴线基本上偏离从主销腔的中心轴线向外延伸的半径。套筒通道与滑动通道相交。滑动构件可以在部分地延伸到中心销腔中的接合位置和滑动构件不接合主销的分离位置之间移动。锁定构件可在接合位置和脱离位置之间移动，使得锁定构件接合滑动构件中的凹陷，使得滑动构件固定在接合位置，并且主销锁固定到主销。

8. 发明申请

US20050261854A1 Vacuum chamber with two-stage longitudinal translation for circuit board testing 有权
标题翻译：真空室具有两级纵向平移电路板测试
公开(公告)号：US20050261854A1
公开(公告)日：2005-11-24
申请号：US10867164
申请日：2004-06-14
申请人： Neil Adams , Stuart Eickhoff , Jon Hample
发明人： Neil Adams , Stuart Eickhoff , Jon Hample
IPC分类号： G01R31/28 , G06F19/00
CPC分类号： G01R31/2808 , Y10S439/931
摘要： A circuit board tester that uses a dual-stage translation to bring a unit under test (UUT) into physical and electric contact first with a series of tall probes, then with a series of short probes. Initially, the UUT is mounted on a support plate, and spaced apart from both the tall and short probes. First, in order to perform a functional test on the UUT, a first vacuum stage is engaged, and atmospheric pressure translates the UUT longitudinally until contact is made with a first hard stop, defining a first position. At this first position, the UUT is in contact with a series of tall probes, and is spaced apart from a series of short probes. After a function test is performed, a second vacuum stage is engaged in addition to, and independent of, the first vacuum stage. Atmospheric pressure translates the UUT longitudinally until contact is made with a second hard stop, defining a second position. At this second position, the UUT is in contact with both tall and short probes (the tall probes being appropriately spring-loaded so as to maintain physical and electric contact with the UUT without damaging the UUT). After an in-circuit test is performed, both vacuum stages are released, and the UUT returns to its initial location, spaced apart from both the tall and short probes. The UUT may be replaced with another part to be tested, and the cycle is repeated.
摘要翻译：使用双级转换的电路板测试仪首先将一个测试单元（UUT）与一系列高探头物理和电接触，然后使用一系列短探针。最初，UUT安装在支撑板上，并与高和短探头隔开。首先，为了对UUT执行功能测试，接合第一真空级，并且大气压力纵向平移UUT，直到与形成第一位置的第一硬止动件接触。在该第一位置，UUT与一系列高探针接触，并且与一系列短探针间隔开。在执行功能测试之后，除了第一真空级之外并且独立于第一真空级，接合第二真空级。大气压力将UUT纵向平移，直到用第二个硬止动件进行接触，定义了第二个位置。在该第二位置，UUT与高和短探针（高探头正确地弹簧加载，以便保持与UUT的物理和电接触而不损坏UUT）接触。在执行在线测试之后，两个真空级都被释放，UUT返回到其初始位置，与高探头和短探头隔开。 UUT可以被替换为另外一部分被测试，循环被重复。

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